Akira Tonomura

Person

Hatoyama-machi, Hiki-gun, Saitama 350-03, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Phase-contrast electron microscope and phase plate therefor
- Patent number 5,814,815
- Issue date Sep 29, 1998
- Hitachi, Ltd.
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference device and method for observing phase informalities
- Patent number 5,446,589
- Issue date Aug 29, 1995
- Research Development Corporation of Japan
- Qing X. Ru
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Aberration correction method and aberration correction apparatus
- Patent number 5,426,521
- Issue date Jun 20, 1995
- Research Development Corporation of Japan
- Jun Chen
- G02 - OPTICS
Information Patent Grant
Electron optical measurement apparatus
- Patent number 5,192,867
- Issue date Mar 9, 1993
- Hitachi, Ltd.
- Nobuyuki Osakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflection electron holography apparatus
- Patent number 4,998,788
- Issue date Mar 12, 1991
- Hitachi, Ltd.
- Nobuyuki Osakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron gun system
- Patent number 4,945,247
- Issue date Jul 31, 1990
- Hitachi, Ltd.
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography apparatus
- Patent number 4,935,625
- Issue date Jun 19, 1990
- Hitachi, Ltd.
- Shuji Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Micro fabrication process for semiconductor structure using coheren...
- Patent number 4,748,132
- Issue date May 31, 1988
- Hitachi, Ltd.
- Tadashi Fukuzawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Field emission type electron microscope using a multi-stage acceler...
- Patent number 4,642,461
- Issue date Feb 10, 1987
- Hitachi, Ltd.
- Junji Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography microscope
- Patent number 4,532,422
- Issue date Jul 30, 1985
- Hitachi, Ltd.
- Setsuo Nomura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Akira Tonomura

Person

Patents Grantslast 30 patents

Phase-contrast electron microscope and phase plate therefor

Interference device and method for observing phase informalities

Aberration correction method and aberration correction apparatus

Electron optical measurement apparatus

Reflection electron holography apparatus

Field emission electron gun system

Electron holography apparatus

Micro fabrication process for semiconductor structure using coheren...

Field emission type electron microscope using a multi-stage acceler...

Electron holography microscope