Akisuke Naruse

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Hitachi, JP

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Patents Grantslast 30 patents

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Method and apparatus for inspecting surface defects
- Patent number 4,914,378
- Issue date Apr 3, 1990
- Hitachi, Ltd.
- Makoto Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling a robot
- Patent number 4,604,716
- Issue date Aug 5, 1986
- Hitachi, Ltd.
- Kanji Kato
- G05 - CONTROLLING REGULATING
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Guide apparatus
- Patent number 4,531,663
- Issue date Jul 30, 1985
- Hitachi, Ltd.
- Shigeru Kajiyama
- G01 - MEASURING TESTING
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Rail apparatus around nuclear reactor pressure vessel and method of...
- Patent number 4,518,560
- Issue date May 21, 1985
- Hitachi, Ltd.
- Kazuo Takaku
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Rail apparatus around reactor pressure vessel
- Patent number 4,507,260
- Issue date Mar 26, 1985
- Hitachi, Ltd.
- Hirotsugu Fujimoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Ultrasonic flaw detector
- Patent number 4,474,064
- Issue date Oct 2, 1984
- Hitachi, Ltd.
- Akisuke Naruse
- G01 - MEASURING TESTING