Arun Srivatsa

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for detecting metal contamination on a semiconduc...
- Patent number 6,759,255
- Issue date Jul 6, 2004
- KLA-Tencor Technologies Corp.
- Zhiwei Xu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Phase-Resolved Optical Metrology for Substrates
- Publication number 20240201077
- Publication date Jun 20, 2024
- Nedal SALEH
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY
- Publication number 20240090111
- Publication date Mar 14, 2024
- Ming Hong YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for detecting metal contamination on a semiconduc...
- Publication number 20020090746
- Publication date Jul 11, 2002
- Zhiwei Xu
- G01 - MEASURING TESTING