Ali Mohammadi-Gheidari

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,961,709
- Issue date Apr 16, 2024
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron optical module for providing an off-axial electron beam wi...
- Patent number 11,804,357
- Issue date Oct 31, 2023
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field free sample plane for charged particle microscope
- Patent number 11,450,505
- Issue date Sep 20, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron-beam imaging apparatus with improved performance
- Patent number 10,971,326
- Issue date Apr 6, 2021
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam charged particle imaging apparatus
- Patent number 10,790,113
- Issue date Sep 29, 2020
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam scanning transmission charged particle microscope
- Patent number 10,607,811
- Issue date Mar 31, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emission noise correction of a charged particle source
- Patent number 10,453,647
- Issue date Oct 22, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun lens design in a charged particle microscope
- Patent number 10,410,827
- Issue date Sep 10, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED P...
- Publication number 20240249905
- Publication date Jul 25, 2024
- FEI Company
- Alexander HENSTRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simple Spherical Aberration Corrector for SEM
- Publication number 20240047170
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simple Spherical Aberration Corrector for SEM
- Publication number 20240047169
- Publication date Feb 8, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle optics components and their fabrication
- Publication number 20240047171
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20240006149
- Publication date Jan 4, 2024
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC MIRROR CHROMATIC ABERRATION CORRECTORS
- Publication number 20230215682
- Publication date Jul 6, 2023
- FEI Company
- Alexander HENSTRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON OPTICAL MODULE FOR PROVIDING AN OFF-AXIAL ELECTRON BEAM WI...
- Publication number 20230101108
- Publication date Mar 30, 2023
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE
- Publication number 20220199353
- Publication date Jun 23, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE
- Publication number 20210305007
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM SCANNING ELECTRON MICROSCOPE
- Publication number 20200373115
- Publication date Nov 26, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20200273667
- Publication date Aug 27, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE
- Publication number 20200090899
- Publication date Mar 19, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE IMAGING APPARATUS
- Publication number 20190393013
- Publication date Dec 26, 2019
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180323036
- Publication date Nov 8, 2018
- FEI Company
- Ali Mohammadi-Gheidari
- G02 - OPTICS

Ali Mohammadi-Gheidari

Person

Patents Grantslast 30 patents

Charged particle beam device for inspection of a specimen with a pl...

Electron optical module for providing an off-axial electron beam wi...

Magnetic field free sample plane for charged particle microscope

Multi-electron-beam imaging apparatus with improved performance

Multi-beam charged particle imaging apparatus

Multi-beam scanning transmission charged particle microscope

Emission noise correction of a charged particle source

Gun lens design in a charged particle microscope

Patents Applicationslast 30 patents

TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED P...

Simple Spherical Aberration Corrector for SEM

Simple Spherical Aberration Corrector for SEM

Charged particle optics components and their fabrication

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

ELECTROSTATIC MIRROR CHROMATIC ABERRATION CORRECTORS

ELECTRON OPTICAL MODULE FOR PROVIDING AN OFF-AXIAL ELECTRON BEAM WI...

MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE

DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE

MULTI-BEAM SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE

MULTI-BEAM CHARGED PARTICLE IMAGING APPARATUS

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE