Artur Pogiel

Person

Szubin, PL

People

Patents Grantslast 30 patents

Information Patent Grant
Fault diagnosis for non-volatile memories
- Patent number 8,356,222
- Issue date Jan 15, 2013
- Mentor Graphics Corporation
- Nilanjan Mukherjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault diagnosis of compressed test responses
- Patent number 7,962,820
- Issue date Jun 14, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Compressing test responses using a compactor
- Patent number 7,890,827
- Issue date Feb 15, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Compressing test responses using a compactor
- Patent number 7,743,302
- Issue date Jun 22, 2010
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault diagnosis of compressed test responses
- Patent number 7,509,550
- Issue date Mar 24, 2009
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault diagnosis of compressed test responses having one or more unk...
- Patent number 7,437,640
- Issue date Oct 14, 2008
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Compressing test responses using a compactor
- Patent number 7,370,254
- Issue date May 6, 2008
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Adaptive fault diagnosis of compressed test responses
- Patent number 7,302,624
- Issue date Nov 27, 2007
- Janusz Rajski
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
FAULT DIAGNOSIS IN A MEMORY BIST ENVIRONMENT
- Publication number 20110055646
- Publication date Mar 3, 2011
- NILANJAN MUKHERJEE
- G11 - INFORMATION STORAGE
Information Patent Application
COMPRESSING TEST RESPONSES USING A COMPACTOR
- Publication number 20100257417
- Publication date Oct 7, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Fault Diagnosis For Non-Volatile Memories
- Publication number 20100229055
- Publication date Sep 9, 2010
- NILANJAN MUKHERJEE
- G11 - INFORMATION STORAGE
Information Patent Application
FAULT DIAGNOSIS OF COMPRESSED TEST RESPONSES
- Publication number 20090249147
- Publication date Oct 1, 2009
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Compressing test responses using a compactor
- Publication number 20080133987
- Publication date Jun 5, 2008
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Fault diagnosis of compressed test responses
- Publication number 20060041812
- Publication date Feb 23, 2006
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Adaptive fault diagnosis of compressed test responses
- Publication number 20060041813
- Publication date Feb 23, 2006
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Fault diagnosis of compressed test responses having one or more unk...
- Publication number 20060041814
- Publication date Feb 23, 2006
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Compressing test responses using a compactor
- Publication number 20040230884
- Publication date Nov 18, 2004
- Janusz Rajski
- G01 - MEASURING TESTING

Artur Pogiel

Person

Patents Grantslast 30 patents

Fault diagnosis for non-volatile memories

Fault diagnosis of compressed test responses

Compressing test responses using a compactor

Compressing test responses using a compactor

Fault diagnosis of compressed test responses

Fault diagnosis of compressed test responses having one or more unk...

Compressing test responses using a compactor

Adaptive fault diagnosis of compressed test responses

Patents Applicationslast 30 patents

FAULT DIAGNOSIS IN A MEMORY BIST ENVIRONMENT

COMPRESSING TEST RESPONSES USING A COMPACTOR

Fault Diagnosis For Non-Volatile Memories

FAULT DIAGNOSIS OF COMPRESSED TEST RESPONSES

Compressing test responses using a compactor

Fault diagnosis of compressed test responses

Adaptive fault diagnosis of compressed test responses

Fault diagnosis of compressed test responses having one or more unk...

Compressing test responses using a compactor