Amit Prabhakar Marathe

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reliability aware thermal design
- Patent number 9,495,491
- Issue date Nov 15, 2016
- Microsoft Technology Licensing, LLC
- Kingsuk Maitra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for non-destructive determination of dielectric b...
- Patent number 8,501,504
- Issue date Aug 6, 2013
- Advanced Micro Devices, Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric breakdown lifetime enhancement using alternating current...
- Patent number 8,022,716
- Issue date Sep 20, 2011
- GLOBALFOUNDRIES Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Grant
Composite barrier layers with controlled copper interface surface r...
- Patent number 7,755,194
- Issue date Jul 13, 2010
- Advanced Micro Devices, Inc.
- Amit Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit design system
- Patent number 7,451,411
- Issue date Nov 11, 2008
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quantifying and predicting the impact of line edge roughness on dev...
- Patent number 7,379,924
- Issue date May 27, 2008
- Advanced Micro Devices, Inc.
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining projected lifetime of semiconductor devices...
- Patent number 7,340,360
- Issue date Mar 4, 2008
- Advanced Micro Devices, Inc.
- John Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Extraction of tool independent line-edge-roughness (LER) measuremen...
- Patent number 7,310,155
- Issue date Dec 18, 2007
- Advanced Micro Devices, Inc.
- Luigi Capodieci
- G01 - MEASURING TESTING
Information Patent Grant
Use of Ta-capped metal line to improve formation of memory element...
- Patent number 7,288,782
- Issue date Oct 30, 2007
- Spansion LLC
- Steven C. Avanzino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination of device failure characteristic
- Patent number 7,155,359
- Issue date Dec 26, 2006
- Advanced Micro Devices, Inc.
- Hyeon-Seag Kim
- G01 - MEASURING TESTING
Information Patent Grant
Predicting EM reliability by decoupling extrinsic and intrinsic sigma
- Patent number 7,146,588
- Issue date Dec 5, 2006
- Advanced Micro Devices, Inc.
- Amit P. Marathe
- G01 - MEASURING TESTING
Information Patent Grant
Use of Ta-capped metal line to improve formation of memory element...
- Patent number 7,084,062
- Issue date Aug 1, 2006
- Advanced Micro Devices, Inc.
- Steven C. Avanzino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming composite barrier layers with controlled copper i...
- Patent number 7,033,940
- Issue date Apr 25, 2006
- Advanced Micro Devices, Inc.
- Amit Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor component and method for precluding stress-induced vo...
- Patent number 7,026,225
- Issue date Apr 11, 2006
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cu interconnects with composite barrier layers for wafer-to-wafer u...
- Patent number 6,952,052
- Issue date Oct 4, 2005
- Advanced Micro Devices, Inc.
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming conductor reservoir volume for integrated circui...
- Patent number 6,939,803
- Issue date Sep 6, 2005
- Advanced Micro Devices, Inc.
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for determining electromigration and interlayer diel...
- Patent number 6,897,476
- Issue date May 24, 2005
- Advanced Micro Devices, Inc.
- Hyeon-Seag Kim
- G01 - MEASURING TESTING
Information Patent Grant
System and method for current-enhanced stress-migration testing of...
- Patent number 6,867,056
- Issue date Mar 15, 2005
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- G01 - MEASURING TESTING
Information Patent Grant
Method of semiconductor via testing
- Patent number 6,858,511
- Issue date Feb 22, 2005
- Advanced Micro Devices, Inc.
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Maximum VCC calculation method for hot carrier qualification
- Patent number 6,856,160
- Issue date Feb 15, 2005
- Advanced Micro Devices, Inc.
- Hyeon-Seag Kim
- G01 - MEASURING TESTING
Information Patent Grant
Hot carrier oxide qualification method
- Patent number 6,825,684
- Issue date Nov 30, 2004
- Advanced Micro Devices, Inc.
- Hyeon-Seag Kim
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect test structure with slotted feeder lines to prevent st...
- Patent number 6,822,437
- Issue date Nov 23, 2004
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination of permeability of layer material within interconnect
- Patent number 6,822,473
- Issue date Nov 23, 2004
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for Joule heating characterization
- Patent number 6,770,847
- Issue date Aug 3, 2004
- Advanced Micro Devices, Inc.
- Huade W. Yao
- G01 - MEASURING TESTING
Information Patent Grant
Structure, system, and method for assessing electromigration permea...
- Patent number 6,762,597
- Issue date Jul 13, 2004
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- G01 - MEASURING TESTING
Information Patent Grant
Copper interconnect with improved barrier layer
- Patent number 6,727,592
- Issue date Apr 27, 2004
- Advanced Micro Devices, Inc.
- Christy Mei-Chu Woo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for assessing the reliability of interconnects
- Patent number 6,725,433
- Issue date Apr 20, 2004
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- G01 - MEASURING TESTING
Information Patent Grant
Use of an alloying element to form a stable oxide layer on the surf...
- Patent number 6,717,266
- Issue date Apr 6, 2004
- Advanced Micro Devices, Inc.
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology for an assessment of the degree of barrier permeability...
- Patent number 6,714,037
- Issue date Mar 30, 2004
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- G01 - MEASURING TESTING
Information Patent Grant
Coherent diffusion barriers for integrated circuit interconnects
- Patent number 6,710,452
- Issue date Mar 23, 2004
- Advanced Micro Devices, Inc.
- Pin-Chin Connie Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RELIABILITY AWARE THERMAL DESIGN
- Publication number 20150261901
- Publication date Sep 17, 2015
- Microsoft Corporation
- Kingsuk Maitra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIELECTRIC BREAKDOWN LIFETIME ENHANCEMENT USING ALTERNATING CURRENT...
- Publication number 20110018565
- Publication date Jan 27, 2011
- GLOBAL FOUNDRIES Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-destructive determination of dielectric b...
- Publication number 20100117676
- Publication date May 13, 2010
- Advanced Micro Devices, Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit design system
- Publication number 20070300200
- Publication date Dec 27, 2007
- Advanced Micro Devices, Inc.
- Christine Hau-Riege
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CU INTERCONNECTS WITH COMPOSITE BARRIER LAYERS FOR WAFER-TO-WAFER U...
- Publication number 20050224979
- Publication date Oct 13, 2005
- Advanced Micro Devices, Inc.
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for joule heating characterization
- Publication number 20040060916
- Publication date Apr 1, 2004
- Advanced Micro Devices, Inc.
- Huade W. Yao
- G01 - MEASURING TESTING
Information Patent Application
Method for improving electromigration performance of metallization...
- Publication number 20030217462
- Publication date Nov 27, 2003
- Fei Wang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for forming conductor reservoir volume for integrated circui...
- Publication number 20020195714
- Publication date Dec 26, 2002
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductor reservoir volume for integrated circuit interconnects
- Publication number 20020093057
- Publication date Jul 18, 2002
- Amit P. Marathe
- H01 - BASIC ELECTRIC ELEMENTS

Amit Prabhakar Marathe

Person

Patents Grantslast 30 patents

Reliability aware thermal design

Method and system for non-destructive determination of dielectric b...

Dielectric breakdown lifetime enhancement using alternating current...

Composite barrier layers with controlled copper interface surface r...

Integrated circuit design system

Quantifying and predicting the impact of line edge roughness on dev...

Method for determining projected lifetime of semiconductor devices...

Extraction of tool independent line-edge-roughness (LER) measuremen...

Use of Ta-capped metal line to improve formation of memory element...

Determination of device failure characteristic

Predicting EM reliability by decoupling extrinsic and intrinsic sigma

Use of Ta-capped metal line to improve formation of memory element...

Method of forming composite barrier layers with controlled copper i...

Semiconductor component and method for precluding stress-induced vo...

Cu interconnects with composite barrier layers for wafer-to-wafer u...

Method for forming conductor reservoir volume for integrated circui...

Test structure for determining electromigration and interlayer diel...

System and method for current-enhanced stress-migration testing of...

Method of semiconductor via testing

Maximum VCC calculation method for hot carrier qualification

Hot carrier oxide qualification method

Interconnect test structure with slotted feeder lines to prevent st...

Determination of permeability of layer material within interconnect

Method and system for Joule heating characterization

Structure, system, and method for assessing electromigration permea...

Copper interconnect with improved barrier layer

Method for assessing the reliability of interconnects

Use of an alloying element to form a stable oxide layer on the surf...

Methodology for an assessment of the degree of barrier permeability...

Coherent diffusion barriers for integrated circuit interconnects

Patents Applicationslast 30 patents

RELIABILITY AWARE THERMAL DESIGN

DIELECTRIC BREAKDOWN LIFETIME ENHANCEMENT USING ALTERNATING CURRENT...

Method and system for non-destructive determination of dielectric b...

Integrated circuit design system

CU INTERCONNECTS WITH COMPOSITE BARRIER LAYERS FOR WAFER-TO-WAFER U...

Method and system for joule heating characterization

Method for improving electromigration performance of metallization...

Method for forming conductor reservoir volume for integrated circui...

Conductor reservoir volume for integrated circuit interconnects