Armin Fischer

Person

Muenchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with pads connected by an under-bump metallizati...
- Patent number 8,487,453
- Issue date Jul 16, 2013
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting stress migration properties
- Patent number 8,323,991
- Issue date Dec 4, 2012
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MIM capacitors in semiconductor components
- Patent number 8,314,452
- Issue date Nov 20, 2012
- Infineon Technologies AG
- Philipp Riess
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for detecting stress migration properties
- Patent number 8,211,720
- Issue date Jul 3, 2012
- Infineon Technologies AG
- Armin Fischer
Information Patent Grant
MIM capacitors in semiconductor components
- Patent number 8,101,495
- Issue date Jan 24, 2012
- Infineon Technologies AG
- Philipp Riess
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of forming metal ion transistor
- Patent number 7,998,828
- Issue date Aug 16, 2011
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with additional mini-pads connected by an under-...
- Patent number 7,919,363
- Issue date Apr 5, 2011
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for detecting stress migration properties
- Patent number 7,888,672
- Issue date Feb 15, 2011
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal ion transistor
- Patent number 7,859,025
- Issue date Dec 28, 2010
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Set of integrated capacitor arrangements, especially integrated gri...
- Patent number RE41684
- Issue date Sep 14, 2010
- Infineon Technologies AG
- Armin Fischer
- 361 - Electricity: electrical systems and devices
Information Patent Grant
Method for producing a grid cap with a locally increased dielectric...
- Patent number 7,482,288
- Issue date Jan 27, 2009
- Infineon Technologies AG
- Sabine Penka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated test circuit arrangement and test method
- Patent number 7,327,152
- Issue date Feb 5, 2008
- Infineon Technologies, AG
- Armin Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit arrangement with intermediate materials and asso...
- Patent number 7,315,998
- Issue date Jan 1, 2008
- Infineon Technologies AG
- Armin Fischer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Set of integrated capacitor arrangements, especially integrated gri...
- Patent number 7,079,375
- Issue date Jul 18, 2006
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having a thermally shielded electric resistor trace
- Patent number 6,940,720
- Issue date Sep 6, 2005
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FUSES AND FUSE PROGRAMMING METHODS
- Publication number 20150228436
- Publication date Aug 13, 2015
- INFINEON TECHNOLOGIES AG
- Franz Ungar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIM Capacitors in Semiconductor Components
- Publication number 20120091560
- Publication date Apr 19, 2012
- Infineon Techonlogies AG
- Philipp Riess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with Pads Connected by an Under-Bump Metallizati...
- Publication number 20110140236
- Publication date Jun 16, 2011
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR DETECTING STRESS MIGRATION PROPERTIES
- Publication number 20110097826
- Publication date Apr 28, 2011
- INFINEON TECHNOLOGIES AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING METAL ION TRANSISTOR
- Publication number 20100184280
- Publication date Jul 22, 2010
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIM Capacitors in Semiconductor Components
- Publication number 20090230507
- Publication date Sep 17, 2009
- Philipp Riess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL ION TRANSISTOR AND RELATED METHODS
- Publication number 20090146242
- Publication date Jun 11, 2009
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAMMABLE RESISTOR, SWITCH OR VERTICAL MEMORY CELL
- Publication number 20080173975
- Publication date Jul 24, 2008
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing a grid cap with a locally increased dielectric...
- Publication number 20070145544
- Publication date Jun 28, 2007
- Sabine Penka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit with additional mini-pads connected by an under-...
- Publication number 20060258140
- Publication date Nov 16, 2006
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Set of integrated capacitor arrangements, especially integrated gri...
- Publication number 20060097580
- Publication date May 11, 2006
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated test circuit arrangement and test method
- Publication number 20050274989
- Publication date Dec 15, 2005
- Armin Fischer
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit comprising intermediate materials and correspond...
- Publication number 20050275103
- Publication date Dec 15, 2005
- Armin Fischer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device and method for detecting stress migration properties
- Publication number 20050211980
- Publication date Sep 29, 2005
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit having a thermally shielded electric resistor trace
- Publication number 20040011510
- Publication date Jan 22, 2004
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS

Armin Fischer

Person

Patents Grantslast 30 patents

Integrated circuit with pads connected by an under-bump metallizati...

Method for detecting stress migration properties

MIM capacitors in semiconductor components

Method for detecting stress migration properties

MIM capacitors in semiconductor components

Method of forming metal ion transistor

Integrated circuit with additional mini-pads connected by an under-...

Device for detecting stress migration properties

Metal ion transistor

Set of integrated capacitor arrangements, especially integrated gri...

Method for producing a grid cap with a locally increased dielectric...

Integrated test circuit arrangement and test method

Integrated circuit arrangement with intermediate materials and asso...

Set of integrated capacitor arrangements, especially integrated gri...

Integrated circuit having a thermally shielded electric resistor trace

Patents Applicationslast 30 patents

FUSES AND FUSE PROGRAMMING METHODS

MIM Capacitors in Semiconductor Components

Integrated Circuit with Pads Connected by an Under-Bump Metallizati...

DEVICE AND METHOD FOR DETECTING STRESS MIGRATION PROPERTIES

METHOD OF FORMING METAL ION TRANSISTOR

MIM Capacitors in Semiconductor Components

METAL ION TRANSISTOR AND RELATED METHODS

PROGRAMMABLE RESISTOR, SWITCH OR VERTICAL MEMORY CELL

Method for producing a grid cap with a locally increased dielectric...

Integrated circuit with additional mini-pads connected by an under-...

Set of integrated capacitor arrangements, especially integrated gri...

Integrated test circuit arrangement and test method

Integrated circuit comprising intermediate materials and correspond...

Device and method for detecting stress migration properties

Integrated circuit having a thermally shielded electric resistor trace