Anil KUMAR

Person

Clifton Park, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrostatic discharge protection device
- Patent number 10,819,110
- Issue date Oct 27, 2020
- GLOBALFOUNDRIES Inc.
- Anil Kumar
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Parallel test structure
- Patent number 10,475,677
- Issue date Nov 12, 2019
- GLOBALFOUNDRIES Inc.
- Tian Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration devices for I/O driver circuits having switches biased...
- Patent number 10,333,497
- Issue date Jun 25, 2019
- GLOBALFOUNDRIES Inc.
- Anil Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ESD snapback based clamp for finFET
- Patent number 9,601,486
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Jagar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure having test device
- Patent number 9,500,703
- Issue date Nov 22, 2016
- GLOBALFOUNDRIES Inc.
- Anil Kumar
- G01 - MEASURING TESTING
Information Patent Grant
ESD snapback based clamp for finFET
- Patent number 9,349,718
- Issue date May 24, 2016
- GLOBALFOUNDRIES Inc.
- Jagar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planar semiconductor ESD device and method of making same
- Patent number 9,343,590
- Issue date May 17, 2016
- GLOBALFOUNDRIES Inc.
- Chien-Hsin Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for quantifying defects due to through silicon...
- Patent number 9,335,368
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- Luigi Pantisano
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High voltage protection circuit for non-tolerant integrated circuit
- Patent number 9,312,686
- Issue date Apr 12, 2016
- Advanced Micro Devices, Inc.
- Anil Kumar
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Cascode driver with gate oxide protection
- Patent number 7,701,263
- Issue date Apr 20, 2010
- GLOBALFOUNDRIES Inc.
- Anil Kumar
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
High-Performance LDMOS Structures
- Publication number 20240421225
- Publication date Dec 19, 2024
- MURATA MANUFACTURING CO., LTD.
- Jagar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backside Deep Trench Capacitor and Inductor Structures
- Publication number 20240213139
- Publication date Jun 27, 2024
- pSemi Corporation
- Shishir Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integration of Discrete Embeddable Capacitors on Integrated Circuit...
- Publication number 20240145447
- Publication date May 2, 2024
- pSemi Corporation
- Shishir Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION DEVICE
- Publication number 20190267801
- Publication date Aug 29, 2019
- GLOBALFOUNDRIES INC.
- Anil KUMAR
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
PARALLEL TEST STRUCTURE
- Publication number 20190067056
- Publication date Feb 28, 2019
- GLOBALFOUNDRIES INC.
- Tian Shen
- G01 - MEASURING TESTING
Information Patent Application
SHAPED CAVITY FOR EPITAXIAL SEMICONDUCTOR GROWTH
- Publication number 20190027370
- Publication date Jan 24, 2019
- GLOBALFOUNDRIES INC.
- George R. Mulfinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD SNAPBACK BASED CLAMP FOR FINFET
- Publication number 20160260701
- Publication date Sep 8, 2016
- GLOBALFOUNDRIES INC.
- Jagar SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR QUANTIFYING DEFECTS DUE TO THROUGH SILICON...
- Publication number 20160116526
- Publication date Apr 28, 2016
- GLOBAL FOUNDRIES Inc.
- Luigi PANTISANO
- G01 - MEASURING TESTING
Information Patent Application
NON-PLANAR ESD DEVICE FOR NON-PLANAR OUTPUT TRANSISTOR AND COMMON F...
- Publication number 20160064371
- Publication date Mar 3, 2016
- GLOBALFOUNDRIES INC.
- Jian-Hsing LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD SNAPBACK BASED CLAMP FOR FINFET
- Publication number 20160064372
- Publication date Mar 3, 2016
- GLOBALFOUNDRIES INC.
- Jagar SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE HAVING TEST DEVICE
- Publication number 20160054383
- Publication date Feb 25, 2016
- GLOBALFOUNDRIES INC.
- Anil KUMAR
- G01 - MEASURING TESTING
Information Patent Application
PLANAR SEMICONDUCTOR ESD DEVICE AND METHOD OF MAKING SAME
- Publication number 20160035906
- Publication date Feb 4, 2016
- GLOBALFOUNDRIES INC.
- Chien-Hsin LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE PROTECTION CIRCUIT FOR NON-TOLERANT INTEGRATED CIRCUIT
- Publication number 20130170078
- Publication date Jul 4, 2013
- Advanced Micro Devices, Inc.
- Anil Kumar
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Cascode Driver with Gate Oxide Protection
- Publication number 20090243665
- Publication date Oct 1, 2009
- Anil Kumar
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

Electrostatic discharge protection device

Parallel test structure

Calibration devices for I/O driver circuits having switches biased...

ESD snapback based clamp for finFET

Semiconductor structure having test device

ESD snapback based clamp for finFET

Planar semiconductor ESD device and method of making same

Method and apparatus for quantifying defects due to through silicon...

High voltage protection circuit for non-tolerant integrated circuit

Cascode driver with gate oxide protection

Patents Applicationslast 30 patents

High-Performance LDMOS Structures

Backside Deep Trench Capacitor and Inductor Structures

Integration of Discrete Embeddable Capacitors on Integrated Circuit...

ELECTROSTATIC DISCHARGE PROTECTION DEVICE

PARALLEL TEST STRUCTURE

SHAPED CAVITY FOR EPITAXIAL SEMICONDUCTOR GROWTH

ESD SNAPBACK BASED CLAMP FOR FINFET

METHOD AND APPARATUS FOR QUANTIFYING DEFECTS DUE TO THROUGH SILICON...

NON-PLANAR ESD DEVICE FOR NON-PLANAR OUTPUT TRANSISTOR AND COMMON F...

ESD SNAPBACK BASED CLAMP FOR FINFET

SEMICONDUCTOR STRUCTURE HAVING TEST DEVICE

PLANAR SEMICONDUCTOR ESD DEVICE AND METHOD OF MAKING SAME

HIGH VOLTAGE PROTECTION CIRCUIT FOR NON-TOLERANT INTEGRATED CIRCUIT

Cascode Driver with Gate Oxide Protection