Artur G. Olszak

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wavelength shifting in spectrally-controlled interferometry
- Patent number 10,816,408
- Issue date Oct 27, 2020
- APRE INSTRUMENTS, LLC
- Chase Salsbury
- G01 - MEASURING TESTING
Information Patent Grant
Radius-of-curvature measurement by spectrally-controlled interferom...
- Patent number 10,746,537
- Issue date Aug 18, 2020
- APRE INSTRUMENTS, INC.
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Measuring the position of objects in space
- Patent number 10,473,451
- Issue date Nov 12, 2019
- APRE INSTRUMENTS, INC.
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Optical alignment based on spectrally-controlled interferometry
- Patent number 10,422,700
- Issue date Sep 24, 2019
- APRE INSTRUMENTS, INC.
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Time-multiplexed spectrally controlled interferometry
- Patent number 9,696,211
- Issue date Jul 4, 2017
- Artur Olszak
- G02 - OPTICS
Information Patent Grant
Heterodyne spectrally controlled interferometry
- Patent number 9,618,320
- Issue date Apr 11, 2017
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Time-multiplexed spectrally controlled interferometry
- Patent number 9,581,428
- Issue date Feb 28, 2017
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric non-contact optical probe and measurement
- Patent number 9,581,437
- Issue date Feb 28, 2017
- APRE INSTRUMENTS, LLC
- Robert Smythe
- G01 - MEASURING TESTING
Information Patent Grant
Light sources for spectrally controlled interferometry
- Patent number 8,810,884
- Issue date Aug 19, 2014
- Artur Olszak
- G02 - OPTICS
Information Patent Grant
Optical coherence tomography using spectrally controlled interferom...
- Patent number 8,675,205
- Issue date Mar 18, 2014
- Artur G. Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Spectrally controllable light sources in interferometry
- Patent number 8,422,026
- Issue date Apr 16, 2013
- Artur G. Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Large-area imaging by concatenation with array microscope
- Patent number 7,864,369
- Issue date Jan 4, 2011
- Dmetrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Grant
Multi-spectral whole-slide scanner
- Patent number 7,864,379
- Issue date Jan 4, 2011
- Dmetrix, Inc.
- Artur G. Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Slide-borne imaging instructions
- Patent number 7,864,380
- Issue date Jan 4, 2011
- Dmetrix, Inc.
- Michael R. Descour
- G01 - MEASURING TESTING
Information Patent Grant
Liquid-lens variable-control optics in array microscope
- Patent number 7,755,841
- Issue date Jul 13, 2010
- Dmetrix, Inc.
- Todd R. Christenson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Equalization for a multi-axis imaging system
- Patent number 7,482,566
- Issue date Jan 27, 2009
- Dmetrix, Inc.
- Artur G. Olszak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Independent focus compensation for a multi-axis imaging system
- Patent number 7,388,714
- Issue date Jun 17, 2008
- Dmetrix, Inc.
- Chen Liang
- G02 - OPTICS
Information Patent Grant
Best-focus estimation by lateral scanning
- Patent number 7,330,574
- Issue date Feb 12, 2008
- Ometrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Grant
EPI-illumination system for an array microscope
- Patent number 7,193,775
- Issue date Mar 20, 2007
- Dmetrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Grant
Multi-mode scanning imaging system
- Patent number 7,130,115
- Issue date Oct 31, 2006
- Dhetrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Grant
Method and apparatus for limiting scanning imaging array data to ch...
- Patent number 7,034,317
- Issue date Apr 25, 2006
- Dmetrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Grant
Microscope stage providing improved optical performance
- Patent number 7,019,895
- Issue date Mar 28, 2006
- Dmetrix, Inc.
- William C. Russum
- G02 - OPTICS
Information Patent Grant
Imaging system with an integrated source and detector array
- Patent number 6,987,259
- Issue date Jan 17, 2006
- Dmetrix, Inc.
- Artur G. Olszak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference signal for stitching of interferometric profiles
- Patent number 6,987,570
- Issue date Jan 17, 2006
- Veeco Instruments Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Equalization for a multi-axis imaging system
- Patent number 6,958,464
- Issue date Oct 25, 2005
- Dmetrix, Inc.
- Artur G. Olszak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-axis imaging system having individually-adjustable elements
- Patent number 6,842,290
- Issue date Jan 11, 2005
- Dmetrix, Inc.
- Chen Liang
- G02 - OPTICS
Information Patent Grant
Scanning interferometry with reference signal
- Patent number 6,624,894
- Issue date Sep 23, 2003
- Veeco Instruments Inc.
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Correction of scanning errors in interferometric profiling
- Patent number 6,624,893
- Issue date Sep 23, 2003
- Veeco Instruments Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Lateral-scanning interferometer with tilted optical axis
- Patent number 6,449,048
- Issue date Sep 10, 2002
- Veeco Instruments, Inc.
- Artur Olszak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING THE POSITION OF OBJECTS IN SPACE
- Publication number 20190041186
- Publication date Feb 7, 2019
- APRE INSTRUMENTS, INC.
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
RADIUS-OF-CURVATURE MEASUREMENT BY SPECTRALLY-CONTROLLED INTERFEROM...
- Publication number 20180306575
- Publication date Oct 25, 2018
- APRE INSTRUMENTS, LLC
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
TRUE HETERODYNE SPECTRALLY CONTROLLED INTERFEROMETRY
- Publication number 20180149468
- Publication date May 31, 2018
- APRE INSTRUMENTS, LLC
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE SPECTRALLY CONTROLLED INTERFEROMETRY
- Publication number 20160282103
- Publication date Sep 29, 2016
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
TIME-MULTIPLEXED SPECTRALLY CONTROLLED INTERFEROMETRY
- Publication number 20160282102
- Publication date Sep 29, 2016
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
TIME-MULTIPLEXED SPECTRALLY CONTROLLED INTERFEROMETRY
- Publication number 20160282190
- Publication date Sep 29, 2016
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC NON-CONTACT OPTICAL PROBE AND MEASUREMENT
- Publication number 20160091299
- Publication date Mar 31, 2016
- ROBERT SMYTHE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY USING SPECTRALLY CONTROLLED INTERFEROM...
- Publication number 20130242312
- Publication date Sep 19, 2013
- Artur G. Olszak
- G01 - MEASURING TESTING
Information Patent Application
SPECTRALLY CONTROLLABLE LIGHT SOURCES IN INTERFEROMETRY
- Publication number 20100315650
- Publication date Dec 16, 2010
- ARTUR G. OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE ARRAY FOR MULTANEOUSLY IMAGING MULTIPLE OBJECTS
- Publication number 20090174936
- Publication date Jul 9, 2009
- DMetrix, Inc.
- ARTUR G. OLSZAK
- G02 - OPTICS
Information Patent Application
Liquid-lens variable-control optics in array microscope
- Publication number 20080297911
- Publication date Dec 4, 2008
- DMetrix, Inc.
- Todd C. Christenson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Large-area imaging by concatenation with array microscope
- Publication number 20080095467
- Publication date Apr 24, 2008
- DMetrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Method for referencing image data
- Publication number 20070250491
- Publication date Oct 25, 2007
- Artur G. Olszak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Slide-borne imaging instructions
- Publication number 20070159688
- Publication date Jul 12, 2007
- DMetrix, Inc.
- Michael R. Descour
- G02 - OPTICS
Information Patent Application
Multi-spectral whole-slide scanner
- Publication number 20070153370
- Publication date Jul 5, 2007
- DMetrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Multi-axis imaging system with single-axis relay
- Publication number 20060291048
- Publication date Dec 28, 2006
- DMetrix, Inc.
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Equalization for a multi-axis imaging system
- Publication number 20050205757
- Publication date Sep 22, 2005
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Multi-axis imaging system with single-axis relay
- Publication number 20050088735
- Publication date Apr 28, 2005
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Large-area imaging by stitching with array microscope
- Publication number 20050084175
- Publication date Apr 21, 2005
- Artur G. Olszak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Holographic single axis illumination for multi-axis imaging system
- Publication number 20040223199
- Publication date Nov 11, 2004
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
MULTI-AXIS IMAGING SYSTEM HAVING INDIVIDUALLY-ADJUSTABLE ELEMENTS
- Publication number 20040223226
- Publication date Nov 11, 2004
- Chen Liang
- G02 - OPTICS
Information Patent Application
Best-focus estimation by lateral scanning
- Publication number 20040223632
- Publication date Nov 11, 2004
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Method and apparatus for limiting scanning imaging array data to ch...
- Publication number 20040113050
- Publication date Jun 17, 2004
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Microscope stage providing improved optical performance
- Publication number 20040095641
- Publication date May 20, 2004
- William C. Russum
- G02 - OPTICS
Information Patent Application
Method for referencing image data
- Publication number 20040076345
- Publication date Apr 22, 2004
- Artur G. Olszak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-mode scanning imaging system
- Publication number 20040057094
- Publication date Mar 25, 2004
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Imaging system with an integrated source and detector array
- Publication number 20040056177
- Publication date Mar 25, 2004
- Artur G. Olszak
- G02 - OPTICS
Information Patent Application
Independent focus compensation for a multi-axis imaging system
- Publication number 20040051940
- Publication date Mar 18, 2004
- Chen Liang
- G02 - OPTICS
Information Patent Application
Method and apparatus for acquiring images from a multiple axis imag...
- Publication number 20040051030
- Publication date Mar 18, 2004
- Artur Olszak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Microscope array for simultaneously imaging multiple objects
- Publication number 20040004759
- Publication date Jan 8, 2004
- Artur G. Olszak
- G02 - OPTICS

Artur G. Olszak

Person

Patents Grantslast 30 patents

Wavelength shifting in spectrally-controlled interferometry

Radius-of-curvature measurement by spectrally-controlled interferom...

Measuring the position of objects in space

Optical alignment based on spectrally-controlled interferometry

Time-multiplexed spectrally controlled interferometry

Heterodyne spectrally controlled interferometry

Time-multiplexed spectrally controlled interferometry

Interferometric non-contact optical probe and measurement

Light sources for spectrally controlled interferometry

Optical coherence tomography using spectrally controlled interferom...

Spectrally controllable light sources in interferometry

Large-area imaging by concatenation with array microscope

Multi-spectral whole-slide scanner

Slide-borne imaging instructions

Liquid-lens variable-control optics in array microscope

Equalization for a multi-axis imaging system

Independent focus compensation for a multi-axis imaging system

Best-focus estimation by lateral scanning

EPI-illumination system for an array microscope

Multi-mode scanning imaging system

Method and apparatus for limiting scanning imaging array data to ch...

Microscope stage providing improved optical performance

Imaging system with an integrated source and detector array

Reference signal for stitching of interferometric profiles

Equalization for a multi-axis imaging system

Multi-axis imaging system having individually-adjustable elements

Scanning interferometry with reference signal

Correction of scanning errors in interferometric profiling

Lateral-scanning interferometer with tilted optical axis

Patents Applicationslast 30 patents

MEASURING THE POSITION OF OBJECTS IN SPACE

RADIUS-OF-CURVATURE MEASUREMENT BY SPECTRALLY-CONTROLLED INTERFEROM...

TRUE HETERODYNE SPECTRALLY CONTROLLED INTERFEROMETRY

HETERODYNE SPECTRALLY CONTROLLED INTERFEROMETRY

TIME-MULTIPLEXED SPECTRALLY CONTROLLED INTERFEROMETRY

TIME-MULTIPLEXED SPECTRALLY CONTROLLED INTERFEROMETRY

INTERFEROMETRIC NON-CONTACT OPTICAL PROBE AND MEASUREMENT

OPTICAL COHERENCE TOMOGRAPHY USING SPECTRALLY CONTROLLED INTERFEROM...

SPECTRALLY CONTROLLABLE LIGHT SOURCES IN INTERFEROMETRY

MICROSCOPE ARRAY FOR MULTANEOUSLY IMAGING MULTIPLE OBJECTS

Liquid-lens variable-control optics in array microscope

Large-area imaging by concatenation with array microscope

Method for referencing image data

Slide-borne imaging instructions

Multi-spectral whole-slide scanner

Multi-axis imaging system with single-axis relay

Equalization for a multi-axis imaging system

Multi-axis imaging system with single-axis relay

Large-area imaging by stitching with array microscope

Holographic single axis illumination for multi-axis imaging system

MULTI-AXIS IMAGING SYSTEM HAVING INDIVIDUALLY-ADJUSTABLE ELEMENTS

Best-focus estimation by lateral scanning

Method and apparatus for limiting scanning imaging array data to ch...

Microscope stage providing improved optical performance

Method for referencing image data

Multi-mode scanning imaging system

Imaging system with an integrated source and detector array

Independent focus compensation for a multi-axis imaging system

Method and apparatus for acquiring images from a multiple axis imag...

Microscope array for simultaneously imaging multiple objects