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ALBERT S. CRANE
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PORTLAND, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of monitoring current probe transformer temperature
Patent number
6,817,760
Issue date
Nov 16, 2004
Tektronix, Inc.
Michael J. Mende
G01 - MEASURING TESTING
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Patent Grant
Ultra-high-frequency current probe in surface-mount form factor
Patent number
6,337,571
Issue date
Jan 8, 2002
Tektronix, Inc.
Vivek Maddala
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Current sensing circuit for use in a current measurement probe
Publication number
20070257663
Publication date
Nov 8, 2007
Michael J. Mende
G01 - MEASURING TESTING
Information
Patent Application
Method of monitoring current probe transformer temperature
Publication number
20040101027
Publication date
May 27, 2004
Michael J. Mende
G01 - MEASURING TESTING
Information
Patent Application
ULTRA-HIGH-FREQUENCY CURRENT PROBE IN SURFACE-MOUNT FORM FACTOR
Publication number
20010001536
Publication date
May 24, 2001
VIVEK MADDALA
G01 - MEASURING TESTING