Armagan Akar

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Field triage of EOS failures in semiconductor devices
- Patent number 9,939,488
- Issue date Apr 10, 2018
- Teseda Corporation
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Grant
Suspect logical region synthesis from device design and test inform...
- Patent number 9,659,136
- Issue date May 23, 2017
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Correlation of device manufacturing defect data with device electri...
- Patent number 8,918,753
- Issue date Dec 23, 2014
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Correlation of device manufacturing defect data with device electri...
- Patent number 8,539,389
- Issue date Sep 17, 2013
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Suspect logical region synthesis and simulation using device design...
- Patent number 8,453,088
- Issue date May 28, 2013
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for setting pin driver/sensor reference voltage level
- Patent number 5,235,273
- Issue date Aug 10, 1993
- Schlumberger Technologies, Inc.
- Armagan A. Akar
- G01 - MEASURING TESTING
Information Patent Grant
Modular board test system having wireless receiver
- Patent number 5,216,361
- Issue date Jun 1, 1993
- Schlumberger Technologies, Inc.
- Armagan A. Akar
- G01 - MEASURING TESTING
Information Patent Grant
Pin driver for in-circuit test apparatus
- Patent number 5,146,159
- Issue date Sep 8, 1992
- Schlumberger Technologies, Inc.
- Jack Lau
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FIELD TRIAGE OF EOS FAILURES IN SEMICONDUCTOR DEVICES
- Publication number 20150149106
- Publication date May 28, 2015
- TESEDA CORPORATION
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Application
Correlation of Device Manufacturing Defect Data with Device Electri...
- Publication number 20140115551
- Publication date Apr 24, 2014
- TESEDA CORPORATION
- Armagan Akar
- G01 - MEASURING TESTING
Information Patent Application
SUSPECT LOGICAL REGION SYNTHESIS FROM DEVICE DESIGN AND TEST INFORM...
- Publication number 20120079439
- Publication date Mar 29, 2012
- TESEDA CORPORATION
- Armagan Akar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUSPECT LOGICAL REGION SYNTHESIS AND SIMULATION USING DEVICE DESIGN...
- Publication number 20120079440
- Publication date Mar 29, 2012
- TESEDA CORPORATION
- Armagan Akar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRELATION OF DEVICE MANUFACTURING DEFECT DATA WITH DEVICE ELECTRI...
- Publication number 20120079442
- Publication date Mar 29, 2012
- TESEDA CORPORATION
- Armagan Akar
- G06 - COMPUTING CALCULATING COUNTING

Armagan Akar

Person

Patents Grantslast 30 patents

Field triage of EOS failures in semiconductor devices

Suspect logical region synthesis from device design and test inform...

Correlation of device manufacturing defect data with device electri...

Correlation of device manufacturing defect data with device electri...

Suspect logical region synthesis and simulation using device design...

Apparatus for setting pin driver/sensor reference voltage level

Modular board test system having wireless receiver

Pin driver for in-circuit test apparatus

Patents Applicationslast 30 patents

FIELD TRIAGE OF EOS FAILURES IN SEMICONDUCTOR DEVICES

Correlation of Device Manufacturing Defect Data with Device Electri...

SUSPECT LOGICAL REGION SYNTHESIS FROM DEVICE DESIGN AND TEST INFORM...

SUSPECT LOGICAL REGION SYNTHESIS AND SIMULATION USING DEVICE DESIGN...

CORRELATION OF DEVICE MANUFACTURING DEFECT DATA WITH DEVICE ELECTRI...