An-Hsiung Liu

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Tao-Yuan Hsien, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for semiconductor self-aligned patterning
- Patent number 9,318,412
- Issue date Apr 19, 2016
- Nanya Technology Corporation
- An Hsiung Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and fabrications thereof
- Patent number 8,053,370
- Issue date Nov 8, 2011
- Nanya Technology Corporation
- Wei-Tung Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device
- Patent number 7,803,701
- Issue date Sep 28, 2010
- Nanya Technology Corporation
- Shian-Jyh Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlay alignment mark and alignment method for the fabrication of...
- Patent number 7,723,181
- Issue date May 25, 2010
- Nanya Technology Corp.
- An-Hsiung Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment mark and alignment method for the fabrication of trench-c...
- Patent number 7,419,882
- Issue date Sep 2, 2008
- Nanya Technology Corp.
- Yuan-Hsun Wu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR SEMICONDUCTOR SELF-ALIGNED PATTERNING
- Publication number 20150028459
- Publication date Jan 29, 2015
- NANYA TECHNOLOGY CORPORATION
- AN HSIUNG LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE
- Publication number 20090068813
- Publication date Mar 12, 2009
- NANYA TECHNOLOGY CORPORATION
- Shian-Jyh Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND FABRICATIONS THEREOF
- Publication number 20080242100
- Publication date Oct 2, 2008
- NANYA TECHNOLOGY CORPORATION
- Wei-Tung Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY ALIGNMENT MARK AND ALIGNMENT METHOD FOR THE FABRICATION OF...
- Publication number 20070190736
- Publication date Aug 16, 2007
- An-Hsiung Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ALIGNMENT MARK AND ALIGNMENT METHOD FOR THE FABRICATION OF TRENCH-C...
- Publication number 20060234440
- Publication date Oct 19, 2006
- Yuan-Hsun WU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY