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Atsumu Hirabayashi
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Kodaira, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Mass spectrometric system
Patent number
8,674,299
Issue date
Mar 18, 2014
Hitachi High-Technologies Corporation
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer system
Patent number
7,932,486
Issue date
Apr 26, 2011
Hitachi High-Technologies Corporation
Akihiro Sano
G01 - MEASURING TESTING
Information
Patent Grant
Methods and instruments for identification of glycosylated proteins...
Patent number
7,829,845
Issue date
Nov 9, 2010
Hitachi High-Technologies Corporation
Kisaburo Deguchi
G01 - MEASURING TESTING
Information
Patent Grant
Ion source and mass spectrometer instrument using the same
Patent number
7,645,983
Issue date
Jan 12, 2010
Hitachi, Ltd.
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometric method, mass spectrometric system, diagnosis sys...
Patent number
7,595,484
Issue date
Sep 29, 2009
Hitachi High-Technologies Corp.
Toshiyuki Yokosuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tandem type mass analysis system and method
Patent number
7,544,930
Issue date
Jun 9, 2009
Hitachi High-Technologies Corporation
Kiyomi Yoshinari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of identifying substances using mass spectrometry
Patent number
7,538,321
Issue date
May 26, 2009
Hitachi High-Technologies Corporation
Masako Ishimaru
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Mass spectrometer system
Patent number
7,473,892
Issue date
Jan 6, 2009
Hitachi High-Technologies Corporation
Akihiro Sano
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometry and mass spectrometry system
Patent number
7,180,056
Issue date
Feb 20, 2007
Hitachi, Ltd.
Atsushi Ohtake
G01 - MEASURING TESTING
Information
Patent Grant
Ion source and mass spectrometric apparatus
Patent number
7,141,788
Issue date
Nov 28, 2006
Hitachi, Ltd.
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry system
Patent number
7,126,113
Issue date
Oct 24, 2006
Hitachi High-Technologies Corporation
Toshiyuki Yokosuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer
Patent number
6,989,531
Issue date
Jan 24, 2006
Hitachi High-Technologies Corporation, Ltd.
Atsumu Hirabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrum analyzing system
Patent number
6,917,037
Issue date
Jul 12, 2005
Hitachi High-Technologies Corporation
Atsushi Ootake
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer and measurement system using the mass spectrometer
Patent number
6,900,430
Issue date
May 31, 2005
Hitachi, Ltd.
Akihiko Okumura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capillary electrophoretis system, sample analyzer and liquid sample...
Patent number
6,787,017
Issue date
Sep 7, 2004
Hitachi, Ltd.
Atsumu Hirabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Sample-introduction tool, and an ion source and a mass spectrometer...
Patent number
6,774,359
Issue date
Aug 10, 2004
Hitachi, Ltd.
Yukiko Hirabayashi
G01 - MEASURING TESTING
Information
Patent Grant
DNA analysis system
Patent number
6,673,547
Issue date
Jan 6, 2004
Hitachi, Ltd.
Atsumu Hirabayashi
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Analytical apparatus using nebulizer
Patent number
6,499,675
Issue date
Dec 31, 2002
Hitachi, Ltd.
Min Huang
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Analytical apparatus using nebulizer
Patent number
6,485,689
Issue date
Nov 26, 2002
Hitachi, Ltd.
Min Huang
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Method of mass-analyzing body fluid and apparatus therefor
Patent number
6,478,738
Issue date
Nov 12, 2002
Hitachi, Ltd.
Yukiko Hirabayashi
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Nebulizer
Patent number
6,446,883
Issue date
Sep 10, 2002
Hitachi, Ltd.
Min Huang
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometry of solution and apparatus therefor
Patent number
6,437,327
Issue date
Aug 20, 2002
Hitachi, Ltd.
Yasuaki Takada
G01 - MEASURING TESTING
Information
Patent Grant
Ion source and mass spectrometer instrument using the same
Patent number
6,384,411
Issue date
May 7, 2002
Hitachi, Ltd.
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer
Patent number
6,335,525
Issue date
Jan 1, 2002
Hitachi, Ltd.
Yasuaki Takada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry of solution and apparatus therefor
Patent number
6,252,225
Issue date
Jun 26, 2001
Hitachi, Ltd.
Yasuaki Takada
G01 - MEASURING TESTING
Information
Patent Grant
Method of mass-analyzing body fluid and apparatus therefor
Patent number
6,190,316
Issue date
Feb 20, 2001
Hitachi, Ltd.
Yukiko Hirabayashi
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Mass spectrometer
Patent number
6,188,065
Issue date
Feb 13, 2001
Hitachi, Ltd.
Yasuaki Takada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion source and mass spectrometer instrument using the same
Patent number
6,147,347
Issue date
Nov 14, 2000
Hitachi, Ltd.
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry of solution and apparatus
Patent number
6,121,608
Issue date
Sep 19, 2000
Hitachi, Ltd.
Yasuaki Takada
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer and mass spectrometry method for analyzing compou...
Patent number
6,114,693
Issue date
Sep 5, 2000
Hitachi, Ltd.
Atsumu Hirabayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ION ISOLATION METHOD AND MASS SPECTROMETER
Publication number
20120305762
Publication date
Dec 6, 2012
Akihito Kaneko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETRIC SYSTEM
Publication number
20110315868
Publication date
Dec 29, 2011
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
QUANTITATIVE ANALYSIS METHOD USING MASS SPECTROMETER
Publication number
20110101215
Publication date
May 5, 2011
Atsumu Hirabayashi
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETER SYSTEM
Publication number
20090189063
Publication date
Jul 30, 2009
Akihiro Sano
G01 - MEASURING TESTING
Information
Patent Application
Ion source and mass spectrometer instrument using the same
Publication number
20080237459
Publication date
Oct 2, 2008
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and instruments for identification of glycosylated proteins...
Publication number
20080048110
Publication date
Feb 28, 2008
Hitachi High-Technologies, Corporation
Kisaburo DEGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Mass analysis system
Publication number
20070221836
Publication date
Sep 27, 2007
Kinya Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD
Publication number
20070187588
Publication date
Aug 16, 2007
Kiyomi Yoshinari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of identifying substances using mass spectrometry
Publication number
20060255263
Publication date
Nov 16, 2006
Masako Ishimaru
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Mass spectrometric method, mass spectrometric system, diagnosis sys...
Publication number
20060169889
Publication date
Aug 3, 2006
Toshiyuki Yokosuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometry and mass spectrometry system
Publication number
20050274884
Publication date
Dec 15, 2005
Atsushi Otake
G01 - MEASURING TESTING
Information
Patent Application
On-line chemical reaction system
Publication number
20050250145
Publication date
Nov 10, 2005
Atsumu Hirabayashi
G01 - MEASURING TESTING
Information
Patent Application
Mass spectrometry system
Publication number
20050184232
Publication date
Aug 25, 2005
Toshiyuki Yokosuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer
Publication number
20050092917
Publication date
May 5, 2005
Hitachi High-Technologies Corporation
Atsumu Hirabayashi
G01 - MEASURING TESTING
Information
Patent Application
Mass spectrometer system
Publication number
20050063864
Publication date
Mar 24, 2005
Akihiro Sano
G01 - MEASURING TESTING
Information
Patent Application
Ion source and mass spectrometric apparatus
Publication number
20050056781
Publication date
Mar 17, 2005
Hitachi, Ltd.
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Online chemical reaction device and analysis system
Publication number
20040191856
Publication date
Sep 30, 2004
Hitachi, Ltd.
Atsumu Hirabayashi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Mass spectrum analyzing system
Publication number
20040169138
Publication date
Sep 2, 2004
Atsushi Ootake
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion source and mass spectrometric apparatus
Publication number
20030209666
Publication date
Nov 13, 2003
Hitachi, Ltd.
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer and measurement system using the mass spectrometer
Publication number
20030066958
Publication date
Apr 10, 2003
Akihiko Okumura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DNA analysis system
Publication number
20020127566
Publication date
Sep 12, 2002
Atsumu Hirabayashi
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Ion source and mass spectrometer instrument using the same
Publication number
20020125426
Publication date
Sep 12, 2002
Atsumu Hirabayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Analytical apparatus using nebulizer
Publication number
20020113144
Publication date
Aug 22, 2002
Hitachi, Ltd.
Min Huang
G01 - MEASURING TESTING
Information
Patent Application
Mass spectrometry of solution and apparatus therefor
Publication number
20010022344
Publication date
Sep 20, 2001
Yasuaki Takada
G01 - MEASURING TESTING