Aritoshi Sugimoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fuel battery cell, fuel battery system, leak detection method
- Patent number 11,855,318
- Issue date Dec 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Munenori Degawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuel cell
- Patent number 11,417,892
- Issue date Aug 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Noriyuki Sakuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,957,579
- Issue date Jun 7, 2011
- Hitachi, Ltd.
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,952,074
- Issue date May 31, 2011
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,894,658
- Issue date Feb 22, 2011
- Hitachi, Ltd.
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,457,453
- Issue date Nov 25, 2008
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,417,444
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 7,301,146
- Issue date Nov 27, 2007
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,266,235
- Issue date Sep 4, 2007
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspecting a pattern
- Patent number 7,260,256
- Issue date Aug 21, 2007
- Renesas Technology Corporation
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,133,550
- Issue date Nov 7, 2006
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 7,122,796
- Issue date Oct 17, 2006
- Hitachi Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,026,830
- Issue date Apr 11, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting defects of devices and method of inspectin...
- Patent number 6,970,004
- Issue date Nov 29, 2005
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 6,960,765
- Issue date Nov 1, 2005
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for test conditions
- Patent number 6,895,346
- Issue date May 17, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Photomask for test wafers
- Patent number 6,841,405
- Issue date Jan 11, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 6,828,554
- Issue date Dec 7, 2004
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing electronic devices
- Patent number 6,780,660
- Issue date Aug 24, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices indicating short-circuit
- Patent number 6,771,077
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices
- Patent number 6,770,496
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Identification method for an article using crystal defects
- Patent number 6,760,472
- Issue date Jul 6, 2004
- Hitachi, Ltd.
- Kazuo Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for detecting defect in device and method of detecting de...
- Patent number 6,734,687
- Issue date May 11, 2004
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 6,717,142
- Issue date Apr 6, 2004
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting circuit pattern and inspecting instrument
- Patent number 6,703,850
- Issue date Mar 9, 2004
- Hitachi, Ltd.
- Mari Nozoe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method of inspecting circuit pattern and inspecting instrument
- Patent number 6,583,634
- Issue date Jun 24, 2003
- Hitachi, Ltd.
- Mari Nozoe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor integrated circuit device and process for manufacturi...
- Patent number 6,573,546
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Kiyonori Ohyu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,559,663
- Issue date May 6, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a pattern on a substrate
- Patent number 6,376,854
- Issue date Apr 23, 2002
- Hitachi, Ltd.
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 6,373,054
- Issue date Apr 16, 2002
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FUEL BATTERY CELL AND MANUFACTURING METHOD THEREFOR
- Publication number 20240120520
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yoshitaka SASAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuel Cell and Method for Producing Same
- Publication number 20230127271
- Publication date Apr 27, 2023
- Hitachi High-Tech Corporation
- Yoshitaka SASAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuel Cell and Method for Producing Fuel Cell
- Publication number 20230006233
- Publication date Jan 5, 2023
- Hitachi High-Tech Corporation
- Noriyuki SAKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuel Battery Cell and Method for Manufacturing Fuel Battery Cell
- Publication number 20220399558
- Publication date Dec 15, 2022
- Hitachi High-Tech Corporation
- Noriyuki SAKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuel Cell, Fuel Cell System and Method for Producing Fuel Cell
- Publication number 20220393215
- Publication date Dec 8, 2022
- Hitachi High-Tech Corporation
- Yoshitaka SASAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuel Cell Array and Fuel Cell Inspection Method
- Publication number 20220384835
- Publication date Dec 1, 2022
- Hitachi High-Tech Corporation
- Yoshitaka SASAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUEL BATTERY CELL, FUEL BATTERY SYSTEM, LEAK DETECTION METHOD
- Publication number 20220181658
- Publication date Jun 9, 2022
- HITACHI HIGH-TECH CORPORATION
- Munenori DEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUEL BATTERY CELL AND FUEL BATTERY MODULE
- Publication number 20220069327
- Publication date Mar 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshitaka SASAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuel Cell
- Publication number 20210408556
- Publication date Dec 30, 2021
- Hitachi High-Tech Corporation
- Noriyuki SAKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Inspection Method And Apparatus
- Publication number 20100246933
- Publication date Sep 30, 2010
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN
- Publication number 20080302964
- Publication date Dec 11, 2008
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Pattern Inspection Method And Apparatus
- Publication number 20080063257
- Publication date Mar 13, 2008
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Inspection Method And Apparatus
- Publication number 20080056559
- Publication date Mar 6, 2008
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND APPARATUS
- Publication number 20070269101
- Publication date Nov 22, 2007
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of fabrication of semiconductor integrated circuit device an...
- Publication number 20060110667
- Publication date May 25, 2006
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20060043982
- Publication date Mar 2, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20050269511
- Publication date Dec 8, 2005
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Electron beam inspection method and apparatus and semiconductor man...
- Publication number 20050082476
- Publication date Apr 21, 2005
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Information media using information of defect in an article
- Publication number 20050041836
- Publication date Feb 24, 2005
- Hitachi, Ltd.
- Kazuo Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for inspecting defects of devices and method of inspectin...
- Publication number 20040178811
- Publication date Sep 16, 2004
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Electron beam inspection method and apparatus and semiconductor man...
- Publication number 20040164244
- Publication date Aug 26, 2004
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of inspecting circuit pattern and inspecting instrument
- Publication number 20030206027
- Publication date Nov 6, 2003
- Hitachi, Ltd.
- Mari Nozoe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Method of testing electronic devices
- Publication number 20030197523
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method for test conditions
- Publication number 20030199110
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing electronic devices
- Publication number 20030199107
- Publication date Oct 23, 2003
- Hitachi, Ltd
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
System for testing electronic devices
- Publication number 20030199111
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Photomask for test wafers
- Publication number 20030197522
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20030184332
- Publication date Oct 2, 2003
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20030169060
- Publication date Sep 11, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Electron beam inspection method and apparatus and semiconductor man...
- Publication number 20020100872
- Publication date Aug 1, 2002
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS

Aritoshi Sugimoto

Person

Patents Grantslast 30 patents

Fuel battery cell, fuel battery system, leak detection method

Fuel cell

Pattern inspection method and apparatus

Method and apparatus for inspecting integrated circuit pattern

Pattern inspection method and apparatus

Pattern inspection method and apparatus

Method and apparatus for inspecting integrated circuit pattern

Probe driving method, and probe apparatus

Pattern inspection method and apparatus

Method and system for inspecting a pattern

Pattern inspection method and apparatus

Electron beam inspection method and apparatus and semiconductor man...

Method and apparatus for inspecting integrated circuit pattern

Apparatus for inspecting defects of devices and method of inspectin...

Probe driving method, and probe apparatus

Method for test conditions

Photomask for test wafers

Electron beam inspection method and apparatus and semiconductor man...

System for testing electronic devices

Method of testing electronic devices indicating short-circuit

Method of testing electronic devices

Identification method for an article using crystal defects

Apparatus for detecting defect in device and method of detecting de...

Electron beam inspection method and apparatus and semiconductor man...

Method of inspecting circuit pattern and inspecting instrument

Method of inspecting circuit pattern and inspecting instrument

Semiconductor integrated circuit device and process for manufacturi...

Method and apparatus for inspecting integrated circuit pattern

Method of inspecting a pattern on a substrate

Electron beam inspection method and apparatus and semiconductor man...

Patents Applicationslast 30 patents

FUEL BATTERY CELL AND MANUFACTURING METHOD THEREFOR

Fuel Cell and Method for Producing Same

Fuel Cell and Method for Producing Fuel Cell

Fuel Battery Cell and Method for Manufacturing Fuel Battery Cell

Fuel Cell, Fuel Cell System and Method for Producing Fuel Cell

Fuel Cell Array and Fuel Cell Inspection Method

FUEL BATTERY CELL, FUEL BATTERY SYSTEM, LEAK DETECTION METHOD

FUEL BATTERY CELL AND FUEL BATTERY MODULE

Fuel Cell

Pattern Inspection Method And Apparatus

METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN

Pattern Inspection Method And Apparatus

Pattern Inspection Method And Apparatus

PATTERN INSPECTION METHOD AND APPARATUS

Method of fabrication of semiconductor integrated circuit device an...

Method and apparatus for inspecting integrated circuit pattern

Probe driving method, and probe apparatus

Electron beam inspection method and apparatus and semiconductor man...

Information media using information of defect in an article

Apparatus for inspecting defects of devices and method of inspectin...

Electron beam inspection method and apparatus and semiconductor man...

Method of inspecting circuit pattern and inspecting instrument

Method of testing electronic devices

Method for test conditions

Method of manufacturing electronic devices

System for testing electronic devices

Photomask for test wafers

Probe driving method, and probe apparatus

Method and apparatus for inspecting integrated circuit pattern

Electron beam inspection method and apparatus and semiconductor man...