Andrej Rumiantsev

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 8,680,879
- Issue date Mar 25, 2014
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for on-wafer-measurement under EMI-shielding
- Patent number 8,344,744
- Issue date Jan 1, 2013
- Cascade Microtech, Inc.
- Axel Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 7,999,563
- Issue date Aug 16, 2011
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer having more...
- Patent number 7,768,271
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer
- Patent number 7,769,555
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20110291680
- Publication date Dec 1, 2011
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING
- Publication number 20110227602
- Publication date Sep 22, 2011
- CASCADE MICROTECH DRESDEN GMBH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS
- Publication number 20100106439
- Publication date Apr 29, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COM...
- Publication number 20090314051
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Victar KHUTKO
- G01 - MEASURING TESTING
Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20090315581
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Andrej RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
Process for Measuring the Impedance of Electronic Circuits
- Publication number 20080281537
- Publication date Nov 13, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING MEASUREMENT ERRORS IN SCATTERING PARAMETER M...
- Publication number 20080195344
- Publication date Aug 14, 2008
- SUSS MicroTec Test Systems GmbH
- Holger HEUERMANN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER
- Publication number 20080125999
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER HAVING MORE...
- Publication number 20080122451
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING

Andrej Rumiantsev

Person

Patents Grantslast 30 patents

Chuck for supporting and retaining a test substrate and a calibrati...

Probe station for on-wafer-measurement under EMI-shielding

Chuck for supporting and retaining a test substrate and a calibrati...

Method for calibration of a vectorial network analyzer having more...

Method for calibration of a vectorial network analyzer

Patents Applicationslast 30 patents

CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...

PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING

PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS

METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COM...

CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...

Process for Measuring the Impedance of Electronic Circuits

METHOD FOR DETERMINING MEASUREMENT ERRORS IN SCATTERING PARAMETER M...

METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER

METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER HAVING MORE...