Alvin W. Strong

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
On chip bias temperature instability characterization of a semicond...
- Patent number 9,404,960
- Issue date Aug 2, 2016
- GLOBALFOUNDRIES Inc.
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Grant
Structure for electrically tunable resistor
- Patent number 8,555,216
- Issue date Oct 8, 2013
- International Business Machines Corporation
- Icho E. T. Iben
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel array architecture for constant current electro-migration...
- Patent number 8,217,671
- Issue date Jul 10, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
On-chip embedded thermal antenna for chip cooling
- Patent number 8,178,434
- Issue date May 15, 2012
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip heater and methods for fabrication thereof and use thereof
- Patent number 8,138,573
- Issue date Mar 20, 2012
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement methodology and array structure for statistical stress...
- Patent number 8,120,356
- Issue date Feb 21, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
On-chip embedded thermal antenna for chip cooling
- Patent number 8,053,814
- Issue date Nov 8, 2011
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Neutralization of trapped charge in a charge accumulation layer of...
- Patent number 8,035,200
- Issue date Oct 11, 2011
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermo-mechanical cleavable structure
- Patent number 8,018,017
- Issue date Sep 13, 2011
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array-based early threshold voltage recovery characterization measu...
- Patent number 7,868,640
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Kanak B Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor below the buried oxide of SOI CMOS technologies for prote...
- Patent number 7,791,169
- Issue date Sep 7, 2010
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for neutralizing trapped charge in a charge accumulation lay...
- Patent number 7,736,915
- Issue date Jun 15, 2010
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically tunable resistor and related methods
- Patent number 7,723,200
- Issue date May 25, 2010
- International Business Machines Corporation
- Icko E. Iben
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip heater and methods for fabrication thereof and use thereof
- Patent number 7,704,847
- Issue date Apr 27, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC chip stress testing
- Patent number 7,512,506
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Oliver Aubel
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,511,378
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Capacitor below the buried oxide of SOI CMOS technologies for prote...
- Patent number 7,388,274
- Issue date Jun 17, 2008
- International Business Machines Corporation
- John M Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor below the buried oxide of SOI CMOS technologies for prote...
- Patent number 7,315,075
- Issue date Jan 1, 2008
- International Business Machines Corporation
- John M Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 7,298,161
- Issue date Nov 20, 2007
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,096,450
- Issue date Aug 22, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heater for annealing trapped charge in a semiconductor device
- Patent number 7,064,414
- Issue date Jun 20, 2006
- International Business Machines Corporation
- John M Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench capacitor vertical structure
- Patent number 7,023,041
- Issue date Apr 4, 2006
- International Business Machines Corporation
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 6,891,359
- Issue date May 10, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit to investigate charge transfer array transistor...
- Patent number 6,762,966
- Issue date Jul 13, 2004
- International Business Machines Corporation
- Giuseppe LaRosa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor antifuse with heating element
- Patent number 6,750,530
- Issue date Jun 15, 2004
- International Business Machines Corporation
- William A. Klaasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Negative differential resistance reoxidized nitride silicon-based p...
- Patent number 6,743,655
- Issue date Jun 1, 2004
- International Business Machines Corporation
- Fen Chen
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for accelerated determination of electromigrat...
- Patent number 6,603,321
- Issue date Aug 5, 2003
- International Business Machines Corporation
- Ronald G. Filippi
- G01 - MEASURING TESTING
Information Patent Grant
Negative differential resistance reoxidized nitride silicon-based p...
- Patent number 6,445,021
- Issue date Sep 3, 2002
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of forming a capacitor on a substrate
- Patent number 6,352,902
- Issue date Mar 5, 2002
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processes for reduced topography capacitors
- Patent number 6,333,239
- Issue date Dec 25, 2001
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ON CHIP BIAS TEMPERATURE INSTABILITY CHARACTERIZATION OF A SEMICOND...
- Publication number 20150091601
- Publication date Apr 2, 2015
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP EMBEDDED THERMAL ANTENNA FOR CHIP COOLING
- Publication number 20120015511
- Publication date Jan 19, 2012
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parallel Array Architecture for Constant Current Electro-Migration...
- Publication number 20100327892
- Publication date Dec 30, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHODOLOGY AND ARRAY STRUCTURE FOR STATISTICAL STRESS...
- Publication number 20100318313
- Publication date Dec 16, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP EMBEDDED THERMAL ANTENNA FOR CHIP COOLING
- Publication number 20100258900
- Publication date Oct 14, 2010
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NEUTRALIZATION OF TRAPPED CHARGE IN A CHARGE ACCUMULATION LAYER OF...
- Publication number 20100237475
- Publication date Sep 23, 2010
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP HEATER AND METHODS FOR FABRICATION THEREOF AND USE THEREOF
- Publication number 20100200953
- Publication date Aug 12, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Array-Based Early Threshold Voltage Recovery Characterization Measu...
- Publication number 20090251167
- Publication date Oct 8, 2009
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
PAIRED MAGNETIC TUNNEL JUNCTION TO A SEMICONDUCTOR FIELD-EFFECT TRA...
- Publication number 20090121259
- Publication date May 14, 2009
- Icko E. T. Iben
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
IC CHIP STRESS TESTING
- Publication number 20080297188
- Publication date Dec 4, 2008
- International Business Machines Corporation
- Oliver Aubel
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY TUNABLE RESISTOR AND RELATED METHODS
- Publication number 20080237797
- Publication date Oct 2, 2008
- ICKO E.T. IBEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN STRUCTURE FOR ELECTRICALLY TUNABLE RESISTOR
- Publication number 20080237590
- Publication date Oct 2, 2008
- International Business Machines Corporation
- Icko E. T. Iben
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR BELOW THE BURIED OXIDE OF SOI CMOS TECHNOLOGIES FOR PROTE...
- Publication number 20080191314
- Publication date Aug 14, 2008
- International Busines Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR BELOW THE BURIED OXIDE OF SOI CMOS TECHNOLOGIES FOR PROTE...
- Publication number 20070272961
- Publication date Nov 29, 2007
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP HEATER AND METHODS FOR FABRICATION THEREOF AND USE THEREOF
- Publication number 20070268736
- Publication date Nov 22, 2007
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE NEUTRALIZATION IN SEMICONDUCTOR STRUCTURES
- Publication number 20070195841
- Publication date Aug 23, 2007
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Enhancement of performance of a conductive wire in a multilayered s...
- Publication number 20060226142
- Publication date Oct 12, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMO-MECHANICAL CLEAVABLE STRUCTURE
- Publication number 20060163685
- Publication date Jul 27, 2006
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR BELOW THE BURIED OXIDE OF SOI CMOS TECHNOLOGIES FOR PROTE...
- Publication number 20060163635
- Publication date Jul 27, 2006
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEATER FOR ANNEALING TRAPPED CHARGE IN A SEMICONDUCTOR DEVICE
- Publication number 20060103007
- Publication date May 18, 2006
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuitry and methodology to establish correlation between gate die...
- Publication number 20050184720
- Publication date Aug 25, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...
- Publication number 20040262031
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuitry And Methodology To Establish Correlation Between Gate Die...
- Publication number 20040145384
- Publication date Jul 29, 2004
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
Trench capacitor vertical structure
- Publication number 20040135188
- Publication date Jul 15, 2004
- International Business Machines Corporation
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND CIRCUIT TO INVESTIGATE CHARGE TRANSFER ARRAY TRANSISTOR...
- Publication number 20040130957
- Publication date Jul 8, 2004
- International Business Machines Corp.
- Giuseppe LaRosa
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR ACCELERATED DETERMINATION OF ELECTROMIGRAT...
- Publication number 20030080761
- Publication date May 1, 2003
- International Business Machines Corporation and Infineon Technologies North A...
- Ronald G. Filippi
- G01 - MEASURING TESTING
Information Patent Application
Negative differential resistance reoxidized nitride silicon-based p...
- Publication number 20020185703
- Publication date Dec 12, 2002
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate stack process for high reliability dual oxide CMOS devices and...
- Publication number 20020027681
- Publication date Mar 7, 2002
- International Business Machines Corportion
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS

Alvin W. Strong

Person

Patents Grantslast 30 patents

On chip bias temperature instability characterization of a semicond...

Structure for electrically tunable resistor

Parallel array architecture for constant current electro-migration...

On-chip embedded thermal antenna for chip cooling

On-chip heater and methods for fabrication thereof and use thereof

Measurement methodology and array structure for statistical stress...

On-chip embedded thermal antenna for chip cooling

Neutralization of trapped charge in a charge accumulation layer of...

Thermo-mechanical cleavable structure

Array-based early threshold voltage recovery characterization measu...

Capacitor below the buried oxide of SOI CMOS technologies for prote...

Method for neutralizing trapped charge in a charge accumulation lay...

Electrically tunable resistor and related methods

On-chip heater and methods for fabrication thereof and use thereof

IC chip stress testing

Enhancement of performance of a conductive wire in a multilayered s...

Capacitor below the buried oxide of SOI CMOS technologies for prote...

Capacitor below the buried oxide of SOI CMOS technologies for prote...

Circuitry and methodology to establish correlation between gate die...

Enhancement of performance of a conductive wire in a multilayered s...

Heater for annealing trapped charge in a semiconductor device

Trench capacitor vertical structure

Circuitry and methodology to establish correlation between gate die...

Method and circuit to investigate charge transfer array transistor...

Semiconductor antifuse with heating element

Negative differential resistance reoxidized nitride silicon-based p...

Method and apparatus for accelerated determination of electromigrat...

Negative differential resistance reoxidized nitride silicon-based p...

Process of forming a capacitor on a substrate

Processes for reduced topography capacitors

Patents Applicationslast 30 patents

ON CHIP BIAS TEMPERATURE INSTABILITY CHARACTERIZATION OF A SEMICOND...

ON-CHIP EMBEDDED THERMAL ANTENNA FOR CHIP COOLING

Parallel Array Architecture for Constant Current Electro-Migration...

MEASUREMENT METHODOLOGY AND ARRAY STRUCTURE FOR STATISTICAL STRESS...

ON-CHIP EMBEDDED THERMAL ANTENNA FOR CHIP COOLING

NEUTRALIZATION OF TRAPPED CHARGE IN A CHARGE ACCUMULATION LAYER OF...

ON-CHIP HEATER AND METHODS FOR FABRICATION THEREOF AND USE THEREOF

Array-Based Early Threshold Voltage Recovery Characterization Measu...

PAIRED MAGNETIC TUNNEL JUNCTION TO A SEMICONDUCTOR FIELD-EFFECT TRA...

IC CHIP STRESS TESTING

ELECTRICALLY TUNABLE RESISTOR AND RELATED METHODS

DESIGN STRUCTURE FOR ELECTRICALLY TUNABLE RESISTOR

CAPACITOR BELOW THE BURIED OXIDE OF SOI CMOS TECHNOLOGIES FOR PROTE...

CAPACITOR BELOW THE BURIED OXIDE OF SOI CMOS TECHNOLOGIES FOR PROTE...

ON-CHIP HEATER AND METHODS FOR FABRICATION THEREOF AND USE THEREOF

CHARGE NEUTRALIZATION IN SEMICONDUCTOR STRUCTURES

Enhancement of performance of a conductive wire in a multilayered s...

THERMO-MECHANICAL CLEAVABLE STRUCTURE

CAPACITOR BELOW THE BURIED OXIDE OF SOI CMOS TECHNOLOGIES FOR PROTE...

HEATER FOR ANNEALING TRAPPED CHARGE IN A SEMICONDUCTOR DEVICE

Circuitry and methodology to establish correlation between gate die...

ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...

Circuitry And Methodology To Establish Correlation Between Gate Die...

Trench capacitor vertical structure

METHOD AND CIRCUIT TO INVESTIGATE CHARGE TRANSFER ARRAY TRANSISTOR...

METHOD AND APPARATUS FOR ACCELERATED DETERMINATION OF ELECTROMIGRAT...

Negative differential resistance reoxidized nitride silicon-based p...

Gate stack process for high reliability dual oxide CMOS devices and...