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Atsushi KUMAGAI
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Display device, sample measurement system, display method and program
Patent number
11,531,037
Issue date
Dec 20, 2022
Sysmex Corporation
Atsushi Kumagai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sample measurement system and method of transporting in and out rack
Patent number
10,723,552
Issue date
Jul 28, 2020
SYSMEX CORPORATION
Hiroo Tatsutani
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Sample measurement system and method of transporting in and out rack
Patent number
10,683,166
Issue date
Jun 16, 2020
SYSMEX CORPORATION
Hiroo Tatsutani
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample analyzer, transportation apparatus, and method
Patent number
10,101,346
Issue date
Oct 16, 2018
SYSMEX CORPORATION
Hiroki Koike
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
Publication number
20240302391
Publication date
Sep 12, 2024
SYSMEX CORPORATION
Kota Misawa
G01 - MEASURING TESTING
Information
Patent Application
TRANSPORT METHOD, CONTROL METHOD, AND ANALYSIS SYSTEM
Publication number
20230384336
Publication date
Nov 30, 2023
SYSMEX CORPORATION
Atsushi KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
QUALITY CONTROL SAMPLE MEASUREMENT METHOD, SAMPLE ANALYZER, AND SUP...
Publication number
20230168262
Publication date
Jun 1, 2023
SYSMEX CORPORATION
Junya IKUTA
G01 - MEASURING TESTING
Information
Patent Application
DISPLAY DEVICE, SAMPLE MEASUREMENT SYSTEM, DISPLAY METHOD AND PROGRAM
Publication number
20200408792
Publication date
Dec 31, 2020
SYSMEX CORPORATION
Atsushi KUMAGAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TESTING SYSTEM, STORAGE DEVICE, AND RACK STORAGE METHOD
Publication number
20200408793
Publication date
Dec 31, 2020
SYSMEX CORPORATION
Atsushi KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE MEASUREMENT SYSTEM AND METHOD OF TRANSPORTING IN AND OUT RACK
Publication number
20180002108
Publication date
Jan 4, 2018
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYSIS SYSTEM AND SAMPLE ANALYSIS METHOD
Publication number
20170285052
Publication date
Oct 5, 2017
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER, TRANSPORTATION APPARATUS, AND METHOD
Publication number
20160349279
Publication date
Dec 1, 2016
SYSMEX CORPORATION
Hiroki KOIKE
G01 - MEASURING TESTING