Amin Samsavar

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems configured to perform a non-contact method for determining...
- Patent number 7,719,294
- Issue date May 18, 2010
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,538,333
- Issue date May 26, 2009
- KLA-Tencor Technologies Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a property of an insulating film
- Patent number 7,358,748
- Issue date Apr 15, 2008
- KLA-Tencor Technologies Corp.
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
System for sensing a sample
- Patent number 7,278,301
- Issue date Oct 9, 2007
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,248,062
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a property of an insulating film
- Patent number 7,012,438
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corp.
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
System for sensing a sample
- Patent number 6,931,917
- Issue date Aug 23, 2005
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Grant
Tank probe for measuring surface conductance
- Patent number 6,794,886
- Issue date Sep 21, 2004
- KLA-Tencor Technologies Corporation
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting metal contamination on a semiconduc...
- Patent number 6,759,255
- Issue date Jul 6, 2004
- KLA-Tencor Technologies Corp.
- Zhiwei Xu
- G01 - MEASURING TESTING
Information Patent Grant
System for sensing a sample
- Patent number 6,520,005
- Issue date Feb 18, 2003
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 6,267,005
- Issue date Jul 31, 2001
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical profilometer combined with stylus probe measurement device
- Patent number 5,955,661
- Issue date Sep 21, 1999
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 5,948,972
- Issue date Sep 7, 1999
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for locating a feature of a surface
- Patent number 5,866,806
- Issue date Feb 2, 1999
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Acoustic sensor as proximity detector
- Patent number 5,852,232
- Issue date Dec 22, 1998
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
System for Sensing a Sample
- Publication number 20060230819
- Publication date Oct 19, 2006
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
System for Sensing a Sample
- Publication number 20060207318
- Publication date Sep 21, 2006
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
System for sensing a sample
- Publication number 20050262931
- Publication date Dec 1, 2005
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
System for sensing a sample
- Publication number 20040118193
- Publication date Jun 24, 2004
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20030089162
- Publication date May 15, 2003
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
System for sensing a sample
- Publication number 20030089163
- Publication date May 15, 2003
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SENSING A SAMPLE
- Publication number 20020174714
- Publication date Nov 28, 2002
- THOMAS MCWAID
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and system for detecting metal contamination on a semiconduc...
- Publication number 20020090746
- Publication date Jul 11, 2002
- Zhiwei Xu
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20010047682
- Publication date Dec 6, 2001
- Amin Samsavar
- B82 - NANO-TECHNOLOGY

Amin Samsavar

Person

Patents Grantslast 30 patents

Systems configured to perform a non-contact method for determining...

Contactless charge measurement of product wafers and control of cor...

Methods and systems for determining a property of an insulating film

System for sensing a sample

Contactless charge measurement of product wafers and control of cor...

Dual stage instrument for scanning a specimen

Methods and systems for determining a property of an insulating film

System for sensing a sample

Tank probe for measuring surface conductance

Method and system for detecting metal contamination on a semiconduc...

System for sensing a sample

Dual stage instrument for scanning a specimen

Optical profilometer combined with stylus probe measurement device

Dual stage instrument for scanning a specimen

System for locating a feature of a surface

Acoustic sensor as proximity detector

Patents Applicationslast 30 patents

System for Sensing a Sample

System for Sensing a Sample

System for sensing a sample

Dual stage instrument for scanning a specimen

System for sensing a sample

Dual stage instrument for scanning a specimen

System for sensing a sample

SYSTEM FOR SENSING A SAMPLE

Method and system for detecting metal contamination on a semiconduc...

Dual stage instrument for scanning a specimen