Alexander Krokhmal

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Navigation accuracy using camera coupled with detector assembly
- Patent number 12,249,059
- Issue date Mar 11, 2025
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Spot-size control in reflection-based and scatterometry-based X-ray...
- Patent number 11,781,999
- Issue date Oct 10, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Small-angle x-ray scatterometry
- Patent number 11,703,464
- Issue date Jul 18, 2023
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube
- Patent number 11,302,508
- Issue date Apr 12, 2022
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Small-angle x-ray scatterometry
- Patent number 11,181,490
- Issue date Nov 23, 2021
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for X-ray scatterometry
- Patent number 11,169,099
- Issue date Nov 9, 2021
- BRUKER TECHNOLOGIES LTD.
- Alex Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source optics for small-angle X-ray scatterometry
- Patent number 10,976,268
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection optics for small-angle X-ray scatterometry
- Patent number 10,976,270
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment for small-angle x-ray scatterometry
- Patent number 10,976,269
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for X-ray scatterometry
- Patent number 10,684,238
- Issue date Jun 16, 2020
- BRUKER TECHNOLOGIES LTD.
- Alex Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scatterometry apparatus
- Patent number 9,606,073
- Issue date Mar 28, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Fast measurement of X-ray diffraction from tilted layers
- Patent number 8,437,450
- Issue date May 7, 2013
- Jordan Valley Semiconductors Ltd.
- John Wall
- G01 - MEASURING TESTING
Information Patent Grant
X-ray measurement of properties of nano-particles
- Patent number 7,680,243
- Issue date Mar 16, 2010
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Target alignment for X-ray scattering measurements
- Patent number 7,600,916
- Issue date Oct 13, 2009
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Multifunction X-ray analysis system
- Patent number 7,551,719
- Issue date Jun 23, 2009
- Jordan Valley Semiconductord Ltd
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Multi-detector EDXRD
- Patent number 7,321,652
- Issue date Jan 22, 2008
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Navigation accuracy using imaging assembly coupled with detector as...
- Publication number 20250157023
- Publication date May 15, 2025
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
Small-angle x-ray scatterometry
- Publication number 20240077435
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
Monitoring properties of X-ray beam during X-ray analysis
- Publication number 20240077437
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
navigation accuracy using camera coupled with detector assembly
- Publication number 20230316487
- Publication date Oct 5, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spot-size control in reflection-based and scatterometry-based X-ray...
- Publication number 20230075421
- Publication date Mar 9, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20220042933
- Publication date Feb 10, 2022
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
Small-angle x-ray scatterometry
- Publication number 20210285898
- Publication date Sep 16, 2021
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TUBE
- Publication number 20200168427
- Publication date May 28, 2020
- Alexander Krokhmal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
- Publication number 20190339215
- Publication date Nov 7, 2019
- BRUKER JV ISRAEL LTD.
- Alex Krokhmal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray detection optics for small-angle X-ray scatterometry
- Publication number 20190323974
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
X-ray source optics for small-angle X-ray scatterometry
- Publication number 20190323975
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
Wafer alignment for small-angle X-ray scatterometry
- Publication number 20190323976
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
- Publication number 20170199136
- Publication date Jul 13, 2017
- BRUKER JV ISRAEL LTD.
- Alex Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCATTEROMETRY APPARATUS
- Publication number 20150369759
- Publication date Dec 24, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
- Publication number 20120140889
- Publication date Jun 7, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- John Wall
- G01 - MEASURING TESTING
Information Patent Application
X-ray measurement of properties of nano-particles
- Publication number 20090067573
- Publication date Mar 12, 2009
- JORDAN VALLEY SEMICONDUCTORS
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Target alignment for x-ray scattering measurements
- Publication number 20070286344
- Publication date Dec 13, 2007
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DETECTOR EDXRD
- Publication number 20070058779
- Publication date Mar 15, 2007
- Boris YOKHIN
- G01 - MEASURING TESTING
Information Patent Application
Multifunction X-ray analysis system
- Publication number 20060062351
- Publication date Mar 23, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING

Alexander Krokhmal

Person

Patents Grantslast 30 patents

Navigation accuracy using camera coupled with detector assembly

Small-angle X-ray scatterometry

Monitoring properties of X-ray beam during X-ray analysis

Spot-size control in reflection-based and scatterometry-based X-ray...

Small-angle x-ray scatterometry

X-ray tube

Small-angle x-ray scatterometry

Method and apparatus for X-ray scatterometry

X-ray source optics for small-angle X-ray scatterometry

X-ray detection optics for small-angle X-ray scatterometry

Wafer alignment for small-angle x-ray scatterometry

Method and apparatus for X-ray scatterometry

X-ray scatterometry apparatus

Fast measurement of X-ray diffraction from tilted layers

X-ray measurement of properties of nano-particles

Target alignment for X-ray scattering measurements

Multifunction X-ray analysis system

Multi-detector EDXRD

Patents Applicationslast 30 patents

Navigation accuracy using imaging assembly coupled with detector as...

Small-Angle X-Ray Scatterometry

Small-angle x-ray scatterometry

Monitoring properties of X-ray beam during X-ray analysis

navigation accuracy using camera coupled with detector assembly

Spot-size control in reflection-based and scatterometry-based X-ray...

Small-Angle X-Ray Scatterometry

Small-angle x-ray scatterometry

X-RAY TUBE

METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY

X-ray detection optics for small-angle X-ray scatterometry

X-ray source optics for small-angle X-ray scatterometry

Wafer alignment for small-angle X-ray scatterometry

METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY

X-RAY SCATTEROMETRY APPARATUS

FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS

X-ray measurement of properties of nano-particles

Target alignment for x-ray scattering measurements

MULTI-DETECTOR EDXRD

Multifunction X-ray analysis system