Atul K. Jain

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Timing closure for system on a chip using voltage drop based standa...
- Patent number 7,324,914
- Issue date Jan 29, 2008
- Texas Instruments Incorporated
- Atul K. Jain
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Timing closure for system on a chip using voltage drop based standa...
- Publication number 20060106564
- Publication date May 18, 2006
- Atul K. Jain
- G01 - MEASURING TESTING
Information Patent Application
Power reduction in module-based scan testing
- Publication number 20060107144
- Publication date May 18, 2006
- Jayashree Saxena
- G01 - MEASURING TESTING
Information Patent Application
Power reduction in module-based scan testing
- Publication number 20020170010
- Publication date Nov 14, 2002
- Jayashree Saxena
- G01 - MEASURING TESTING