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Amit Kucheriya
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Edison, NJ, US
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Patents Grants
last 30 patents
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Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
Patent number
12,203,958
Issue date
Jan 21, 2025
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
Patent number
11,821,913
Issue date
Nov 21, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Automated validation and calibration portable test systems and methods
Patent number
10,701,571
Issue date
Jun 30, 2020
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Automated configurable portable test systems and methods
Patent number
10,681,570
Issue date
Jun 9, 2020
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Local portable test systems and methods
Patent number
10,548,033
Issue date
Jan 28, 2020
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Cloud-based services for management of cell-based test systems
Patent number
10,251,079
Issue date
Apr 2, 2019
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Device profile-driven automation for cell-based test systems
Patent number
10,158,552
Issue date
Dec 18, 2018
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Logistics of stress testing
Patent number
9,582,391
Issue date
Feb 28, 2017
w2bi, Inc.
Derek Diperna
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
Publication number
20240027492
Publication date
Jan 25, 2024
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
Publication number
20220137092
Publication date
May 5, 2022
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
DEVICE PROFILE-DRIVEN AUTOMATION FOR CELL-BASED TEST SYSTEMS
Publication number
20180048555
Publication date
Feb 15, 2018
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
AUTOMATED CONFIGURABLE PORTABLE TEST SYSTEMS AND METHODS
Publication number
20180049051
Publication date
Feb 15, 2018
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
LOCAL PORTABLE TEST SYSTEMS AND METHODS
Publication number
20180049052
Publication date
Feb 15, 2018
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
AUTOMATED VALIDATION AND CALIBRATION PORTABLE TEST SYSTEMS AND METHODS
Publication number
20180049050
Publication date
Feb 15, 2018
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
CLOUD-BASED SERVICES FOR MANAGEMENT OF CELL-BASED TEST SYSTEMS
Publication number
20180049054
Publication date
Feb 15, 2018
w2bi, Inc.
Dinesh Doshi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
LOGISTICS OF STRESS TESTING
Publication number
20130282334
Publication date
Oct 24, 2013
Derek Diperna
G06 - COMPUTING CALCULATING COUNTING