Alexandre Savtchouk

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Tampa, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Topside contact device and method for characterization of high elec...
- Patent number 11,561,254
- Issue date Jan 24, 2023
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Measuring semiconductor doping using constant surface potential cor...
- Patent number 10,969,370
- Issue date Apr 6, 2021
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Accurate measuring of long steady state minority carrier diffusion...
- Patent number 8,093,920
- Issue date Jan 10, 2012
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Determining composition of mixed dielectrics
- Patent number 6,815,974
- Issue date Nov 9, 2004
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for elevated temperature measurement with probes...
- Patent number 6,771,091
- Issue date Aug 3, 2004
- Semiconductor Diagnostics, Inc.
- Jacek J. Lagowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...
- Publication number 20220381816
- Publication date Dec 1, 2022
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
Charge Metrology for Integrated Measurement
- Publication number 20180315630
- Publication date Nov 1, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring semiconductor doping using constant surface potential cor...
- Publication number 20160356750
- Publication date Dec 8, 2016
- Semilab SDI LLC
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASURING OF LONG STEADY STATE MINORITY CARRIER DIFFUSION...
- Publication number 20100085073
- Publication date Apr 8, 2010
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED SENSITIVITY NON-CONTACT ELECTRICAL MONITORING OF COPPER CO...
- Publication number 20090047748
- Publication date Feb 19, 2009
- Alexandre Savtchouk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for elevated temperature measurement with probes...
- Publication number 20040057497
- Publication date Mar 25, 2004
- Jacek J. Lagowski
- G01 - MEASURING TESTING