An-Kuo Yang

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HsinChu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Methods of determining quality of a light source
- Patent number RE47272
- Issue date Mar 5, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nan-Jung Chen
Information Patent Grant
Methods of determining quality of a light source
- Patent number RE47197
- Issue date Jan 8, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nan-Jung Chen
Information Patent Grant
Lithography scanner throughput
- Patent number 9,529,275
- Issue date Dec 27, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hsun Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of determining quality of a light source
- Patent number 8,184,896
- Issue date May 22, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nan-Jung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for forming semiconductor structures
- Patent number 7,787,977
- Issue date Aug 31, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chien-Hsun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of determining quality of a light source
- Patent number 7,738,692
- Issue date Jun 15, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nan-Jung Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF DETERMINING QUALITY OF A LIGHT SOURCE
- Publication number 20100214547
- Publication date Aug 26, 2010
- Taiwan Semiconductor Manufacturing Co., LTD
- Nan-Jung CHEN
- G01 - MEASURING TESTING
Information Patent Application
Lithography Scanner Throughput
- Publication number 20080198351
- Publication date Aug 21, 2008
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hsun Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEMS FOR FORMING SEMICONDUCTOR STRUCTURES
- Publication number 20080125902
- Publication date May 29, 2008
- Taiwan Semiconductor Manufacturing Co., LTD
- Chien-Hsun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF DETERMINING QUALITY OF A LIGHT SOURCE
- Publication number 20080019586
- Publication date Jan 24, 2008
- Taiwan Semiconductor Manufacturing Co., LTD
- Nan-Jung Chen
- G01 - MEASURING TESTING