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Andreas Adolf
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Aalen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Ion beam system and method of operating an ion beam system
Patent number
8,921,805
Issue date
Dec 30, 2014
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion beam system and method of operating ion beam system
Patent number
8,710,451
Issue date
Apr 29, 2014
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing a representation of an object by means of a pa...
Patent number
8,471,202
Issue date
Jun 25, 2013
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
HIGH THROUGHPUT MULTI-BEAM CHARGED PARTICLE INSPECTION SYSTEM WITH...
Publication number
20230043036
Publication date
Feb 9, 2023
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BEAM DIGITAL SCAN AND IMAGE ACQUISITION
Publication number
20220351936
Publication date
Nov 3, 2022
Carl Zeiss MultiSEM GmbH
Nicolas Kaufmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Beam System and Method of Operating an Ion Beam System
Publication number
20140197328
Publication date
Jul 17, 2014
CARL ZEISS MICROSCOPY GMBH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...
Publication number
20130270437
Publication date
Oct 17, 2013
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Beam System and Method of Operating Ion Beam System
Publication number
20120256098
Publication date
Oct 11, 2012
CARL ZEISS NTS GMBH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for producing a representation of an object by means of a pa...
Publication number
20110198497
Publication date
Aug 18, 2011
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS