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Alberto Diaspro
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Genova, IT
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Patents Grants
last 30 patents
Information
Patent Grant
Time-resolved imaging method with high spatial resolution
Patent number
11,422,348
Issue date
Aug 23, 2022
Fondazione Istituto Italiano di Tecnologia
Giuseppe Vicidomini
G02 - OPTICS
Information
Patent Grant
Method of stimulated emission depletion microscopy having high spat...
Patent number
11,372,224
Issue date
Jun 28, 2022
Fondazione Istituto Italiano di Tecnologia
Luca Lanzano'
G01 - MEASURING TESTING
Information
Patent Grant
Method of lightening at least one biological sample, three-dimensio...
Patent number
11,092,793
Issue date
Aug 17, 2021
Fondazione Istituto Italiano di Tecnologia
Paolo Bianchini
G01 - MEASURING TESTING
Information
Patent Grant
Microscopy method and apparatus for optical tracking of emitter obj...
Patent number
10,775,602
Issue date
Sep 15, 2020
Fondazione Instituto Italiano Di Tecnologia
Marti Duocastella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Random access stimulated emission depletion (STED) microscopy
Patent number
9,810,966
Issue date
Nov 7, 2017
Fondazione Istituto Italiano di Tecnologia
Paolo Bianchini
G02 - OPTICS
Information
Patent Grant
Stimulated emission-depletion (STED) microscopy based on time gatin...
Patent number
9,772,285
Issue date
Sep 26, 2017
Fondazione Istituto Italiano di Tecnologia
Giuseppe Vicidomini
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SIMULTANEOUS MULTI-SPECIES SUPER-RESOLUTION IMAGING VIA TEMPORAL MU...
Publication number
20240295498
Publication date
Sep 5, 2024
Fondazione Istituto Italiano Di Tecnologia
Giuseppe VICIDOMINI
G02 - OPTICS
Information
Patent Application
TIME-RESOLVED IMAGING METHOD WITH HIGH SPATIAL RESOLUTION
Publication number
20200386974
Publication date
Dec 10, 2020
Fondazione Istituto Italiano Di Tecnologia
Giuseppe VICIDOMINI
G02 - OPTICS
Information
Patent Application
METHOD OF LIGHTENING AT LEAST ONE BIOLOGICAL SAMPLE, THREE-DIMENSIO...
Publication number
20200363620
Publication date
Nov 19, 2020
Fondazione Istituto Italiano Di Tecnologia
Paolo BIANCHINI
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF STIMULATED EMISSION DEPLETION MICROSCOPY HAVING HIGH SPAT...
Publication number
20200333573
Publication date
Oct 22, 2020
Fondazione Istituto Italiano Di Tecnologia
Luca LANZANO'
G01 - MEASURING TESTING
Information
Patent Application
MICROSCOPY METHOD AND APPARATUS FOR OPTICAL TRACKING OF EMITTER OBJ...
Publication number
20200142174
Publication date
May 7, 2020
Fondazione Istituto Italiano Di Tecnologia
Marti DUOCASTELLA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Random access stimulated emission depletion (STED) microscopy
Publication number
20160274439
Publication date
Sep 22, 2016
Fondazione Istituto Italiano Di Tecnologia
Paolo Bianchini
G02 - OPTICS
Information
Patent Application
STIMULATED EMISSION-DEPLETION (STED) MICROSCOPY BASED ON TIME GATIN...
Publication number
20160187259
Publication date
Jun 30, 2016
Fondazione Istituto Italiano Di Tecnologia
Giuseppe VICIDOMINI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PRO...
Publication number
20150106979
Publication date
Apr 16, 2015
Fondazione Istituto Italiano Di Tecnologia
Francesco Difato
G01 - MEASURING TESTING