Andrew BOWDLER

Person

Walsall, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometry apparatus
- Patent number 12,183,564
- Issue date Dec 31, 2024
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for producing mass spectrum data
- Patent number 8,791,408
- Issue date Jul 29, 2014
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TOF mass spectrometer for stigmatic imaging and associated method
- Patent number 8,212,209
- Issue date Jul 3, 2012
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for thermalization of ions
- Patent number 8,198,582
- Issue date Jun 12, 2012
- Kratos Analytical Limited
- Emmanuel Raptakis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion axial spatial distribution focusing
- Patent number 7,910,878
- Issue date Mar 22, 2011
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion selector
- Patent number 7,579,586
- Issue date Aug 25, 2009
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method
- Patent number 7,071,463
- Issue date Jul 4, 2006
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optics system for TOF mass spectrometer
- Patent number 7,041,970
- Issue date May 9, 2006
- Krates Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optics system for TOF mass spectrometer
- Patent number 6,888,129
- Issue date May 3, 2005
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method
- Patent number 6,717,134
- Issue date Apr 6, 2004
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20240213013
- Publication date Jun 27, 2024
- KRATOS ANALYTICAL LIMITED
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY APPARATUS
- Publication number 20220157590
- Publication date May 19, 2022
- KRATOS ANALYTICAL LIMITED
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUSES FOR PRODUCING MASS SPECTRUM DATA
- Publication number 20130119248
- Publication date May 16, 2013
- Kratos Analytical Limited
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOF MASS SPECTROMETER FOR STIGMATIC IMAGING AND ASSOCIATED METHOD
- Publication number 20110139973
- Publication date Jun 16, 2011
- Kratos Analytical Limited
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for thermalization of ions
- Publication number 20100270465
- Publication date Oct 28, 2010
- KRATOS ANALYTICAL LIMITED
- Emmanuel Raptakis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ION AXIAL SPATIAL DISTRIBUTION FOCUSING
- Publication number 20100065738
- Publication date Mar 18, 2010
- Kratos Analytical Limited
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion selector
- Publication number 20080230688
- Publication date Sep 25, 2008
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion optics system for TOF mass spectrometer
- Publication number 20040256549
- Publication date Dec 23, 2004
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Calibration method
- Publication number 20040024552
- Publication date Feb 5, 2004
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion optics system for TOF mass spectrometer
- Publication number 20020036262
- Publication date Mar 28, 2002
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Calibration method
- Publication number 20020033447
- Publication date Mar 21, 2002
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS

Andrew BOWDLER

Person

Patents Grantslast 30 patents

Mass spectrometry apparatus

Methods and apparatuses for producing mass spectrum data

TOF mass spectrometer for stigmatic imaging and associated method

Method and apparatus for thermalization of ions

Method and apparatus for ion axial spatial distribution focusing

Ion selector

Calibration method

Ion optics system for TOF mass spectrometer

Ion optics system for TOF mass spectrometer

Calibration method

Patents Applicationslast 30 patents

TIME OF FLIGHT MASS SPECTROMETER

MASS SPECTROMETRY APPARATUS

METHODS AND APPARATUSES FOR PRODUCING MASS SPECTRUM DATA

TOF MASS SPECTROMETER FOR STIGMATIC IMAGING AND ASSOCIATED METHOD

Method and apparatus for thermalization of ions

METHOD AND APPARATUS FOR ION AXIAL SPATIAL DISTRIBUTION FOCUSING

Ion selector

Ion optics system for TOF mass spectrometer

Calibration method

Ion optics system for TOF mass spectrometer

Calibration method