Arthur Evans

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Brookfield Center, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,163,162
- Issue date Dec 19, 2000
- Wentworth Laboratories, Inc.
- William F. Thiessen
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly for testing integrated circuit devices
- Patent number 5,355,079
- Issue date Oct 11, 1994
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Test probe assembly for testing integrated circuit devices
- Patent number 4,975,638
- Issue date Dec 4, 1990
- Wentworth Laboratories
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Multi-level test probe assembly for IC chips
- Patent number 4,719,417
- Issue date Jan 12, 1988
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Test probe assembly for IC chips
- Patent number 4,599,559
- Issue date Jul 8, 1986
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Probes for fixed point probe cards
- Patent number 4,382,228
- Issue date May 3, 1983
- Wentworth Laboratories Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Assembly fixture for fixed point probe card
- Patent number 3,930,809
- Issue date Jan 6, 1976
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING