Alex klooster

Person

Ann Arbor, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Off-axis paraboloid interferometric mirror with off focus illumination
- Patent number 7,440,114
- Issue date Oct 21, 2008
- Coherix, Inc.
- Alex Klooster
- G01 - MEASURING TESTING
Information Patent Grant
Method of combining holograms
- Patent number 7,359,065
- Issue date Apr 15, 2008
- Coherix, Inc.
- Jon Nisper
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric focusing technique for forming taps in fibers
- Patent number 6,898,350
- Issue date May 24, 2005
- General Dynamics Advanced Information Systems, Inc.
- Amber Iler
- G02 - OPTICS
Information Patent Grant
Ultra-miniature optical pressure sensing system
- Patent number 6,868,736
- Issue date Mar 22, 2005
- Sentec Corporation
- Takeo Sawatari
- G01 - MEASURING TESTING
Information Patent Grant
Holographic scatterometer for detection and analysis of wafer surfa...
- Patent number 6,597,446
- Issue date Jul 22, 2003
- Sentec Corporation
- Alex Klooster
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne scatterometer for detecting and analyzing wafer surface...
- Patent number 5,923,423
- Issue date Jul 13, 1999
- Sentec Corporation
- Takeo Sawatari
- G01 - MEASURING TESTING
Information Patent Grant
Optical system phase error compensator
- Patent number 4,275,454
- Issue date Jun 23, 1981
- Environmental Research Institute of Michigan
- Alex Klooster
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR REDUCING CONVECTION CURRENT EFFECTS IN THE OP...
- Publication number 20080236306
- Publication date Oct 2, 2008
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Application
Stabilizer for vibration isolation platform
- Publication number 20080150204
- Publication date Jun 26, 2008
- Coherix, Inc
- Alex klooster
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Optical fiber delivered reference beam for interferometric imaging
- Publication number 20070133008
- Publication date Jun 14, 2007
- Coherix, Inc.
- Alex Klooster
- G01 - MEASURING TESTING
Information Patent Application
Off-axis paraboloid interferometric mirror with off focus illumination
- Publication number 20070133010
- Publication date Jun 14, 2007
- Alex Klooster
- G01 - MEASURING TESTING
Information Patent Application
Method of combining holograms
- Publication number 20070024866
- Publication date Feb 1, 2007
- Coherix, Inc.
- Jon Nisper
- G01 - MEASURING TESTING
Information Patent Application
Interferometric focusing technique for forming taps in fibers
- Publication number 20040081400
- Publication date Apr 29, 2004
- Amber Iler
- G02 - OPTICS
Information Patent Application
Ultra-miniature optical pressure sensing system
- Publication number 20030159518
- Publication date Aug 28, 2003
- Takeo Sawatari
- G02 - OPTICS
Information Patent Application
Holographic scatterometer for detection and analysis of wafer surfa...
- Publication number 20020159052
- Publication date Oct 31, 2002
- Alex Klooster
- G01 - MEASURING TESTING

Alex klooster

Person

Patents Grantslast 30 patents

Off-axis paraboloid interferometric mirror with off focus illumination

Method of combining holograms

Interferometric focusing technique for forming taps in fibers

Ultra-miniature optical pressure sensing system

Holographic scatterometer for detection and analysis of wafer surfa...

Heterodyne scatterometer for detecting and analyzing wafer surface...

Optical system phase error compensator

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR REDUCING CONVECTION CURRENT EFFECTS IN THE OP...

Stabilizer for vibration isolation platform

Optical fiber delivered reference beam for interferometric imaging

Off-axis paraboloid interferometric mirror with off focus illumination

Method of combining holograms

Interferometric focusing technique for forming taps in fibers

Ultra-miniature optical pressure sensing system

Holographic scatterometer for detection and analysis of wafer surfa...