Ami MA

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
- Patent number 11,741,596
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Min-Chul Park
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR GENERATING LEARNING MODEL FOR PREDICTING SEMICONDUCTOR D...
- Publication number 20240402619
- Publication date Dec 5, 2024
- Samsung Electronics Co., Ltd.
- Minkyu KIM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF PROVIDING ARTIFICIAL INTELLIGENCE ALGORITHM, OPERATING ME...
- Publication number 20240211755
- Publication date Jun 27, 2024
- Samsung Electronics Co., Ltd.
- Sunghee LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING STRUCTURE BASED ON SPECTRUM
- Publication number 20240028814
- Publication date Jan 25, 2024
- Samsung Electronics Co., Ltd.
- QHwan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING DEVICE STRUCTURE PREDICTION MODEL AND DEVICE S...
- Publication number 20230062430
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ami MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20200175665
- Publication date Jun 4, 2020
- Samsung Electronics Co., Ltd.
- Min-Chul PARK
- G06 - COMPUTING CALCULATING COUNTING