TREA

Atsuo Urata

Follow

Person

  • Osaka, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Contact probe
    • Patent number 9,972,933
    • Issue date May 15, 2018
    • Japan Electronic Materials Corporation
    • Teppei Kimura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Contact probe
    • Patent number 9,774,121
    • Issue date Sep 26, 2017
    • Japan Electronics Material Corporation
    • Teppei Kimura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Bimetallic probe with tip end
    • Patent number 7,692,438
    • Issue date Apr 6, 2010
    • National Institute for Materials Science
    • Kazumichi Machida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 7,268,568
    • Issue date Sep 11, 2007
    • Nihon Denshizairyo Kabushiki Kaisha
    • Kazumichi Machida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 7,208,964
    • Issue date Apr 24, 2007
    • Nihon Denshizairyo Kabushiki Kaisha
    • Atsushi Mine
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 6,980,013
    • Issue date Dec 27, 2005
    • Nihon Denshizairyo Kabushiki Kaisha
    • Kazumichi Machida
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Contact Probe
    • Publication number 20170346211
    • Publication date Nov 30, 2017
    • JAPAN ELECTRONIC MATERIALS CORPORATION
    • Teppei Kimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electrical Contact
    • Publication number 20150280345
    • Publication date Oct 1, 2015
    • JAPAN ELECTRONIC MATERIALS CORPORATION
    • Teppei Kimura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Probe
    • Publication number 20080054916
    • Publication date Mar 6, 2008
    • Kazumichi Machida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card
    • Publication number 20070052432
    • Publication date Mar 8, 2007
    • Nihon Denshizairyo Kabushiki Kaisha
    • Kazumichi Machida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card
    • Publication number 20050184745
    • Publication date Aug 25, 2005
    • Nihon Denshizairyo Kabushiki Kaisha
    • Kazumichi Machida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card
    • Publication number 20050151547
    • Publication date Jul 14, 2005
    • Nihon Denshizairyo Kabushiki Kaisha
    • Kazumichi Machida
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE SHEET AND PROBE SHEET UNIT USING SAME
    • Publication number 20050099195
    • Publication date May 12, 2005
    • NIHON DENSHIZAIRYO KABUSHIKI KAISHA
    • Kazumichi MACHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ARCH TYPE PROBE AND PROBE CARD USING SAME
    • Publication number 20050099194
    • Publication date May 12, 2005
    • NIHON DENSHIZAIRYO KABUSHIKI KAISHA
    • Atsushi MINE
    • G01 - MEASURING TESTING