Alan Hales

Person

Richardson, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Re-programmable self-test
- Patent number 11,768,240
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Neil John Simpson
- G11 - INFORMATION STORAGE
Information Patent Grant
Re-programmable self-test
- Patent number 11,092,650
- Issue date Aug 17, 2021
- Texas Instruments Incorporated
- Neil John Simpson
- G11 - INFORMATION STORAGE
Information Patent Grant
Re-programmable self-test
- Patent number 10,247,780
- Issue date Apr 2, 2019
- Texas Instruments Incorporated
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Grant
Functional core circuitry with serial scan test expected, mask circ...
- Patent number 10,120,025
- Issue date Nov 6, 2018
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
IC expected data and mask data on I/O data pads
- Patent number 9,829,538
- Issue date Nov 28, 2017
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Packet based integrated circuit testing
- Patent number 9,702,935
- Issue date Jul 11, 2017
- Texas Instruments Incorporated
- Lewis Nardini
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit wafer having plural dies with each die including...
- Patent number 9,562,946
- Issue date Feb 7, 2017
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit wafer having integrated circuit die with plural...
- Patent number 9,322,879
- Issue date Apr 26, 2016
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with plural comparators receiving expected data...
- Patent number 9,103,885
- Issue date Aug 11, 2015
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
IC with comparator receiving expected and mask data from pads
- Patent number 8,872,178
- Issue date Oct 28, 2014
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit die having input and output circuit pads, test c...
- Patent number 8,692,248
- Issue date Apr 8, 2014
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
IC dies with serarate connections to expected and mask data
- Patent number 8,604,475
- Issue date Dec 10, 2013
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Family of multiplexer/flip-flops with enhanced testability
- Patent number 8,525,565
- Issue date Sep 3, 2013
- Texas Instruments Incorporated
- Mujibur Rahman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test chain testability in a system for testing tri-state functionality
- Patent number 8,397,112
- Issue date Mar 12, 2013
- Texas Instruments Incorporated
- Mujibur Rahman
- G01 - MEASURING TESTING
Information Patent Grant
Delay fault testing using distributed clock dividers
- Patent number 8,375,265
- Issue date Feb 12, 2013
- Texas Instruments Incorporated
- Ramakrishnan Venkatasubramanian
- G01 - MEASURING TESTING
Information Patent Grant
Comparator receiving expected and mask data from circuit pads
- Patent number 8,299,464
- Issue date Oct 30, 2012
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced control in scan tests of integrated circuits with partitio...
- Patent number 8,205,125
- Issue date Jun 19, 2012
- Texas Instruments Incorporated
- Alan David Hales
- G01 - MEASURING TESTING
Information Patent Grant
IC with comparator receiving expected and mask data from pads
- Patent number 7,842,949
- Issue date Nov 30, 2010
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
IC with comparator receiving expected and mask data from pads
- Patent number 7,655,946
- Issue date Feb 2, 2010
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
IC with comparator receiving expected and mask data from pads
- Patent number 7,491,970
- Issue date Feb 17, 2009
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan sequenced power-on initialization
- Patent number 7,469,372
- Issue date Dec 23, 2008
- Texas Instruments Incorporated
- Lewis Nardini
- G01 - MEASURING TESTING
Information Patent Grant
Register file initialization to prevent unknown outputs during test
- Patent number 7,389,455
- Issue date Jun 17, 2008
- Texas Instruments Incorporated
- Alan Hales
- G01 - MEASURING TESTING
Information Patent Grant
IC with comparator receiving expected and mask data from pads
- Patent number 7,183,570
- Issue date Feb 27, 2007
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
On-chip reset circuitry and method
- Patent number 7,039,823
- Issue date May 2, 2006
- Texas Instruments Incorporated
- Alan D. Hales
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with comparator receiving expected and mask data from pads
- Patent number 6,894,308
- Issue date May 17, 2005
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20210333324
- Publication date Oct 28, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20190227122
- Publication date Jul 25, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20190041459
- Publication date Feb 7, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20180052202
- Publication date Feb 22, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20170102430
- Publication date Apr 13, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20160202319
- Publication date Jul 14, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20150309117
- Publication date Oct 29, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
PACKET BASED INTEGRATED CIRCUIT TESTING
- Publication number 20150067426
- Publication date Mar 5, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Lewis Nardini
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20150012790
- Publication date Jan 8, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20140167792
- Publication date Jun 19, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Die Having Input and Output Circuit Pads, Test C...
- Publication number 20140055158
- Publication date Feb 27, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Family of Multiplexer/Flip-Flops with Enhanced Testability
- Publication number 20130169332
- Publication date Jul 4, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Mujibur Rahman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20130021055
- Publication date Jan 24, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Test Chain Testability In a System for Testing Tri-State Functionality
- Publication number 20120036408
- Publication date Feb 9, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Mujibur Rahman
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIO...
- Publication number 20110099442
- Publication date Apr 28, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Alan David Hales
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20110041019
- Publication date Feb 17, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20100095171
- Publication date Apr 15, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20090089634
- Publication date Apr 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20080106287
- Publication date May 8, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING SYSTEM, METHOD AND APPARATUS
- Publication number 20070114529
- Publication date May 24, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
REGISTER FILE INITIALIZATION TO PREVENT UNKNOWN OUTPUTS DURING TEST
- Publication number 20070061645
- Publication date Mar 15, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Alan D. Hales
- G01 - MEASURING TESTING
Information Patent Application
Scan Sequenced Power-On Initialization
- Publication number 20060259838
- Publication date Nov 16, 2006
- Lewis Nardini
- G01 - MEASURING TESTING
Information Patent Application
Identical core testing using dedicated compare and mask circuitry
- Publication number 20050204217
- Publication date Sep 15, 2005
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Scan testing system, method and apparatus
- Publication number 20050186726
- Publication date Aug 25, 2005
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
On-chip reset circuitry and method
- Publication number 20030204713
- Publication date Oct 30, 2003
- Alan D. Hales
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan testing system, method, and apparatus
- Publication number 20030098457
- Publication date May 29, 2003
- Lee D. Whetsel
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Re-programmable self-test

Re-programmable self-test

Re-programmable self-test

Functional core circuitry with serial scan test expected, mask circ...

IC expected data and mask data on I/O data pads

Packet based integrated circuit testing

Integrated circuit wafer having plural dies with each die including...

Integrated circuit wafer having integrated circuit die with plural...

Integrated circuit with plural comparators receiving expected data...

IC with comparator receiving expected and mask data from pads

Integrated circuit die having input and output circuit pads, test c...

IC dies with serarate connections to expected and mask data

Family of multiplexer/flip-flops with enhanced testability

Test chain testability in a system for testing tri-state functionality

Delay fault testing using distributed clock dividers

Comparator receiving expected and mask data from circuit pads

Enhanced control in scan tests of integrated circuits with partitio...

IC with comparator receiving expected and mask data from pads

IC with comparator receiving expected and mask data from pads

IC with comparator receiving expected and mask data from pads

Scan sequenced power-on initialization

Register file initialization to prevent unknown outputs during test

IC with comparator receiving expected and mask data from pads

On-chip reset circuitry and method

IC with comparator receiving expected and mask data from pads

Patents Applicationslast 30 patents

RE-PROGRAMMABLE SELF-TEST

RE-PROGRAMMABLE SELF-TEST

RE-PROGRAMMABLE SELF-TEST

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

PACKET BASED INTEGRATED CIRCUIT TESTING

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

Integrated Circuit Die Having Input and Output Circuit Pads, Test C...

Family of Multiplexer/Flip-Flops with Enhanced Testability

SCAN TESTING SYSTEM, METHOD AND APPARATUS

Test Chain Testability In a System for Testing Tri-State Functionality

ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIO...

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

SCAN TESTING SYSTEM, METHOD AND APPARATUS

REGISTER FILE INITIALIZATION TO PREVENT UNKNOWN OUTPUTS DURING TEST

Scan Sequenced Power-On Initialization

Identical core testing using dedicated compare and mask circuitry

Scan testing system, method and apparatus

On-chip reset circuitry and method

Scan testing system, method, and apparatus