Alexander Henstra

Person

Utrecht, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Energy spectrometer with dynamic focus
- Patent number 12,100,585
- Issue date Sep 24, 2024
- FEI Company
- Arthur Reinout Hartong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of thermal magnetic field noise in TEM corrector systems
- Patent number 11,915,904
- Issue date Feb 27, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for reducing the charging effect in a transmissio...
- Patent number 11,715,618
- Issue date Aug 1, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,460,419
- Issue date Oct 4, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring 3D diffraction data
- Patent number 11,456,149
- Issue date Sep 27, 2022
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field free sample plane for charged particle microscope
- Patent number 11,450,505
- Issue date Sep 20, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of thermal magnetic field noise in TEM corrector systems
- Patent number 11,437,216
- Issue date Sep 6, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous TEM and STEM microscope
- Patent number 11,404,241
- Issue date Aug 2, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for correcting two-fold, fifth-order parasitic ab...
- Patent number 11,239,045
- Issue date Feb 1, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam microscope system for imaging during sample processing
- Patent number 11,183,364
- Issue date Nov 23, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sixth-order and above corrected STEM multipole correctors
- Patent number 11,114,271
- Issue date Sep 7, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector transfer optics for Lorentz EM
- Patent number 10,825,644
- Issue date Nov 3, 2020
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post column filter with enhanced energy range
- Patent number 10,431,420
- Issue date Oct 1, 2019
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun lens design in a charged particle microscope
- Patent number 10,410,827
- Issue date Sep 10, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration measurement in a charged particle microscope
- Patent number 10,157,727
- Issue date Dec 18, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post column filter with enhanced energy range
- Patent number 9,978,561
- Issue date May 22, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle microscope with astigmatism compensation and energ...
- Patent number 9,741,525
- Issue date Aug 22, 2017
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using an environmental transmission electron microscope
- Patent number 9,570,270
- Issue date Feb 14, 2017
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam pulsing device for use in charged-particle microscopy
- Patent number 9,048,060
- Issue date Jun 2, 2015
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector for the correction of chromatic aberrations in a particle...
- Patent number 8,884,245
- Issue date Nov 11, 2014
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector for axial aberrations of a particle-optical lens
- Patent number 8,841,630
- Issue date Sep 23, 2014
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source with integrated electrostatic energy filter
- Patent number 8,710,452
- Issue date Apr 29, 2014
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam processing
- Patent number 8,598,542
- Issue date Dec 3, 2013
- FEI Company
- Milos Toth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Distortion free stigmation of a TEM
- Patent number 8,569,693
- Issue date Oct 29, 2013
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source with integrated energy filter
- Patent number 8,461,525
- Issue date Jun 11, 2013
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source with integrated energy filter
- Patent number 7,999,225
- Issue date Aug 16, 2011
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical appliance provided with aberration-correcting means
- Patent number 7,378,667
- Issue date May 27, 2008
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle source with selectable beam current and energy spread
- Patent number 7,034,315
- Issue date Apr 25, 2006
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED P...
- Publication number 20240249905
- Publication date Jul 25, 2024
- FEI Company
- Alexander HENSTRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS Auto-Alignment Using Full Image Simulation
- Publication number 20240194466
- Publication date Jun 13, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simple Spherical Aberration Corrector for SEM
- Publication number 20240047170
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simple Spherical Aberration Corrector for SEM
- Publication number 20240047169
- Publication date Feb 8, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle optics components and their fabrication
- Publication number 20240047171
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM SYSTEM AND METHOD
- Publication number 20230420213
- Publication date Dec 28, 2023
- FEI Company
- Alexander HENSTRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC MIRROR CHROMATIC ABERRATION CORRECTORS
- Publication number 20230215682
- Publication date Jul 6, 2023
- FEI Company
- Alexander HENSTRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION
- Publication number 20230207254
- Publication date Jun 29, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR REDUCING THE CHARGING EFFECT IN A TRANSMISSIO...
- Publication number 20230040558
- Publication date Feb 9, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENERGY SPECTROMETER WITH DYNAMIC FOCUS
- Publication number 20230005733
- Publication date Jan 5, 2023
- FEI Company
- Arthur Reinout HARTONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS
- Publication number 20220392736
- Publication date Dec 8, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS
- Publication number 20220208507
- Publication date Jun 30, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE
- Publication number 20220199353
- Publication date Jun 23, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING
- Publication number 20210391145
- Publication date Dec 16, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20210302333
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA
- Publication number 20210305010
- Publication date Sep 30, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE
- Publication number 20210305007
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULTANEOUS TEM AND STEM MICROSCOPE
- Publication number 20210305012
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIXTH-ORDER AND ABOVE CORRECTED STEM MULTIPOLE CORRECTORS
- Publication number 20210159044
- Publication date May 27, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM SCANNING ELECTRON MICROSCOPE
- Publication number 20200373115
- Publication date Nov 26, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE, AND METHOD FOR ADJUSTING A CHARGED PAR...
- Publication number 20200118788
- Publication date Apr 16, 2020
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION
- Publication number 20200013580
- Publication date Jan 9, 2020
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180323036
- Publication date Nov 8, 2018
- FEI Company
- Ali Mohammadi-Gheidari
- G02 - OPTICS
Information Patent Application
ABERRATION MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180254168
- Publication date Sep 6, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POST COLUMN FILTER WITH ENHANCED ENERGY RANGE
- Publication number 20180254169
- Publication date Sep 6, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERG...
- Publication number 20170221673
- Publication date Aug 3, 2017
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POST COLUMN FILTER WITH ENHANCED ENERGY RANGE
- Publication number 20170125210
- Publication date May 4, 2017
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS

Alexander Henstra

Person

Patents Grantslast 30 patents

Energy spectrometer with dynamic focus

Reduction of thermal magnetic field noise in TEM corrector systems

Electron diffraction holography

Methods and systems for acquiring three-dimensional electron diffra...

System and method for reducing the charging effect in a transmissio...

Electron diffraction holography

Methods and systems for acquiring 3D diffraction data

Magnetic field free sample plane for charged particle microscope

Reduction of thermal magnetic field noise in TEM corrector systems

Simultaneous TEM and STEM microscope

Method and system for correcting two-fold, fifth-order parasitic ab...

Dual beam microscope system for imaging during sample processing

Sixth-order and above corrected STEM multipole correctors

Corrector transfer optics for Lorentz EM

Post column filter with enhanced energy range

Gun lens design in a charged particle microscope

Aberration measurement in a charged particle microscope

Post column filter with enhanced energy range

Charged-particle microscope with astigmatism compensation and energ...

Method of using an environmental transmission electron microscope

Beam pulsing device for use in charged-particle microscopy

Corrector for the correction of chromatic aberrations in a particle...

Corrector for axial aberrations of a particle-optical lens

Charged particle source with integrated electrostatic energy filter

Charged particle beam processing

Distortion free stigmation of a TEM

Charged particle source with integrated energy filter

Charged particle source with integrated energy filter

Particle-optical appliance provided with aberration-correcting means

Particle source with selectable beam current and energy spread

Patents Applicationslast 30 patents

BIFOCAL ELECTRON MICROSCOPE

TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED P...

EELS Auto-Alignment Using Full Image Simulation

Simple Spherical Aberration Corrector for SEM

Simple Spherical Aberration Corrector for SEM

Charged particle optics components and their fabrication

FOCUSED ION BEAM SYSTEM AND METHOD

ELECTROSTATIC MIRROR CHROMATIC ABERRATION CORRECTORS

ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION

SYSTEM AND METHOD FOR REDUCING THE CHARGING EFFECT IN A TRANSMISSIO...

ENERGY SPECTROMETER WITH DYNAMIC FOCUS

ELECTRON DIFFRACTION HOLOGRAPHY

REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS

MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE

DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING

ELECTRON DIFFRACTION HOLOGRAPHY

METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA

DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE

SIMULTANEOUS TEM AND STEM MICROSCOPE

SIXTH-ORDER AND ABOVE CORRECTED STEM MULTIPOLE CORRECTORS

MULTI-BEAM SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE MICROSCOPE, AND METHOD FOR ADJUSTING A CHARGED PAR...

ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE

ABERRATION MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

POST COLUMN FILTER WITH ENHANCED ENERGY RANGE

CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERG...

POST COLUMN FILTER WITH ENHANCED ENERGY RANGE