Claims
- 1. A fixture for assembling a probe card adapted to test an integrated circuit pattern formed on a substrate, said card including a board having an opening providing access to said pattern and surrounded by an array of conductive pads and probes cantilevered from the pads, each probe being constituted by a needle-holding blade disposed in the vertical plane at a position slightly raised above its associated pad and having a needle extending therefrom to engage a contact on the pattern; said fixture comprising:
- A. a chuck for holding said integrated circuit substrate to present the pattern thereof;
- B. a platform for supporting said probe card board at a position in which the opening of the board is aligned with the chuck,
- C. means for shifting said platform in the X and Y directions to orient said array of pads surrounding the board opening relative to the presented pattern,
- D. an arm for gripping the blade of a probe to be assembled to hold the blade in the vertical plane, and
- E. means to shift said arm in the X, Y and Z directions to align said blade at a raised position with respect to a selected pad and to align the point of the needle extending from the blade with a contact on said pattern, whereby when the blade is properly oriented it may be soldered to said pad.
- 2. A fixture as set forth in claim 1, further including means to adjust the position of said chuck in the theta and Z directions to present said substrate.
- 3. A fixture as set forth in claim 1, wherein said gripping arm is constituted by a pair of jaws which are relieved to define two pairs of opposing teeth which grip the holder at spaced positions to prevent bending thereof without a heat sink effect that inhibits a soldering operation.
- 4. A fixture as set forth in claim 1, further including a microscope trained on said chuck to facilitate the alignment operations.
- 5. A fixture as set forth in claim 4, further including a continuity tester to determine where the needle makes electrical and physical connection with a selected contact on said pattern, said tester including a power source connected in series with a light indicator to said arm for gripping the needle-holder, said arm being electrically insulated from said fixture whereby a circuit to said indicator is completed only when said needle makes said connection.
- 6. A fixture as set forth in claim 5, wherein said indicator is mounted below said microscope whereby one looking through the microscope sees said light when the circuit is completed.
RELATED APPLICATION
This application is a division of the copending application of Evans, Ser. No. 390,184, filed Aug. 21, 1973, now U.S. Pat. No. 3,849,728, entitled Fixed Point Probe Card and Assembly and Repair Fixture Therefor.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
3445770 |
Harmon |
May 1969 |
|
3738560 |
Kulicke, Jr. et al. |
Jun 1973 |
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Divisions (1)
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Number |
Date |
Country |
Parent |
390184 |
Aug 1973 |
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