Andrey Danilov

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Goteborg, SE

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Patents Grantslast 30 patents

Information Patent Grant
MEMS nanoindenter
- Patent number 7,654,159
- Issue date Feb 2, 2010
- Nanofactory Instruments AB
- Peter Enoksson
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device for electron microscope
- Patent number 7,363,802
- Issue date Apr 29, 2008
- Nanofactory Instruments AB
- Håkan Olin
- G01 - MEASURING TESTING
Information Patent Grant
Device for reducing the impact of distortions in a microscope
- Patent number 6,924,489
- Issue date Aug 2, 2005
- Nanofactory Instruments AB
- Håkan Olin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PROBING IN ELECTRON MICROSCOPES
- Publication number 20120138792
- Publication date Jun 7, 2012
- NANOFACTORY INSTRUMENTS AB
- Andrey Danilov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mems Nanoindenter
- Publication number 20080276727
- Publication date Nov 13, 2008
- NANOFACTORY INSTRUMENTS AB
- Peter Enoksson
- G01 - MEASURING TESTING
Information Patent Application
Measurement device for electron microscope
- Publication number 20050103996
- Publication date May 19, 2005
- Hakan Olin
- G01 - MEASURING TESTING
Information Patent Application
Device for reducing the impact of distortions in a microscope
- Publication number 20040195523
- Publication date Oct 7, 2004
- Hakan Olin
- B82 - NANO-TECHNOLOGY