Akira TOBITA

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method and its apparatus for thermal assist type magneti...
- Patent number 9,304,145
- Issue date Apr 5, 2016
- Hitachi High-Tech Fine Systems Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Device for transporting magnetic head, device for inspecting magnet...
- Patent number 8,299,784
- Issue date Oct 30, 2012
- Hitachi High-Technologies Corporation
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD AND ITS APPARATUS FOR THERMAL ASSIST TYPE MAGNETI...
- Publication number 20160033548
- Publication date Feb 4, 2016
- HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC HEAD INSPECTION SYSTEM AND MAGNETIC HEAD INSPECTION METHOD
- Publication number 20140090117
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
HEAD ELEMENT INSPECTION APPARATUS
- Publication number 20130133444
- Publication date May 30, 2013
- Hitachi High-Technologies Corporation
- Yoshinori KITANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC HEAD DEVICE
- Publication number 20130063139
- Publication date Mar 14, 2013
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE FOR TRANSPORTING MAGNETIC HEAD, DEVICE FOR INSPECTING MAGNET...
- Publication number 20100327863
- Publication date Dec 30, 2010
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE