Patent Grant
9972933
The present invention relates to an electrical contact, and more specifically, to improvement of an electrical contact of which a contact part is brought into contact with an electrode terminal along with elastic deformation of an elastic deformation part, for example, a contact probe used for an electrical characteristics test of semiconductor devices.
An electrical characteristics test of semiconductor devices is performed in such a way as to bring a semiconductor wafer close to a probe card of which a number of contact probes are formed on a wiring board, and thereby bring the respective contact probes into contact with corresponding electrode pads on the semiconductor wafer to input/output a test signal through the contact probes.
When bringing the contact probes into contact with the corresponding electrode pads, after the both reach a state of starting to contact with each other, a process to further bring the semiconductor wafer close to the probe card is performed. Such a process is called overdrive, and a distance of the overdrive is called an overdrive amount. The overdrive is a process to elastically deform the contact probes, and by performing the overdrive, even in the case where there are variations in height among the electrode pads or the contact probes, all of the contact probes can be surely brought into contact with the corresponding electrode pads.
The inventors of the present application proposed, in the previous patent application, a method for improving high frequency characteristics of a contact probe (Patent Literature 1). The contact probe described in Patent Literature 1 has an elastic deformation part including multiple elongate plate-like bodies of which adjacent principal surfaces face each other via a gap. Employing such a configuration makes it possible to shorten the length of the probe to improve the high frequency characteristics of the contact probe while ensuring an overdrive amount and probe pressure.
Also, the inventors of the present application proposed a method for further improving the above-described contact probe to improve current resistant characteristics of the contact probe (Patent Literature 2). In a contact probe described in Patent Literature 2, the above-described plate-like bodies have three-layer structure that sandwiches a conductive layer between stress layers in a width direction thereof. For this reason, current resistant characteristics can be improved while ensuring an overdrive amount, probe pressure, and high frequency characteristics.
This sort of contact probe is used in a state where the base end part is fixed to a wiring board, and also to make the fore end part movable in the longer direction, the vicinity of the fore end is supported by a guide plate. The guide plate has a through-hole through which the contact probe passes, and positions the fore end part in a two-dimensional plane. For this reason, at the time of overdrive, a side surface of the contact probe and a corresponding inner surface of the through-hole contact with each other, and any one of them is shaved to produce shavings. When such shavings are produced, the movement of the contact probe may be made difficult at the time of overdrive. In addition, in the case of shavings made of a conductive material, a short circuit may occur between adjacent contact probes.
The contact probe in Patent Literature 2 is configured such that the conductive layer is sandwiched between the stress layers, and therefore has side surfaces configured to include the three layers. Such side surfaces have a problem of easily causing a level difference to easily produce shavings. In particular, in the case of the contact probe in Patent Literature 2, a side surface facing in a curve direction is configured to include the three layers, and pressed against a corresponding inner surface of the through-hole at the time of overdrive, thus causing a problem of producing shavings. Also, when pressing the side surface having a level difference against the inner surface of the through-hole, the contact probe is twisted, thus causing a problem of reducing the accuracy of positioning by the guide plate. Further, since the contact probe is twisted, there is a problem of easily producing shavings.
Meanwhile, experiments by the inventors of the present application have revealed that by repetitively using the contact probe described in Patent Literature 2, unevenness is formed on the surfaces of the conductive layer to cause a rough state. This phenomenon is considered to be caused by repetitive plastic deformation of the conductive layer. At the time of overdrive, the stress layers are elastically deformed, whereas the conductive layer is plastically deformed. For this reason, it can be considered that when repetitively using the contact probe, the surfaces of the conductive layer repetitively plastically deformed are roughened.
As a result, for example, in the case of preventing a short circuit between contact probes by respectively forming insulating layers on the surfaces of conductive, the insulating layers formed on the conductive layers are broken or peeled off to cause a short circuit between the contact probes. That is, the surfaces of the conductive layers are roughened, causing a problem of reducing the durability of the contact probes.
Such a problem is a problem not only occurring in a contact probe used for an electrical characteristics test of semiconductor devices but common to electrical contacts of which contact parts are brought into contact with electrode terminals along with elastic deformation of elastic deformation parts, respectively.
The present invention is made in consideration of the above situations, and intends to provide an electrical contact that can be suppressed from interfering with a guide plate to produce shavings. Also, the present invention intends to suppress the electrical contact from interfering with the guide plate to be twisted.
In particular, the present invention intends to provide an electrical contact that is formed so as to include three or more layers and can suppress shavings from being produced due to a level difference on a side surface configured to include the three layers. Also, the present invention intends to suppress the electrical contact from being twisted due to the level difference to reduce the accuracy of positioning by a guide plate.
Further, the present invention intends to improve the durability of an electrical contact having three-layer structure that sandwiches a conductive layer between stress layers. Still further, the present invention intends to, without significantly reducing current resistant characteristics or overdrive characteristics, improve the durability of an electrical contact of which an elastic deformation part is divided into two or more plate-like bodies each of which has three-layer structure. Yet further, the present invention intends to prevent the occurrence of a short circuit between adjacently arranged electrical contacts.
An electrical contact according to a first aspect of the present invention includes: a contact part that is brought into abutting with a test object; a terminal part that is conducted to a wiring board; an elastic deformation part that is provided between said contact part and said terminal part, and elastically deformed by compression force in a longer direction; and a sliding part that is supported by a through-hole of a guide plate movably in the longer direction, wherein said sliding part has stacked structure of which an intermediate layer is sandwiched by outer layers and a stack surface extends in the longer direction, and on a side surface thereof, said intermediate layer protrudes relative to said outer layers.
Employing such a configuration makes it possible to press the intermediate layer against an inner surface of the through-hole of the guide plate at the time of overdrive without pressing the outer layers. For this reason, as compared with the case where the outer layers protrude relative to the intermediate layer, and the outer layers are pressed against an inner surface of the through-hole, the electrical contact can be suppressed from being twisted at the time of overdrive. Also, the electrical contact can be suppressed from being twisted to easily produce shavings at the time of sliding.
An electrical contact according to a second aspect of the present invention is, in addition to the above configuration, configured such that on said side surface of said sliding part, a plating layer is formed so as to cover the intermediate layer and the outer layers. Such a configuration makes it possible to round corner angles caused by level differences between the intermediate layer and the outer layers to make the side surface gentle. For this reason, a contact area in the case where a side surface of a fore end part slides on a corresponding inner surface of the through-hole while locally contacting with the inner surface can be increased. As a result, the production of shavings can be suppressed at the time of sliding.
An electrical contact according to a third aspect of the present invention is, in addition to the above configuration, configured such that said sliding part is formed between said contact part and said elastic deformation part. Such a configuration makes it possible to perform positioning of the contact part in a two-dimensional plane by the through-hole of the guide plate as well as preventing the electrical contact from being twisted at the time of overdrive. Further, shavings can be prevented from being easily produced at the time of sliding.
An electrical contact according to a fourth aspect of the present invention is, in addition to the above configuration, configured such that said sliding part is formed between said terminal part and said elastic deformation part. Such a configuration makes it possible to perform positioning of the terminal part in a two-dimensional plane by the through-hole of the guide plate as well as preventing the electrical contact from being twisted at the time of overdrive. Further, shavings can be prevented from being easily produced at the time of sliding.
An electrical contact according to a fifth aspect of the present invention is, in addition to the above configuration, configured such that said elastic deformation part includes an elongate plate-like body; and said plate-like body has a conductive layer made of a first metal, stress layers that are formed so as to sandwich said conductive layer in a width direction and made of a second metal, and a thin film layer that is formed so as to cover said conductive layer on a principal surface of said plate-like body and made of a third metal. In addition, the first metal has smaller resistivity than the second metal; and the second metal and the third metal have high mechanical strength as compared with the first metal.
By forming part of the electrical contact as the plate-like body, stress produced at the time of curving in the thickness direction of the plate-like body can be reduced. For this reason, a larger curve can be formed within an elastic limit to shorten the electrical contact while ensuring a desired overdrive amount. As a result, without reducing contact characteristics of the electrical contact, high frequency characteristics can be improved.
In addition, the plate-like body has the conductive layer and stress layers arrayed in the width direction thereof, and the conductive layer is made of the first metal having smaller resistivity, whereas the stress layers are made of the second metal having higher mechanical strength. Employing such a configuration makes it possible to reduce electrical resistance while keeping mechanical strength. For this reason, current resistant characteristics of the electrical contact can be improved while ensuring probe pressure at the time of overdrive. In addition, by arranging the conductive layer so as to sandwich the conductive layer between the stress layers, the plate-like body can be prevented from being twisted or tilted at the time of overdrive.
Further, the plate-like body has the thin film layer that is formed so as to cover the conductive layer on the principal surface of the plate-like body, and the thin film layer is made of the third metal having high mechanical strength as compared with the first metal. By employing such a configuration, the conductive layer that is plastically deformed at the time of overdrive is covered with the thin film layer that is elastically deformed at the time of overdrive, and therefore the principal surface of the plate-like body can be prevented from being roughened.
An electrical contact according to a sixth aspect of the present invention is, in addition to the above configuration, configured such that said elastic deformation part includes two or more of said plate-like bodies that are arranged so as to make adjacent principal surfaces face each other through a gap; and said plate-like bodies are mutually connected at both ends in the longer direction.
By providing the two or more plate-like bodies, and making adjacent principal surfaces of the plate-like bodies face to each other through a gap, the cross-sectional area of the electrical contact can be increased to ensure probe pressure and current resistant characteristics without increasing the thicknesses of the respective plate-like bodies.
An electrical contact according to a seventh aspect of the present invention is, in addition to the above configuration, configured such that said thin film layer is formed on outer principal surfaces of said plate-like bodies arranged on both sides, and not formed on the principal surfaces adjacent to said gap.
By employing such a configuration, as compared with the case of forming the thin film layer on both principal surfaces of the plate-like bodies, the intermediate metallic layer can be formed thicker to reduce the electrical resistance of the electrical contact as long as the thicknesses of the plate-like bodies are the same. Also, as compared with the case of forming the thin film layer on the outer principal surfaces, in the case of forming the thin film layer on the inner principal surfaces adjacent to the narrow gap, thickness control becomes difficult, so that by preventing the formation of the thin film layer on the inner principal surfaces, the electrical contact can be easily manufactured, and variations in characteristics of the electrical contact can be suppressed.
An electrical contact according to an eighth aspect of the present invention is, in addition to the above configuration, configured to include three or more of said plate-like bodies, in which said plate-like bodies have substantially the same thickness as each other.
Employing such a configuration makes it possible to, at the time of overdrive, uniformly distribute pressing force to the respective plate-like bodies, and deform the plate-like bodies so as to form substantially the same curved shape as each other. As a result, a larger overdrive amount can be ensured, and also the electrical contact can be suppressed from being tilted at the time of overdrive.
An electrical contact according to a ninth aspect of the present invention is, in addition to the above configuration, configured such that on said thin film layer, an insulating film is formed. Employing such a configuration makes it possible to prevent the breakage or peeling off of the insulating film caused by repetitive overdrive, and also prevent a short circuit between adjacent electrical contacts.
According to the present invention, the electrical contact can be suppressed from interfering with the guide plate to thereby produce shavings. Also, the electrical contact can be suppressed from interfering with the guide plate to be twisted.
In particular, in the electrical contact formed so as to include three or more layers, the formation of a level difference on a side surface configured to include the three layers, and the production of shavings caused by the level difference can be suppressed. As a result, the electrical contact can be suppressed from becoming difficult to move due to shavings. Also, the occurrence of a short circuit between adjacent electrical contacts due to the production of conductive shavings can be prevented.
Further, the electrical contact can be suppressed from being twisted by the level difference to reduce the accuracy of positioning by the guide plate. In addition, the electrical contact can be suppressed from being twisted to thereby produce shavings.
Still further, according to the present invention, the durability of the electrical contact having three-layer structure that sandwiches the conductive layer between the stress layers can be improved. Also, the durability of the electrical contact of which the elastic deformation part is divided into the two or more plate-like bodies each of which has the three-layer structure can be improved without significantly reducing current resistant characteristics or overdrive characteristics. Further, the occurrence of a short circuit between adjacently arranged electrical contacts can be prevented.
The contact probe 101 is a vertical type probe arranged vertically to a test object, and configured to include: a main body part 1 of a substantially linear elongate shape; a contact part 2 formed at the fore end of the main body part 1; and a terminal part 6 provided at the base end of the main body part 1. The main body part 1 has stacked structure including three metallic layers 11 to 13, and the respective metallic layers 11 to 13 of which stack surfaces all extend along the longer direction of the main body part 1 are formed from the base end to the fore end of the main body part 1. In addition, the metallic layers 11 to 13 are formed sequentially stacked, and the intermediate metallic layer 12 is sandwiched by the outer metallic layers 11 and 13. The contact part 2 is an abutting part that is brought into abutting with a test target, and formed so as to protrude from the fore end of the main body part 1. The terminal part 6 is provided on the end surface of the base end of the main body part 1.
The main body part 1 is configured to include: an elongate-shaped elastic deformation part 4 that is elastically deformed at the time of overdrive; and a fore end part 3 and a base end part 5 that are formed on both sides of the elastic deformation part 4. At the end of the fore end part 3, the contact part 2 is formed, and at the end of the base end part 5, the terminal part 6 is formed. The terminal part 6 is fastened to an unillustrated wiring board, and the elastic deformation part 4 is of a shape that is easily bucklingly deformed by being applied with compression force in the longer direction thereof. For this reason, at the time of overdrive, in response to reaction force from the test object, the elastic deformation part 4 is bucklingly deformed, and thereby the contact part 2 is moved backward toward the base end part 5 side.
The elastic deformation part 4 is formed to include three beam parts 41 to 43 of which adjacent ones are arranged through a gap. The respective beam parts 41 to 43 are all formed as elongate plate-like bodies, and arranged so as to make adjacent principal surfaces face each other. Also, one ends of the beam parts 41 to 43 in the longer direction are connected by the fore end part 3, and the other ends are connected by the base end part 5.
Forming the beam parts 41 to 43 as the plate-like bodies makes it easier to deform the beam parts 41 to 43 in their thickness direction, and when applied with compression force in the longer direction, the beam parts 41 to 43 are easily bucklingly deformed. That is, at the time of overdrive, the beam parts 41 to 43 are deformed so as to be curved using the whole thereof in the longer direction, and therefore can be elastically deformed largely even by small compression force. Accordingly, as compared with the length of the beams, a large overdrive amount can be ensured.
However, in the case of forming each of the beams 41 to 43 in the easily elastically deformable shape, reaction force at the time of elastic deformation also becomes small, and therefore it becomes difficult to ensure pressing force (probe pressure) of the contact part 2 against the test object. For this reason, the elastic deformation part 4 is configured to include the two or more beam parts 41 to 43, and the sum of reaction forces of the respective beam parts 41 to 43 is used as probe pressure, whereby even in the case where the reaction force of each of the beam parts 41 to 43 is small, the large probe pressure can be ensured. That is, by dividing the elastic deformation part 4 into the two or more beam parts 41 to 43, as well as forming the respective beam parts 41 to 43 as the plate-like bodies and arranging them such that adjacent principal surfaces face each other, the length of the probe can be shortened while ensuring both of an overdrive amount and probe pressure. Accordingly, without reducing contact characteristics, high frequency characteristics can be improved.
Further, in the case of dividing the elastic deformation part 4 into the three beam parts 41 to 43, a cross section area is reduced to thereby cause a problem of reducing current resistant characteristics. For this reason, by forming the beam parts 41 to 43 from the three metallic layers 11 to 13, the resistivity of the elastic deformation part 4 is reduced. The metallic layers 11 to 13 are layers that divide the beam parts 41 to 43 in the width direction, any of which is made of conductive metal; however, the outer metallic layers 11 and 13 and the intermediate metallic layer 12 are formed of mutually different materials. The outer metallic layers 11 and 13 are stress layers using a metallic material having higher mechanical strength, whereas the intermediate metallic layer 12 is a conductive layer using a metallic material having smaller resistivity. Employing such a configuration that sandwiches the conductive layer between the two stress layers makes it possible to reduce resistance to improve the current resistant characteristics without increasing the cross section area of the beam parts 41 to 43.
It is generally known that the moment of inertia of area of a leaf spring is proportional to the width of the leaf spring, and also proportional to the cube of the thickness of the leaf spring. For this reason, buckling deformation characteristics of the beam parts 41 to 43 are substantially determined by the thicknesses of the beam parts 41 to 43, and the effect caused by adding the intermediate metallic layer 12 to form the three-layer structure can be balanced out by finely adjusting the thicknesses of the beam parts 41 to 43.
Further, the beam parts 41 to 43 are of a gently curved shape before overdrive, and at the time of overdrive, bucklingly deformed so as to increase the curvature of the curved shape. Accordingly, direction of curvatures N of the beam parts 41 to 43 are all predetermined, and coincident with one another. In addition, a direction that is a thickness direction of the beam parts 41 to 43 and faces toward the outside of the curved shape is herein referred to as the direction of curvature N.
The fore end part 3 and the elastic deformation part 4 are both configured to include the metallic layers 11 to 13, and the metallic layers 11 to 13 all have rectangular-shaped cross sections. In addition, the intermediate metallic layer 12 is thicker than the outer metallic layers 11 and 13.
The beam parts 41 to 43 included in the elastic deformation part 4 all have rectangular-shaped cross sections, and the cross sections have the thicknesses that are small as compared with corresponding widths, and are arranged in line at regular intervals in the thickness direction. Regarding the cross sections of the respective beam parts 41 to 43, the thicknesses are substantially the same, and the widths are also substantially the same. That is, the cross sections have substantially the same shape and size.
Employing such a configuration makes it possible to uniformly distribute the pressing force at the time of overdrive to the respective beam parts 41 to 43, and deform the beam parts 41 to 43 so as to form substantially the same curved shape as each other. As a result, within an elastic limit, a larger overdrive amount can be ensured, and also the contact probe 101 can be suppressed from being tilted.
Also, the beam parts 41 to 43 are configured by arraying the three metallic layers 11 to 13 in the width direction thereof so as to sandwich the intermediate metallic layer 12 between the outer metallic layers 11 and 13. For example, for the outer metallic layers 11 and 13, a nickel cobalt alloy (Ni—Co) is used, whereas for the intermediate metallic layer 12, gold (Au) is used. Gold (Au) has low mechanical strength and small resistivity as compared with the nickel cobalt alloy (Ni—Co). For this reason, by using gold (Au) for the intermediate metallic layer 12, the electrical resistance of the beam parts 41 to 43 can be reduced without increasing the thickness Lt of the beam parts 41 to 43. That is, without spoiling the ease of the buckling deformation, the electrical resistance of the beam parts 41 to 43 can be reduced.
Further, the outer metallic layers 11 and 13 have substantially the same width, and the metallic layers 11 to 13 are formed symmetrically in the width direction of the beam parts 41 to 43. For this reason, when applied with pressing force in the longer direction, the beam parts 41 to 43 are respectively deformed in a balanced manner, and can be suppressed from being tilted or twisted at the time of overdrive.
The fore end part 3 is also configured by sandwiching the intermediate metallic layer 12 between the outer metallic layers 11 and 13 in the same manner, but different from the elastic deformation part 4 in that the intermediate metallic layer 12 is formed so as to protrude relative to the outer metallic layers 11 and 13 and the fore end part 3 has a cross-shaped cross section. The length of each of the protrusions of the intermediate metallic layer 12 is only required to be at a level that can prevent reversal caused by variations in a manufacturing process. That is, it is only necessary that the intermediate metallic layer 12 protrudes relative to any of the outer metallic layers 11 and 13, and the length of the protrusion is arbitrary.
Also, the intermediate metallic layer 12 is different from the elastic deformation part 4 in that the intermediate metallic layer 12 is configured to include three metallic areas 12a to 12c arrayed in the direction of curvature N. That is, the three metallic areas 12a to 12c are formed so as to sandwich the central metallic area 12b between the metallic areas 12a and 12c on both sides. The outer metallic layers 11 and 13 of the fore end part 3 is made of the same material as that of the outer metallic layers 11 and 13 of the elastic deformation part 4, and formed simultaneously with these metallic layers. On the other hand, the intermediate metallic layer 12 of the fore end part 3, i.e., the metallic areas 12a to 12c are made of metallic materials different from that of the intermediate metallic layer 12 of the elastic deformation part 4. For example, for the central metallic area 12b, relatively low-cost copper (Cu) having small resistivity is used, and for the metallic areas 12a and 12c on both sides, a palladium cobalt (Pd—Co) alloy having high mechanical strength is used.
Further, on the outer circumferential surface of the fore end part 3, a thin film layer 14 is formed. For the thin film layer 14, a metallic material having higher abrasion resistant characteristics than the nickel alloy contained in the fore end part 3, for example, rhodium (Rh) is used. In addition, the thin film layer 14 includes, for example, a plating layer formed by an electroplating process. Forming such a thin film layer 14 makes it possible to suppress conductive shavings from being produced from a side surface of the fore end part 3. Further, by forming the thin film layer 14, and thereby rounding corner parts caused by level differences between the metallic layers 11 to 13 to make changes of the side surfaces of the fore end part 3 gentle, the production of shavings can be further effectively suppressed. Note that in this example, on the principal surface of the outer metallic layer 11, the thin film layer 14 is not formed due to manufacturing process reason; however, the thin film may be formed on all of the side surfaces of the fore end part 3 including the above principal surface.
The terminal part 6 of the contact probe 101 is fastened to a probe electrode 111 on the wiring board 110. Also, the fore end part 3 is supported movably in the longer direction by the guide plate 120. For the guide plate 120, for example, a silicon substrate is used, and a through-hole 121 corresponding to the contact probe 101 is formed. The contact probe 101 is arranged in a state of passing through the through-hole 121 such that the side surfaces of the fore end part 3 face corresponding inner surfaces 122 of the through-hole 121. For this reason, the fore end part 3 is positioned in a two-dimensional plane parallel to the guide plate 120 while keeping the state of being movable in the longer direction.
On the semiconductor wafer 200, a number of semiconductor devices are formed, and in addition, each of the semiconductor devices is formed with a number of electrode terminals 201. When performing the electrical characteristics test of the semiconductor devices, the contact probe 101 is arranged substantially vertically to the semiconductor wafer 200, and used with the tip thereof brought into abutting with an electrode terminal 201.
That is, at the time of the overdrive, a side surface of the fore end part 3 slides on a corresponding inner surface 122 of the through-hole 121. In addition, along with the elastic deformation of the elastic deformation part 4, force attempting to displace the fore end part 3 in the direction of curvature N or a direction N′ opposite to the N, or tilt 123 the fore end part 3 acts. As a result, the fore end part 3 is a sliding part that slides in a state of being pressed against the inner surface 122 of the through-hole 121 in the direction of curvature N or the opposite direction N′.
The through-hole 121 has a rectangular-shaped opening, and the inner surfaces 122 thereof face corresponding outer surfaces of the fore end part 3 so as to be substantially parallel to the outer surfaces. That is, in the direction of curvature N and the opposite direction N′, two surfaces facing corresponding end surfaces of the intermediate metallic layer 12 are provided, and in the directions intersecting with the direction of curvature N, two surfaces respectively facing the outer metallic layers 11 and 13 are provided.
As described above, at the time of overdrive, the fore end part 3 slides in the state of being pressed against an inner surface 122 of the through-hole 121 in the direction of curvature N or the opposite direction N′ of the elastic deformation part 4. For this reason, as in
The contact probe 101 is formed with the metallic layers 11 to 13 on the side surfaces thereof in the direction of curvature N and the opposite direction N′. In the case where the side surfaces are planarized with high accuracy so as to prevent any level difference between the metallic layers 11 to 13 from being formed, the problem as in
For formation processes of respective layers including the sacrifice layer, a well-known plating technique can be utilized. For example, by immersing a substrate as a cathode and a metal piece as an anode into an electrolytic solution, and applying voltage between the both electrodes, metal ions in the electrolytic solution can be deposited on the surface of the substrate. Such a process is called an electroplating process, which is a wet process in which the substrate is immersed into the electrolytic solution, and therefore after the plating process, a drying process is performed. Further, after the drying process, a planarization process to planarize a stacked surface by a polishing process or the like is performed as needed.
The contact probe 101 according to the present embodiment has the stacked structure that sandwiches the intermediate metallic layer 12 between the outer metallic layers 11 and 13, and includes: the contact part 2 that is brought into abutting with a test object; the elastic deformation part 4 that is elastically deformed so as to be curved in the predetermined direction of curvature N by compression force in the longer direction; and the fore end part 3 that is formed between the contact part 2 and the elastic deformation part 4 and supported by the through-hole 121 of the guide plate 120 so as to make the contact part 2 movable in the longer direction, in which the side surfaces of the fore end part 3 formed in the direction of curvature N and the opposite direction N′ of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.
Employing such a configuration makes it possible to press the intermediate metallic layer 12 toward an inner surface 122 of the through-hole 121 at the time of overdrive. For this reason, as compared with the case where a level difference is formed between the metallic layers 11 to 13 such that any of the outer metallic layers 11 and 13 protrudes relative to the intermediate metallic layer 12, the contact probe 101 can be suppressed from being twisted. Also, shavings can be suppressed from being produced at the time of sliding to make the contact probe 101 difficult to move or cause adjacent contact probes 101 to be mutually short-circuited. Further, since a side surface of the fore end part 3 is supported by the through-hole 121 of the guide plate 120 so as to make the contact part 2 movable in the longer direction, the contact part 2 can be accurately positioned in the two-dimensional plane at the time of overdrive.
In addition, in the contact probe 101 according to the present embodiment, the plating layer is formed on the side surfaces of the fore end part 3 so as to extend across the intermediate layer and the outer layers. Such a configuration makes it possible to smoothly cover parts corresponding to level differences between the intermediate layer and the outer layers, and make the level differences gentle. For this reason, a side surface of the fore end part 3 can be suppressed from sliding while locally contacting with a corresponding inner surface 122 of the through-hole 121. As a result, shavings can be suppressed from being produced at the time of the sliding.
Note that in the present embodiment, the intermediate metallic layer 12 of the fore end part 3 is configured differently from the case of the elastic deformation part 4 in consideration of resistivity, mechanical strength, cost, and the like, but can also be configured in the same manner as the case of the elastic deformation part 4. That is, the intermediate metallic layer 12 of the fore end part 3 can be configured without being divided into the three areas. Further, for the intermediate metallic layer 12 of the fore end part 3, for example, gold (Au) can also be used.
Also, in the present embodiment, the example where the main body part 1 includes the three metallic layers 11 to 13 is described; however, the present invention is not limited to only such a configuration. That is, the main body part 1 can also be configured to include four or more metallic layers. For example, the intermediate metallic layer 12 can also be configured to include two or more layers.
Further, in the present embodiment, the example of the case where the elastic deformation part 4 is divided into the three beam parts 41 to 43 is described; however, the present invention is not limited to only such a configuration. That is, the elastic deformation part 4 may be configured to be divided into two or more beam parts. Further, the elastic deformation part 4 may be configured not to be divided.
In addition, in the present embodiment, the example of the case of the vertical type probe is described; however, the present invention is not limited to only such a case. For example, the present invention can also be applied to a cantilever type probe having cantilever structure.
In Embodiment 1, the contact probe 101 of which the fore end part 3 supported by the guide plate 120 has the cross-shaped cross section is described. On the other hand, in the present embodiment, a contact probe 102 of which a base end part 5 supported by a guide plate 130 has a cross-shaped cross section is described.
When comparing the contact probe 102 according to the present embodiment with the contact probe 101 (Embodiment 1) in
The base end part 5 is configured by sandwiching an intermediate metallic layer 12 between outer metallic layers 11 and 13, in which the intermediate metallic layer 12 is formed so as to protrude relative to the outer metallic layers 11 and 13, and has the cross-shaped cross section. The length of each of the protrusions of the intermediate metallic layer 12 is only required to be at a level that can prevent reversal caused by variations in a manufacturing process, and arbitrary.
Also, the intermediate metallic layer 12 is configured to include three metallic areas 12a to 12c arrayed in a direction of curvature N. The outer metallic layers 11 and 13 of the base end part 5 are made of the same material as that of the outer metallic layers 11 and 13 of an elastic deformation part 4, and formed simultaneously with these metallic layers. Further, the intermediate metallic layer 12 of the base end part 5, i.e., the metallic areas 12a to 12c are made of the same materials as those of the metallic areas 12a to 12c of a fore end part 3, and formed simultaneously with these metallic areas.
In addition, on the outer circumferential surface of the base end part 5, a thin film layer 14 is formed. The thin film layer 14 of the base end part 5 is made of the same material as that of the thin film layer 14 of the fore end part 3, and formed simultaneously with the thin film layer 14 of the fore end part 3 by an electroplating process. Forming such a thin film layer 14 around the base end part 5 makes it possible to suppress conductive shavings from being produced from a side surface of the base end part 5.
A terminal part 6 is arranged so as to face a probe electrode 111 formed on the wiring board 110. Also, the base end part 5 is supported by the guide plate 130 movably in the longer direction. For this reason, the base end part 5 is slightly moved in the longer direction by reaction force from an electrode terminal 201 at the time of overdrive, and thereby the terminal part 6 can be brought into abutting with the probe electrode 111. That is, without fastening the contact probe 102 to the wiring board 110, the terminal part 6 can be surely conducted to the probe electrode 111. Accordingly, the contact probe 102 can be easily replaced.
For the guide plate 130, for example, a silicon substrate is used, and a through-hole 131 corresponding to the contact probe 102 is formed. The contact probe 102 is arranged in a state of passing through the through-hole 131 such that the side surfaces of the base end part 5 face corresponding inner surfaces 132 of the through-hole 131. As a result, the base end part 5 is positioned in a two-dimensional plane parallel to the guide plate 130 while keeping the state of being movable in the longer direction.
For this purpose, by protruding the intermediate metallic layer 12 relative to the outer metallic layers 11 and 13, and forming a cross section of the base end part 5 in the cross shape, at the time of the overdrive, an end surface of the intermediate metallic layer 12 and the inner surface 132 of the through-hole 131 slide on each other while facing each other in the direction of curvature N or the opposite direction N′. Accordingly, at the time of the overdrive, without causing a tilt or twist of the contact probe 102, shavings can be suppressed from being produced.
In the present embodiment, the contact probe 102 is connected to the wiring board 110; the base end part 5 that is formed between a connecting part with the wiring board 110 and the elastic deformation part 4 and supported by the through-hole 121 of the guide plate 120 so as to make a contact part 2 movable in the longer direction is provided; the side surfaces of the base end part 5 formed in the direction of curvature N and the opposite direction N′ of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13; and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.
The contact probe 102 according to the present embodiment has stacked structure that sandwiches the intermediate metallic layer 12 between the outer metallic layers 11 and 13, and includes: the elastic deformation part 4 that is elastically deformed so as to be curved in the predetermined direction of curvature N by compression force in the longer direction; the terminal part 6 that is conducted to the probe electrode 111 on the wiring board 110; and the base end part 5 that is formed between the contact part 2 and the terminal part 6 and supported by the through-hole 131 of the guide plate 130 movably in the longer direction, in which the side surfaces of the base end part 5 formed in the direction of curvature N and the opposite direction N′ of the elastic deformation part 4 are configured to includes the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.
Employing such a configuration makes it possible to press the intermediate metallic layer 12 against the inner surface 132 of the through-hole 131 at the time of overdrive. For this reason, as compared with the case where a level difference is formed between the metallic layers 11 to 13 such that any of the outer metallic layers 11 and 13 protrudes relative to the intermediate metallic layer 12, the contact probe 102 can be suppressed from being twisted. Also, shavings can be suppressed from being produced at the time of sliding to make the contact probe 102 difficult to move or cause adjacent contact probes 102 to be mutually short-circuited. Further, since a side surface of the base end part 5 is supported movably in the longer direction by the through-hole 131 of the guide plate 130, the contact probe 102 can be easily replaced while accurately positioning the terminal part 6 in the two-dimensional plane.
In addition, in the contact probe 102 according to the present embodiment, on the side surfaces of the base end part 5, the plating layer is formed so as to extend across the intermediate layer and the outer layers. Such a configuration makes it possible to smoothly cover parts corresponding to level differences between the intermediate layer and the outer layers, and make the level differences gentle. For this reason, a side surface of the base end part 5 can be suppressed from sliding while locally contacting with a corresponding inner surface 132 of the through-hole 131. As a result, shavings can be suppressed from being produced at the time of the sliding.
Note that in the present embodiment, the intermediate metallic layer 12 of the base end part 5 is configured differently from the case of the elastic deformation part 4 in consideration of resistivity, mechanical strength, cost, and the like, but can also be configured in the same manner as the case of the elastic deformation part 4. That is, the intermediate metallic layer 12 of the base end part 5 can be configured without being divided into the three areas. Further, for the intermediate metallic layer 12 of the base end part 5, for example, gold (Au) can also be used.
Also, in the present embodiment, the example of the case where the fore end part 3 and the base end part 5 both have the cross-shaped cross sections is described; however, the present invention is not limited to only such a configuration. For example, the base end part 5 may be configured to have a cross-shaped cross section, and the fore end part 3 may be configured not to have a cross-shaped cross section.
In Embodiments 1 and 2, the examples of the case where the elastic deformation part 4 is configured to include the three beam parts 41 to 43 are described. On the other hand, in the present embodiment, the case where an elastic deformation part 4 is configured to include one beam part is described.
The elastic deformation part 4 is configured to include one beam part formed as an elongate plate-like body, and on both sides thereof, a fore end part 3 and a base end part 5 are provided. That is, the elastic deformation part 4 is configured to include only the one beam part without being divided into two or more beam parts 41 to 43. Also, the elastic deformation part 4 is of a gently curved shape before overdrive, and at the time of overdrive, bucklingly deformed so as to increase the curvature of the curved shape. Accordingly, a direction of curvature N of the elastic deformation part 4 is predetermined.
The elastic deformation part 4 has a rectangular-shaped cross section, and the thickness of the cross section is small as compared with the width. Also, the elastic deformation part 4 is configured by arraying three metallic layers 11 to 13 in the width direction thereof so as to sandwich the intermediate metallic layer 12 between the outer metallic layers 11 and 13. That is, the elastic deformation part 4 is of the same shape as that of and made of the same material as that of any one of the beam parts 41 to 43 (Embodiment 1) in
In the contact probe 103 according to the present embodiment, as in Embodiment 2, on the side surfaces of the fore end part 3 and the base end part 5 in the direction of curvature N or a direction N′ opposite to the N, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13. Employing such a configuration makes it possible to suppress a twist of the contact probe 103 and the production of shavings even in the case where the elastic deformation part 4 is not divided into two or more beam parts. That is, the present invention can also be applied to a contact probe of which an elastic deformation part 4 is not divided.
In Embodiments 1 to 3, the contact probes 101 to 103 each of which the fore end part 3 or base end part 5 having the cross-shaped cross section is formed with the thin film layer 14 are described, respectively. On the other hand, in the present embodiment, a contact probe 104 of which an elastic deformation part 4 is formed with a thin film layer 15 is described.
The thin film layer 15 is a conductive metallic layer using a metallic material having higher mechanical strength than that of an intermediate metallic layer 12, and as compared with the thicknesses of metallic layers 11 to 13, formed sufficiently thin. The thin film layer 15 is formed on the side surfaces in a direction of curvature N and a direction opposite thereto of the elastic deformation part 4. That is, the thin film layer 15 is formed on the outer principal surfaces of beam parts 41 and 43 arranged on both sides. Covering the intermediate metallic layer 12 exposed on the side surfaces of the elastic deformation part 4 with the thin film layer 15 prevents the side surfaces of the elastic deformation part 4 from being formed with unevenness and brought into a rough state in the case where overdrive is repeated.
The thin film layer 15 is formed on the outer principal surfaces of the beam parts 41 and 43 arranged on both sides, and covers the intermediate metallic layer 12 exposed on the side surfaces of the elastic deformation part 4. For the thin film layer 15, for example, a nickel-cobalt alloy (Ni—Co) is used. Also, the thin film layer 15 is formed so as to make the thickness Lt5 thereof sufficiently thin as compared with the thicknesses Lt of the beam parts 41 to 43.
In this example, the thin film layer 15 is formed so as to cover substantially the whole of the principal surfaces, as well as covering parts of end surfaces of the beam parts 41 and 43 with one end thereof getting around to each of the end surfaces. On the other hand, on the rest of the principal surfaces of the beam parts 41 to 43, the thin film layer 15 is not formed.
That is, on the inner principal surfaces of the beam parts 41 and 43 on both sides, the thin film layer 15 is not formed. For this reason, as compared with the case where the thin film layer 15 is formed on both surfaces, the intermediate metallic layer 12 can be formed thicker to reduce the electrical resistances of the beam parts 41 and 43 as long as the thicknesses Lt of the beam parts 41 and 43 are the same. In addition, regarding the inner beam part 42, the thin film layer 15 is not formed on any of both principal surfaces. For this reason, the intermediate metallic layer 12 can be formed thicker than the beam parts 41 and 43 to reduce electrical resistance. Note that the moments of inertia of area of the beam parts 41 to 43 are substantially determined by the thickness Lt of a stress layer corresponding to the metallic layer 11 or 13 added with the thin film layer 15, and the thin film layer 15 formed on the metallic layer 12 as a conductive layer hardly affects the moment of inertia of area.
Also, the beam parts 41 and 43 on both sides have the thin film layer 15, whereas the inner beam part 42 does not have the thin film layer 15; however, the beam parts 41 to 43 are all formed so as to have substantially the same thickness Lt. That is, in the beam parts 41 and 43 on both sides, as compared with the inner beam part 42, the metallic layers 11 to 13 are formed thinner by the thickness Lt5 to make the thickness Lt of the whole including the thin film layer 15 coincide with the thickness Lt of the beam part 42.
By employing such a configuration, the thickness of each of both sides in the width direction, which respectively function as the stress layer, i.e., the sum of the thickness of the metallic layer 11 or 13 and the thickness of the thin film layer 15 can be made coincident among all of the beam parts 41 to 43. Accordingly, at the time of overdrive, pressing force can be uniformly distributed to the respective beam parts 41 to 43, and the beam parts 41 to 43 can be respectively deformed so as to have substantially the same curved shape as each other.
Note that differently from a variation in thickness Lt caused by forming the thin film layer 15 on the principal surface of the beam part 41 or 43, a variation in width Lw caused by forming the thin film layer 14 on the end surface of the beam part 41 or 43 hardly affects the moment of inertia of area of the beam part 41 or 43, and therefore can be ignored.
An insulating film 16 is an insulating film formed on the entire outer circumferential surfaces of the beam parts 41 to 43, and made of, for example, aluminum nitride (AlN). By forming the insulating film on the outer edges of the beam parts 41 to 43, adjacently arranged contact probes 104 can be prevented from contacting with each other and being short circuited. Note that the insulating film 16 is sufficiently thinner than the thin film layer 15, of which mechanical strength is also low, and therefore hardly affects the moments of inertia of area of the beam parts 41 to 43.
The contact probe 104 is adapted to have, for example, the following sizes. The total length is 1.9 to 2.4 mm, and the length of the elastic deformation part 4 is 1.2 to 1.9 mm. Regarding the beam parts 41 to 43, the width Lw is 47 μm, the thickness Lt is 11 μm, and the thickness Lt5 of the thin film layer 15 is 1 μm, and the distance Lg of the gap between the beam parts 41 to 43 is 11 μm. Also, the widths Lw1 and Lw3 of the outer metallic layers 11 and 13 are both 11 μm, and the width Lw2 of the intermediate metallic layer 12 is 25 μm. The thickness of the insulating film 16 is 0.1 μm.
In the case of forming the thin film layer 15 on the principal surfaces adjacent to the narrow gaps, it is not easy to control the thickness of the thin film layer 15 with high accuracy, and therefore by masking these principal surfaces to prevent the formation of the thin film layer 15, a step of forming the thin film layer 15 can be made easy. As a result, variations in characteristics of the contact probe 104 can be suppressed.
The insulating film 16 is a thin film made of aluminum nitride (AlN) formed by sputtering, and formed on the entire surfaces of the beam parts 41 to 43. Also, the insulating film 16 is formed in the elastic deformation part 4, and selectively formed so as not to be formed in the fore end part 3 or the base end part 5. Here, the insulating film 16 is selectively formed by from the state in
The contact probe 104 according to the present embodiment includes: the two or more beam parts 41 to 43 that are arranged so as to make adjacent principal surfaces face each other through a gap and respectively formed as elongate plate-like bodies; the fore end part 3 that connects the one ends of the beam parts 41 to 43 to one another; and the base end part 5 that connects the other ends of the beam parts 41 to 43 to one another. The beam part 41 to 43 is configured to include: the intermediate metallic layer 12 made of a first metal; the outer metallic layers 11 and 13 that are formed so as to sandwich the intermediate metallic layer 12 in the width direction and made of a second metal; and the thin film layer 15 that is formed so as to cover the intermediate metallic layer 12 on the outer principal surface of the beam part 41 to 43 and made of a third metal, in which the first metal has smaller resistivity than that of the second metal, and the second metal and the third metal have high mechanical strength as compared with the first metal.
Forming the beam parts 41 to 43 respectively as the plate-like bodies makes it possible to reduce stress produced at the time of curving in the direction of curvature N. For this reason, a larger curve can be formed within an elastic limit to shorten the probe length while ensuring a desired overdrive amount. That is, without reducing contact characteristics of the contact probe 104, high frequency characteristics can be improved.
Also, since the three beam parts 41 to 43 are provided, of which adjacent principal surfaces are made to face each other through a gap, the cross-sectional area of the contact probe 104 can be increased to ensure probe pressure and current resistant characteristics without increasing the thicknesses of the respective beam parts 41 to 43.
Further, the beam parts 41 to 43 have the metallic layer 12 as a conductive layer and the metallic layers 11 and 13 as stress layers, and therefore electrical resistance can be reduced while suppressing a reduction in mechanical strength. For this reason, the current resistant characteristics of the electrical contact can be improved while ensuring the probe pressure at the time of overdrive. In addition, by arranging the conductive layer so as to sandwich the conductive layer between the stress layers, the plate-like bodies at the time of overdrive can be prevented from being twisted or curved in a direction other than the thickness direction of the plate-like bodies.
Still further, by covering the metallic layer 12, which is plastically deformed at the time of overdrive, with the thin film layer 15, which is elastically deformed at the time of overdrive, on the outer principal surfaces of the beam parts 41 and 43 on both sides, the outer principal surfaces of the beam parts 41 and 43 on both sides can be prevented from being roughened when repeating the overdrive, and consequently the durability of the contact probe 104 can be improved. In particular, the occurrence of a short circuit between contact probes 104 caused by the breakage or peeling off of the insulating film 16 formed on the outer principal surfaces of the beam parts 41 and 43 can be effectively suppressed.
Also, in the contact probe 104 according to the present embodiment, the thin film layer 15 is formed on the outer principal surfaces of the beam parts 41 and 43 arranged on both sides, but not formed on the principal surfaces adjacent to the gaps.
By forming the thin film layer 15 only on the outer principal surfaces of the beam parts 41 and 43 arranged on both sides, as compared with the case of forming a thin film layer on both principal surfaces of the beam parts 41 and 43, the intermediate metallic layer 12 can be formed thicker to reduce the electrical resistance of the contact probe 104 as long as the thicknesses Lt of the beam parts are the same. Also, as compared with the case of forming the thin film layer 15 on the outer principal surfaces, in the case of forming the thin film layer 15 on the inner principal surfaces adjacent to the narrow gaps, thickness control becomes difficult. For this reason, by forming the thin film layer 15 only on the outer principal surfaces, manufacturing can be easily performed, and variations in characteristics of the contact probe 104 can be suppressed.
Further, the contact probe 104 according to the present embodiment is configured such that the beam parts 41 to 43 have substantially the same thickness Lt as each other. Employing such a configuration makes it possible to uniformly distribute pressing force at the time of overdrive to the respective beam parts 41 to 43, and deform the beam parts 41 to 43 so as to form substantially the same curved shape as each other. As a result, a larger overdrive amount can be ensured, and also the contact probe 104 can be suppressed from being tilted at the time of overdrive.
In Embodiment 4 above, the example of the contact probe 104 of which the elastic deformation part 4 is divided into the three beam parts 41 to 43 is described. On the other hand, in the present embodiment, a contact probe 105 of which an elastic deformation part 4 is divided into two beam parts 41 and 43 is described.
In the contact probe 105, the elastic deformation part 4 is configured to include the two beam parts 41 and 43 that are arranged through a gap, and different from the contact probe 104 in
The beam parts 41 and 43 are both formed with a thin film layer 15 on the outer principal surfaces. For this reason, the outer principal surfaces of the beam parts 41 and 43 can be prevented from being roughened by repetitive overdrive, and therefore the durability of the contact probe 105 can be improved. In particular, the occurrence of a short circuit between contact probes 105 caused by the breakage or peeling off of an insulating film 16 formed on the outer principal surfaces of the beam parts 41 and 43 can be effectively suppressed. In addition, on the inner principal surfaces facing each other, the thin film layer 15 is not formed. For this reason, as compared with the case where the thin film layer 15 is formed on both principal surfaces of the beam parts 41 and 43, an intermediate metallic layer 12 can be formed thicker to reduce electrical resistance as long as the thicknesses of the beam parts 41 and 43 are the same. Also, the formation of the thin film layer 15 can be made easy to suppress variations in characteristics of the contact probe 105.
In Embodiments 4 and 5, the examples of a contact probe of which an elastic deformation part 4 is divided into two or more beam parts 41 to 43 are described. On the other hand, in the present embodiment, the case where an elastic deformation part 4 is configured to include one beam part without being divided is described.
The contact probe 106 is different from the contact probe 103 in
On the principal surfaces on both sides of the elastic deformation part 4, as in Embodiments 4 and 5, a thin film layer 15 is formed. Employing such a configuration makes it possible to prevent the principal surface on both sides of the beam part 44 from being roughened by repetitive overdrive even in the case where the elastic deformation part 4 is not divided into two or more beam parts.
On the both principal surfaces of the elastic deformation part 4, as in Embodiments 4 and 5, the thin film layer 15 is formed. Employing such a configuration makes it possible to prevent the both principal surfaces of the elastic deformation part 4 from being roughed when repeating overdrive, and improve the durability of the contact probe 106 even in the case where the elastic deformation part 4 is not divided into two or more beam parts. In particular, the occurrence of a short circuit between contact probes 106 caused by the breakage or peeling off of an insulating film 16 formed on the both principal surfaces of the elastic deformation part 4 can be effectively suppressed.
In Embodiments 1 to 3, the examples of the contact probes 101 to 103 each of which the intermediate metallic layer 12 is formed so as to protrude relative to the outer metallic layers 11 and 13 in the fore end part 3 or in the base end part 5 are described, respectively. Also, in Embodiments 4 to 6, the contact probes 104 to 106 each of which the elastic deformation part 4 is formed with the thin film layer are described, respectively. In the present embodiment, a contact probe 107 combining these configurations is described.
By employing such a configuration, shavings can be suppressed from being produced at the time of sliding to make the contact probe 107 difficult to move or cause adjacent contact probes 107 to be mutually short-circuited. Also, the outer principal surfaces of the beam parts 41 and 43 can be prevented from being roughened by repetitive overdrive.
Note that in the present embodiment, the example of the contact probe 107 in which in a fore end part 3, the intermediate metallic layer 12 protrudes relative to the outer metallic layers 11 and 13, and on the outer principal surfaces of the beam parts 41 and 43, the thin film layer 15 is formed is described; however, the present invention is not limited to only such a configuration. For example, the present invention may be configured such that in both of the fore end part 3 and a base end part 5, the intermediate metallic layer 12 protrudes relative to the outer metallic layers 11 and 13, and on the outer principal surfaces of the beam parts 41 and 43, the thin film layer 15 is formed. In addition, the configurations of Embodiments 1 to 6 can be appropriately combined.
Also, in Embodiments 1 to 7 above, the examples of the case where the main body part 1 includes the three metallic layers 11 to 13 are respectively described; however, the present invention is not limited to only such a configuration. That is, the main body part 1 can also be configured to include four or more metallic layers. For example, as the intermediate metallic layer 12, two or more metallic layers made of mutually different metallic materials are provided, and these metallic layers are configured to be sandwiched by the outer metallic layers 11 and 13.
Further, in Embodiments 1 to 7 above, the examples of the case where the elastic deformation part 4 includes one to three beam parts are respectively described; however, the present invention is not limited to only such a configuration. That is, the elastic deformation part 4 may be configured to be divided into four or more beam parts.
Still further, in Embodiments 1 to 7 above, the examples of the case where for the intermediate metallic layer 12, gold (Au) is used, and for the outer metallic layers 11 and 13 and the thin film layer 15, a nickel-cobalt alloy (Ni—Co) is used are respectively described; however, the present invention is not limited to only such a configuration. That is, the specific metallic materials are exemplified, and other metallic materials can also be used. For example, in place of the nickel-cobalt alloy (Ni—Co), a palladium-cobalt alloy (Pd—Co) can also be used. In addition, desirably, for the outer metallic layers 11 and 13 and the thin film layer 15, the same metallic material is used; however, different metallic materials can also be used.
Yet further, in Embodiments 1 to 7 above, the examples of the case where the insulating film 16 is formed on the entire outer circumferential surface of the elastic deformation part 4 are respectively described; however, the present invention is not limited to only such a case. As long as the insulating film 16 is formed at least on the outer principal surfaces of the outer beam parts 41 and 43, i.e., at least on the thin film layer 15, an effect of preventing a short circuit between adjacent contact probes can be obtained. That is, a short circuit can be prevented from easily occurring by repetitive overdrive, and the durability of the contact probe can be improved. In addition, the present invention can also be applied to a contact probe of which beam parts 41 to 43 are not formed with an insulating film 16. In such a case, by covering an intermediate metallic layer 12 with a thin film layer 15, the intermediate metallic layer 12 on the outer principal surfaces can be prevented from being deformed, and durability can be improved.
Also, in Embodiments 1 to 7 above, the examples of the case of the vertical type probe are respectively described; however, the present invention is not limited to only such a case. The present invention can also be applied to, for example, a cantilever type probe having cantilever structure. Further, the present invention is not limited only to a contact probe used for an electrical characteristics test of semiconductor devices, but can be applied to various electrical contacts.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2012-265364 | Dec 2012 | JP | national |
| 2013-001903 | Jan 2013 | JP | national |
This application is a continuation of U.S. patent application Ser. No. 14/430,557, filed Mar. 24, 2015, which is a National Stage Application of PCT/JP2013/081957, filed Nov. 27, 2013, which claims priority to Japanese Patent Application No. 2012-265364, filed Dec. 4, 2012, and Japanese Patent Application No. 2013-001903 filed Jan. 9, 2013.
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| Number | Date | Country | |
|---|---|---|---|
| Parent | 14430557 | US | |
| Child | 15674541 | US |
