Anthony Lord

Person

Banbury, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of producing augmented probe system images and associated p...
- Patent number 11,821,912
- Issue date Nov 21, 2023
- FormFactor, Inc.
- Anthony James Lord
- G01 - MEASURING TESTING
Information Patent Grant
Microscopes with objective assembly crash detection and methods of...
- Patent number 11,454,799
- Issue date Sep 27, 2022
- FormFactor, Inc.
- Gerald Lee Gisler
- G02 - OPTICS
Information Patent Grant
Probe systems for testing a device under test
- Patent number 10,698,002
- Issue date Jun 30, 2020
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,876,115
- Issue date Jan 25, 2011
- Cascade Microtech, Inc.
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,492,172
- Issue date Feb 17, 2009
- Cascade Microtech, Inc.
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with two platens
- Patent number 7,368,925
- Issue date May 6, 2008
- Cascade Microtech, Inc.
- Peter Navratil
- G01 - MEASURING TESTING
Information Patent Grant
Probe station
- Patent number 6,777,964
- Issue date Aug 17, 2004
- Cascade Microtech, Inc.
- Peter Navratil
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF PRODUCING AUGMENTED PROBE SYSTEM IMAGES AND ASSOCIATED P...
- Publication number 20210373073
- Publication date Dec 2, 2021
- FormFactor, Inc.
- Anthony James Lord
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPES WITH OBJECTIVE ASSEMBLY CRASH DETECTION AND METHODS OF...
- Publication number 20200241278
- Publication date Jul 30, 2020
- FormFactor Beaverton, Inc.
- Gerald Lee Gisler
- G02 - OPTICS
Information Patent Application
PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST
- Publication number 20190101567
- Publication date Apr 4, 2019
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chuck for holding a device under test
- Publication number 20090153167
- Publication date Jun 18, 2009
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20080042675
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Peter Navratil
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20050156610
- Publication date Jul 21, 2005
- Peter Navratil
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20040232935
- Publication date Nov 25, 2004
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20030141861
- Publication date Jul 31, 2003
- Peter Navratil
- G01 - MEASURING TESTING

Anthony Lord

Person

Patents Grantslast 30 patents

Methods of producing augmented probe system images and associated p...

Microscopes with objective assembly crash detection and methods of...

Probe systems for testing a device under test

Chuck for holding a device under test

Chuck for holding a device under test

Probe station with two platens

Probe station

Patents Applicationslast 30 patents

METHODS OF PRODUCING AUGMENTED PROBE SYSTEM IMAGES AND ASSOCIATED P...

MICROSCOPES WITH OBJECTIVE ASSEMBLY CRASH DETECTION AND METHODS OF...

PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST

Chuck for holding a device under test

Probe station

Probe station

Chuck for holding a device under test

Probe station