Membership
Tour
Register
Log in
Andreas Logisch
Follow
Person
Munchen, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Circuit arrangement and method for driving electronic chips
Patent number
7,426,669
Issue date
Sep 16, 2008
Infineon Technologies AG
Björn Flach
G11 - INFORMATION STORAGE
Information
Patent Grant
Insertable calibration device
Patent number
7,414,421
Issue date
Aug 19, 2008
Infineon Technologies AG
Björn Flach
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor component, arrangement and method for characterizing...
Patent number
7,360,139
Issue date
Apr 15, 2008
Infineon Technologies AG
Andreas Logisch
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and magazine device for testing semiconductor devices
Patent number
6,777,924
Issue date
Aug 17, 2004
Infineon Technologies AG
Björn Flach
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus for testing devices under test and method for transm...
Patent number
6,759,854
Issue date
Jul 6, 2004
Infineon Technologies
Andreas Logisch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for testing a circuit unit and test apparatus
Publication number
20060181300
Publication date
Aug 17, 2006
Bjorn Flach
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor component, arrangement and method for characterizing...
Publication number
20060156149
Publication date
Jul 13, 2006
Andreas Logisch
G11 - INFORMATION STORAGE
Information
Patent Application
Insertable calibration device
Publication number
20060149491
Publication date
Jul 6, 2006
Infineon Technologies AG
Bjorn Flach
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for generating test signals
Publication number
20060026480
Publication date
Feb 2, 2006
Andreas Logisch
G01 - MEASURING TESTING
Information
Patent Application
Circuit arrangement and method for driving electronic chips
Publication number
20050138491
Publication date
Jun 23, 2005
Infineon Technologies AG
Bjorn Flach
G01 - MEASURING TESTING
Information
Patent Application
Test arrangement and method for selecting a test mode output channel
Publication number
20050055618
Publication date
Mar 10, 2005
Thomas Finteis
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and magazine device for testing semiconductor devices
Publication number
20030173950
Publication date
Sep 18, 2003
Bjorn Flach
G01 - MEASURING TESTING
Information
Patent Application
Test apparatus for testing devices under test and method for transm...
Publication number
20030030427
Publication date
Feb 13, 2003
Andreas Logisch
G01 - MEASURING TESTING