Arne Meyer

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Hamburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Qualification process for cryo-electron microscopy samples as well...
- Patent number 11,609,171
- Issue date Mar 21, 2023
- Xtal Concepts GmbH
- Annette Eckhardt
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for monitoring crystallization
- Patent number 9,284,659
- Issue date Mar 15, 2016
- Xtal Concepts GmbH
- Christian Betzel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
QUALIFICATION PROCESS FOR CRYO-ELECTRON MICROSCOPY SAMPLES AS WELL...
- Publication number 20200363345
- Publication date Nov 19, 2020
- Xtal Concepts GmbH
- Annette Eckhardt
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MONITORING CRYSTALLIZATION
- Publication number 20130139749
- Publication date Jun 6, 2013
- UNIVERSITAET HAMBURG
- Christian Betzel
- C30 - CRYSTAL GROWTH