Alexander Kharchenko

Person

Almelo, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Adaptable X-ray analysis apparatus
- Patent number 12,031,925
- Issue date Jul 9, 2024
- Malvern Panalytical B.V.
- Detlef Beckers
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-ray diffraction method and apparatus
- Patent number 10,753,890
- Issue date Aug 25, 2020
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative X-ray analysis—matrix thickness correction
- Patent number 9,784,699
- Issue date Oct 10, 2017
- PANalytical B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction and fluorescence
- Patent number 7,978,820
- Issue date Jul 12, 2011
- PANalytical B.V.
- Alexander Kharchenko
- G01 - MEASURING TESTING
Information Patent Grant
Diffractometer
- Patent number 7,116,754
- Issue date Oct 3, 2006
- PANalytical B.V.
- Klaus Lischka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND METHOD
- Publication number 20240298400
- Publication date Sep 5, 2024
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...
- Publication number 20230296536
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20230270394
- Publication date Aug 31, 2023
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-Ray beam shaping apparatus and method
- Publication number 20220163466
- Publication date May 26, 2022
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
High resolution X-ray Diffraction Method and Apparatus
- Publication number 20180259464
- Publication date Sep 13, 2018
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
Quantitative X-ray Analysis - Matrix thickness correction
- Publication number 20160258890
- Publication date Sep 8, 2016
- PANALYTICAL B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION AND FLUORESCENCE
- Publication number 20110096898
- Publication date Apr 28, 2011
- Alexander Kharchenko
- G01 - MEASURING TESTING
Information Patent Application
Diffractometer
- Publication number 20050195941
- Publication date Sep 8, 2005
- Klaus Lischka
- C30 - CRYSTAL GROWTH

Alexander Kharchenko

Person

Patents Grantslast 30 patents

Adaptable X-ray analysis apparatus

X-ray beam shaping apparatus and method

High resolution X-ray diffraction method and apparatus

Quantitative X-ray analysis—matrix thickness correction

X-ray diffraction and fluorescence

Diffractometer

Patents Applicationslast 30 patents

Adaptable X-Ray Analysis Apparatus

X-RAY ANALYSIS APPARATUS AND METHOD

PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...

Adaptable X-Ray Analysis Apparatus

X-Ray beam shaping apparatus and method

High resolution X-ray Diffraction Method and Apparatus

Quantitative X-ray Analysis - Matrix thickness correction

X-RAY DIFFRACTION AND FLUORESCENCE

Diffractometer