Anthony Le

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Providing precise timing control within a standardized test instrum...
- Patent number 7,437,589
- Issue date Oct 14, 2008
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Circuit card synchronization within a standardized test instrumenta...
- Patent number 7,437,588
- Issue date Oct 14, 2008
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Providing precise timing control between multiple standardized test...
- Patent number 7,366,939
- Issue date Apr 29, 2008
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Event processing apparatus and method for high speed event based te...
- Patent number 7,171,602
- Issue date Jan 30, 2007
- Advantest Corp.
- Glen Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Event based IC test system
- Patent number 7,089,135
- Issue date Aug 8, 2006
- Advantest Corp.
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Grant
Event pipeline and summing method and apparatus for event based tes...
- Patent number 7,010,452
- Issue date Mar 7, 2006
- Advantest Corp.
- Glen Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Time shift circuit for functional and AC parametric test
- Patent number 6,934,896
- Issue date Aug 23, 2005
- Advantest Corp.
- Doug Larson
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method for system performance validation of automatic t...
- Patent number 6,804,620
- Issue date Oct 12, 2004
- Advantest Corporation
- Douglas Larson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for supporting and manipulating a testhead in an automati...
- Patent number 6,771,062
- Issue date Aug 3, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Grant
Locking apparatus and loadboard assembly
- Patent number 6,747,447
- Issue date Jun 8, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Grant
Test head Hifix for semiconductor device testing apparatus
- Patent number 6,710,590
- Issue date Mar 23, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for successively generating an event to establ...
- Patent number 6,668,331
- Issue date Dec 23, 2003
- Advantest Corp.
- Glen A. Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Scan vector support for event based test system
- Patent number 6,594,609
- Issue date Jul 15, 2003
- Advantest, Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Data failure memory compaction for semiconductor test system
- Patent number 6,578,169
- Issue date Jun 10, 2003
- Advantest Corp.
- Anthony Le
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple end of test signal for event based test system
- Patent number 6,404,218
- Issue date Jun 11, 2002
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Glitch detection for semiconductor test system
- Patent number 6,377,065
- Issue date Apr 23, 2002
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Event based test system data memory compression
- Patent number 6,226,765
- Issue date May 1, 2001
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Providing precise timing control between multiple standardized test...
- Publication number 20070168766
- Publication date Jul 19, 2007
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Application
Circuit card synchronization within a standardized test instrumenta...
- Publication number 20070040564
- Publication date Feb 22, 2007
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Application
Providing precise timing control within a standardized test instrum...
- Publication number 20070043990
- Publication date Feb 22, 2007
- Advantest Corporation
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD FOR SYSTEM PERFORMANCE VALIDATION OF AUTOMATIC T...
- Publication number 20040186675
- Publication date Sep 23, 2004
- ADVANTEST CORPORATION
- Douglas Larson
- G01 - MEASURING TESTING
Information Patent Application
Event pipeline and summing method and apparatus for event based tes...
- Publication number 20040107058
- Publication date Jun 3, 2004
- Glen Gomes
- G01 - MEASURING TESTING
Information Patent Application
Locking apparatus and loadboard assembly
- Publication number 20040056675
- Publication date Mar 25, 2004
- ADVANTEST CORPORATION
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Application
Event processing apparatus and method for high speed event based te...
- Publication number 20030229473
- Publication date Dec 11, 2003
- Glen Gomes
- G01 - MEASURING TESTING
Information Patent Application
Event based IC test system
- Publication number 20030217345
- Publication date Nov 20, 2003
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Application
Time shift circuit for functional and AC parametric test
- Publication number 20030126530
- Publication date Jul 3, 2003
- Doug Larson
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Providing precise timing control within a standardized test instrum...

Circuit card synchronization within a standardized test instrumenta...

Providing precise timing control between multiple standardized test...

Event processing apparatus and method for high speed event based te...

Event based IC test system

Event pipeline and summing method and apparatus for event based tes...

Time shift circuit for functional and AC parametric test

Calibration method for system performance validation of automatic t...

Apparatus for supporting and manipulating a testhead in an automati...

Locking apparatus and loadboard assembly

Test head Hifix for semiconductor device testing apparatus

Apparatus and method for successively generating an event to establ...

Scan vector support for event based test system

Data failure memory compaction for semiconductor test system

Multiple end of test signal for event based test system

Glitch detection for semiconductor test system

Event based test system data memory compression

Patents Applicationslast 30 patents

Providing precise timing control between multiple standardized test...

Circuit card synchronization within a standardized test instrumenta...

Providing precise timing control within a standardized test instrum...

CALIBRATION METHOD FOR SYSTEM PERFORMANCE VALIDATION OF AUTOMATIC T...

Event pipeline and summing method and apparatus for event based tes...

Locking apparatus and loadboard assembly

Event processing apparatus and method for high speed event based te...

Event based IC test system

Time shift circuit for functional and AC parametric test