Andrew R. Schwartz

Person

Bethesda, MD, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for measurement of sidewall damage in etched diel...
- Patent number 7,362,108
- Issue date Apr 22, 2008
- Solid State Measurements, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measurement of dielectric constant of thin fi...
- Patent number 7,285,963
- Issue date Oct 23, 2007
- Solid State Measurements, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-contact measurement of microwave capacita...
- Patent number 7,102,363
- Issue date Sep 5, 2006
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Apertured probes for localized measurements of a material's complex...
- Patent number 6,959,481
- Issue date Nov 1, 2005
- Neocera, Inc.
- Robert L. Moreland
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-contact measurement of microwave capacita...
- Patent number 6,943,562
- Issue date Sep 13, 2005
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
System and method for quantitative measurements of a material's com...
- Patent number 6,856,140
- Issue date Feb 15, 2005
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Apertured probes for localized measurements of a material's...
- Patent number 6,680,617
- Issue date Jan 20, 2004
- Neocera, Inc.
- Robert L. Moreland
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for measurement of sidewall damage in etched diel...
- Publication number 20060087305
- Publication date Apr 27, 2006
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Method and system for measurement of dielectric constant of thin fi...
- Publication number 20050230619
- Publication date Oct 20, 2005
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-contact measurement of microwave capacita...
- Publication number 20050225333
- Publication date Oct 13, 2005
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-contact measurement of microwave capacita...
- Publication number 20040100279
- Publication date May 27, 2004
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
System and method for quantitative measurements of a material's com...
- Publication number 20040004484
- Publication date Jan 8, 2004
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Apertured probes for localized measurements of a material's complex...
- Publication number 20030155934
- Publication date Aug 21, 2003
- Robert L. Moreland
- G01 - MEASURING TESTING
Information Patent Application
Apertured probes for localized measurements of a material's complex...
- Publication number 20030030449
- Publication date Feb 13, 2003
- Robert L. Moreland
- B82 - NANO-TECHNOLOGY

Andrew R. Schwartz

Person

Patents Grantslast 30 patents

Method and system for measurement of sidewall damage in etched diel...

Method and system for measurement of dielectric constant of thin fi...

Method and system for non-contact measurement of microwave capacita...

Apertured probes for localized measurements of a material's complex...

Method and system for non-contact measurement of microwave capacita...

System and method for quantitative measurements of a material's com...

Apertured probes for localized measurements of a material&#x00027;s...

Patents Applicationslast 30 patents

Method and system for measurement of sidewall damage in etched diel...

Method and system for measurement of dielectric constant of thin fi...

Method and system for non-contact measurement of microwave capacita...

Method and system for non-contact measurement of microwave capacita...

System and method for quantitative measurements of a material's com...

Apertured probes for localized measurements of a material's complex...

Apertured probes for localized measurements of a material's complex...

Apertured probes for localized measurements of a material's...