Benjamin J. Brown

Person

Westlake Village, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing non-deterministic device data
- Patent number 6,990,423
- Issue date Jan 24, 2006
- Teradyne, Inc.
- Benjamin Brown
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
ATE timing measurement unit and method
- Patent number 6,609,077
- Issue date Aug 19, 2003
- Teradyne, Inc.
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Grant
Memory tester with data compression
- Patent number 6,360,340
- Issue date Mar 19, 2002
- Teradyne, Inc.
- Benjamin J. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory architecture for automatic test equipment using vector modul...
- Patent number 6,286,120
- Issue date Sep 4, 2001
- Teradyne, Inc.
- Peter A. Reichert
- G11 - INFORMATION STORAGE
Information Patent Grant
Analog clock module
- Patent number 6,188,253
- Issue date Feb 13, 2001
- Robert Bruce Gage
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor tester for testing devices with embedded memory
- Patent number 5,923,675
- Issue date Jul 13, 1999
- Teradyne, Inc.
- Benjamin J. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Timing hazard detector accelerator
- Patent number 5,570,383
- Issue date Oct 29, 1996
- Teradyne, Inc.
- Benjamin J. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Low cost timing generator for automatic test equipment operating at...
- Patent number 5,566,188
- Issue date Oct 15, 1996
- Teradyne, Inc.
- Bradford B. Robbins
- G01 - MEASURING TESTING
Information Patent Grant
High speed timing generator
- Patent number 5,321,702
- Issue date Jun 14, 1994
- Teradyne, Inc.
- Benjamin J. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed timing generator
- Patent number 5,321,700
- Issue date Jun 14, 1994
- Teradyne, Inc.
- Benjamin J. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed fail processor
- Patent number 5,280,486
- Issue date Jan 18, 1994
- Teradyne, Inc.
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
High speed timing generator
- Patent number 5,270,582
- Issue date Dec 14, 1993
- Teradyne, Inc.
- Benjamin J. Brown
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for testing non-deterministic device data
- Publication number 20040267487
- Publication date Dec 30, 2004
- Benjamin Brown
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Benjamin J. Brown

Person

Patents Grantslast 30 patents

Apparatus and method for testing non-deterministic device data

ATE timing measurement unit and method

Memory tester with data compression

Memory architecture for automatic test equipment using vector modul...

Analog clock module

Semiconductor tester for testing devices with embedded memory

Timing hazard detector accelerator

Low cost timing generator for automatic test equipment operating at...

High speed timing generator

High speed timing generator

High speed fail processor

High speed timing generator

Patents Applicationslast 30 patents

Apparatus and method for testing non-deterministic device data