Atsushi Hosogane

Person

Ibaraki-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing semiconductor apparatus
- Patent number 7,119,362
- Issue date Oct 10, 2006
- Renesas Technology Corp.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Packaging device for holding a plurality of semiconductor devices t...
- Patent number 6,864,568
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection apparatus
- Patent number 6,714,030
- Issue date Mar 30, 2004
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,573,112
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing substrate for inspecting semiconductor device
- Patent number 6,566,149
- Issue date May 20, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,548,315
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device utilizing semiconduct...
- Patent number 6,531,327
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing semiconductor device
- Patent number 6,511,857
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing equipment with probe formed on a cantilever o...
- Patent number 6,507,204
- Issue date Jan 14, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,479,305
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing semiconductor device and apparatus usable therein
- Patent number 6,465,264
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,358,762
- Issue date Mar 19, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Slider unit controllably actuated at a surface of a moving informat...
- Patent number 5,276,573
- Issue date Jan 4, 1994
- Hitachi, Ltd.
- Takeshi Harada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor inspection apparatus
- Publication number 20030189439
- Publication date Oct 9, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor apparatus
- Publication number 20030092206
- Publication date May 15, 2003
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20030027365
- Publication date Feb 6, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Packaging device for holding a plurality of semiconductor devices t...
- Publication number 20030015779
- Publication date Jan 23, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Manufacture method for semiconductor inspection apparatus
- Publication number 20020086451
- Publication date Jul 4, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device utilizing semiconduct...
- Publication number 20020072136
- Publication date Jun 13, 2002
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20020064893
- Publication date May 30, 2002
- RYUJI KONO
- H01 - BASIC ELECTRIC ELEMENTS

Atsushi Hosogane

Person

Patents Grantslast 30 patents

Method of manufacturing semiconductor apparatus

Packaging device for holding a plurality of semiconductor devices t...

Semiconductor inspection apparatus

Semiconductor device manufacturing method

Method for manufacturing substrate for inspecting semiconductor device

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

Process for manufacturing semiconductor device

Semiconductor testing equipment with probe formed on a cantilever o...

Semiconductor device manufacturing method

Method for producing semiconductor device and apparatus usable therein

Manufacture method for semiconductor inspection apparatus

Slider unit controllably actuated at a surface of a moving informat...

Patents Applicationslast 30 patents

Semiconductor inspection apparatus

Method of manufacturing semiconductor apparatus

Semiconductor device manufacturing method

Packaging device for holding a plurality of semiconductor devices t...

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

SEMICONDUCTOR DEVICE MANUFACTURING METHOD