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Alexander Schindler
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Leupoldsgruen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring arrangement and method for a thermal analysis of a sample
Patent number
11,237,123
Issue date
Feb 1, 2022
Netzsch-Gerätebau GmbH
Alexander Schindler
G01 - MEASURING TESTING
Information
Patent Grant
Measuring arrangement and method for a thermal analysis of a sample
Patent number
11,143,608
Issue date
Oct 12, 2021
Netzsch-Gerätebau GmbH
Alexander Schindler
G01 - MEASURING TESTING
Information
Patent Grant
Measuring arrangement and method for a thermal analysis of a sample
Patent number
11,143,609
Issue date
Oct 12, 2021
Netzsch-Gerätebau GmbH
Alexander Schindler
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the thermal analysis of a sample and/or for t...
Patent number
10,302,497
Issue date
May 28, 2019
Netzsch-Gerätebau GmbH
Martin Brunner
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for material analysis
Patent number
10,088,441
Issue date
Oct 2, 2018
Netzsch-Gerätebau GmbH
Thomas Denner
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating a measurement result of a thermal analysis, a...
Patent number
9,816,869
Issue date
Nov 14, 2017
Netzsch-Gerätebau GmbH
Thomas Denner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Thermoanalysis device
Patent number
9,429,531
Issue date
Aug 30, 2016
Netzsch-Gerätebau GmbH
Georg Neumann
G01 - MEASURING TESTING
Information
Patent Grant
Method for performing a differential thermal analysis
Patent number
9,310,259
Issue date
Apr 12, 2016
Netzsch-Gerätebau GmbH
Thomas Denner
G01 - MEASURING TESTING
Information
Patent Grant
Thermal analysis apparatus and thermal analysis method
Patent number
8,899,827
Issue date
Dec 2, 2014
Netzsch-Gerätebau GmbH
Alexander Schindler
C01 - INORGANIC CHEMISTRY
Patents Applications
last 30 patents
Information
Patent Application
Measuring Arrangement and Method for a Thermal Analysis of a Sample
Publication number
20190376916
Publication date
Dec 12, 2019
Netzsch-Gerätebau GmbH
Alexander Schindler
G01 - MEASURING TESTING
Information
Patent Application
Measuring Arrangement And Method For A Thermal Analysis Of A Sample
Publication number
20190376914
Publication date
Dec 12, 2019
Netzsch-Gerätebau GmbH
Alexander Schindler
G01 - MEASURING TESTING
Information
Patent Application
Measuring Arrangement and Method for a Thermal Analysis of a Sample
Publication number
20190376915
Publication date
Dec 12, 2019
Netzsch-Gerätebau GmbH
Alexander Schindler
G01 - MEASURING TESTING
Information
Patent Application
Method And Device For The Thermal Analysis Of A Sample And/Or For T...
Publication number
20170176257
Publication date
Jun 22, 2017
Netzsch-Gerätebau GmbH
Martin Brunner
G01 - MEASURING TESTING
Information
Patent Application
Method And Magazine For Holding In Readiness, Transporting, Process...
Publication number
20160325286
Publication date
Nov 10, 2016
Netzsch-Gerätebau GmbH
Thomas Denner
G01 - MEASURING TESTING
Information
Patent Application
Method And Device For Material Analysis
Publication number
20150369765
Publication date
Dec 24, 2015
Netzsch-Gerätebau GmbH
Thomas Denner
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND MAGAZINE FOR HOLDING IN READINESS, TRANSPORTING, PROCESS...
Publication number
20150013479
Publication date
Jan 15, 2015
Thomas Denner
G01 - MEASURING TESTING
Information
Patent Application
Method For Evaluating A Measurement Result Of A Thermal Analysis, A...
Publication number
20150019157
Publication date
Jan 15, 2015
Thomas Denner
G01 - MEASURING TESTING
Information
Patent Application
Method for performing a differential thermal analysis
Publication number
20140204971
Publication date
Jul 24, 2014
Thomas Denner
G01 - MEASURING TESTING
Information
Patent Application
Thermoanalysis Device
Publication number
20130336355
Publication date
Dec 19, 2013
Georg Neumann
G01 - MEASURING TESTING
Information
Patent Application
Thermal Analysis Apparatus And Thermal Analysis Method
Publication number
20120096936
Publication date
Apr 26, 2012
Alexander Schindler
G01 - MEASURING TESTING