Antonio Orozco

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Washington, DC, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for localization of open defects in electronic de...
- Patent number 9,529,035
- Issue date Dec 27, 2016
- Neocera, LLC
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Grant
DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz...
- Patent number 9,476,951
- Issue date Oct 25, 2016
- Neocera, LLC
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Grant
Fault isolation of circuit defects using comparative magnetic field...
- Patent number 7,019,521
- Issue date Mar 28, 2006
- Neocera, Inc.
- Antonio Orozco
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR LOCALIZATION OF OPEN DEFECTS IN ELECTRONIC DE...
- Publication number 20140253111
- Publication date Sep 11, 2014
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Application
DC SQUID BASED RF MAGNETOMETER OPERATING AT A BANDWIDTH OF 200 MHZ...
- Publication number 20140249033
- Publication date Sep 4, 2014
- NEOCERA, LLC
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Application
Fault isolation of circuit defects using comparative magnetic field...
- Publication number 20050057246
- Publication date Mar 17, 2005
- Antonio Orozco
- G01 - MEASURING TESTING