Alexander von Glasow

Person

Grunwald, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitor having a plurality of parallel conductive members
- Patent number 8,569,820
- Issue date Oct 29, 2013
- Infineon Technologies AG
- Hans-Joachim Barth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with pads connected by an under-bump metallizati...
- Patent number 8,487,453
- Issue date Jul 16, 2013
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting stress migration properties
- Patent number 8,323,991
- Issue date Dec 4, 2012
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting stress migration properties
- Patent number 8,211,720
- Issue date Jul 3, 2012
- Infineon Technologies AG
- Armin Fischer
Information Patent Grant
Semiconductor devices and methods of manufacture thereof
- Patent number 8,138,539
- Issue date Mar 20, 2012
- Infineon Technologies AG
- Hans-Joachim Barth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with additional mini-pads connected by an under-...
- Patent number 7,919,363
- Issue date Apr 5, 2011
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for detecting stress migration properties
- Patent number 7,888,672
- Issue date Feb 15, 2011
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with capacitor
- Patent number 7,777,300
- Issue date Aug 17, 2010
- Infineon Technologies AG
- Helmut Tews
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated test circuit arrangement and test method
- Patent number 7,327,152
- Issue date Feb 5, 2008
- Infineon Technologies, AG
- Armin Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit arrangement with intermediate materials and asso...
- Patent number 7,315,998
- Issue date Jan 1, 2008
- Infineon Technologies AG
- Armin Fischer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit having a thermally shielded electric resistor trace
- Patent number 6,940,720
- Issue date Sep 6, 2005
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FUSES AND FUSE PROGRAMMING METHODS
- Publication number 20150228436
- Publication date Aug 13, 2015
- INFINEON TECHNOLOGIES AG
- Franz Ungar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Devices and Methods of Manufacture Thereof
- Publication number 20120099243
- Publication date Apr 26, 2012
- INFINEON TECHNOLOGIES AG
- Hans-Joachim Barth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR DETECTING STRESS MIGRATION PROPERTIES
- Publication number 20110097826
- Publication date Apr 28, 2011
- INFINEON TECHNOLOGIES AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH CAPACITOR
- Publication number 20090073633
- Publication date Mar 19, 2009
- Infineon Technologies AG
- Helmut Tews
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit comprising intermediate materials and correspond...
- Publication number 20050275103
- Publication date Dec 15, 2005
- Armin Fischer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device and method for detecting stress migration properties
- Publication number 20050211980
- Publication date Sep 29, 2005
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS

Alexander von Glasow

Person

Patents Grantslast 30 patents

Capacitor having a plurality of parallel conductive members

Integrated circuit with pads connected by an under-bump metallizati...

Method for detecting stress migration properties

Method for detecting stress migration properties

Semiconductor devices and methods of manufacture thereof

Integrated circuit with additional mini-pads connected by an under-...

Device for detecting stress migration properties

Semiconductor device with capacitor

Integrated test circuit arrangement and test method

Integrated circuit arrangement with intermediate materials and asso...

Integrated circuit having a thermally shielded electric resistor trace

Patents Applicationslast 30 patents

FUSES AND FUSE PROGRAMMING METHODS

Semiconductor Devices and Methods of Manufacture Thereof

DEVICE AND METHOD FOR DETECTING STRESS MIGRATION PROPERTIES

SEMICONDUCTOR DEVICE WITH CAPACITOR

Integrated circuit comprising intermediate materials and correspond...

Device and method for detecting stress migration properties