Benoit LePAGE

Person

L'Ancienne-Lorette, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Material profiling for improved sizing accuracy
- Patent number 11,933,766
- Issue date Mar 19, 2024
- Evident Canada, Inc.
- Nicolas Badeau
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasound inspection techniques for detecting a flaw in a test object
- Patent number 11,933,765
- Issue date Mar 19, 2024
- Evident Canada, Inc.
- Benoit Lepage
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Acoustic profiling techniques for non-destructive testing
- Patent number 11,906,468
- Issue date Feb 20, 2024
- Evident Canada, Inc.
- Ivan C. Kraljic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact speed encoder
- Patent number 11,525,805
- Issue date Dec 13, 2022
- Olympus NDT Canada Inc.
- Rémi Leclerc
- G01 - MEASURING TESTING
Information Patent Grant
Total focusing method (TFM) with acoustic path filtering
- Patent number 11,474,075
- Issue date Oct 18, 2022
- Olympus NDT Canada Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Acoustic model acoustic region of influence generation
- Patent number 11,474,076
- Issue date Oct 18, 2022
- Olympus NDT Canada Inc.
- Chi-Hang Kwan
- G01 - MEASURING TESTING
Information Patent Grant
NDT data referencing system
- Patent number 11,467,129
- Issue date Oct 11, 2022
- Olympus NDT Canada Inc.
- Benoit Lepage
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultrasound probe with row-column addressed array
- Patent number 11,448,621
- Issue date Sep 20, 2022
- Olympus NDT Canada Inc.
- Jinchi Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasound probe with row-column addressed array
- Patent number 11,408,860
- Issue date Aug 9, 2022
- Olympus NDT Canada Inc.
- Jinchi Zhang
- G01 - MEASURING TESTING
Information Patent Grant
In-line tube inspection
- Patent number 11,327,053
- Issue date May 10, 2022
- Olympus America Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection configuration with beam overlap verification
- Patent number 11,249,053
- Issue date Feb 15, 2022
- Olympus America Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquiring ultrasonic testing data leveraging...
- Patent number 11,150,222
- Issue date Oct 19, 2021
- Olympus Scientific Solutions Americas Corp.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic TFM with calculated angle beams
- Patent number 11,029,289
- Issue date Jun 8, 2021
- Olympus America Inc.
- Jason Habermehl
- G01 - MEASURING TESTING
Information Patent Grant
Total focusing method adaptively corrected by using plane wave
- Patent number 10,908,122
- Issue date Feb 2, 2021
- Olympus America Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Virtual channels for eddy current array probes
- Patent number 10,775,346
- Issue date Sep 15, 2020
- Olympus America Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
System and method for ultrasound inspection with time reversal
- Patent number 10,578,589
- Issue date Mar 3, 2020
- Olympus Scientific Solutions Americas Inc.
- Nicolas Badeau
- G01 - MEASURING TESTING
Information Patent Grant
Gapless calibration method for phased array ultrasonic inspection
- Patent number 10,561,404
- Issue date Feb 18, 2020
- Olympus Scientific Solutions Americas Inc.
- Benoit Lepage
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system of deducing sound velocity using time-of-flight o...
- Patent number 10,309,934
- Issue date Jun 4, 2019
- OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC
- Cécile Brütt
- G01 - MEASURING TESTING
Information Patent Grant
System and method of non-destructive inspection with a visual scann...
- Patent number 10,156,548
- Issue date Dec 18, 2018
- Olympus Scientific Solutions Americas Inc.
- Pierre Langlois
- G01 - MEASURING TESTING
Information Patent Grant
Phased array system capable of computing gains for non-measured cal...
- Patent number 10,101,304
- Issue date Oct 16, 2018
- Jinchi Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a phased array ultrasonic system without know...
- Patent number 9,952,185
- Issue date Apr 24, 2018
- Olympus Scientific Solutions America
- Antoine Delhomme
- G01 - MEASURING TESTING
Information Patent Grant
System and method of dynamic gating in non-destructive weld inspection
- Patent number 9,759,692
- Issue date Sep 12, 2017
- Olympus Scientific Solutions Americas Inc.
- Martin St-Laurent
- G01 - MEASURING TESTING
Information Patent Grant
System and a method of automatically generating a phased array ultr...
- Patent number 9,625,424
- Issue date Apr 18, 2017
- Olympus Scientific Solutions Americas Inc.
- Benoit LePage
- G01 - MEASURING TESTING
Information Patent Grant
Method of conducting probe coupling calibration in a guided-wave in...
- Patent number 9,523,660
- Issue date Dec 20, 2016
- Olympus Scientific Solutions Americas Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Automatic calibration for phased array inspection of girth weld
- Patent number 9,476,859
- Issue date Oct 25, 2016
- Olympus NDT, Inc.
- Jason Habermehl
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring the integrity of an eddy current inspection c...
- Patent number 9,316,618
- Issue date Apr 19, 2016
- Olympus NDT, Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Assembly with a universal manipulator for inspecting dovetail of di...
- Patent number 9,110,036
- Issue date Aug 18, 2015
- Olympus NDT, Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Phased array system and method for inspecting helical submerged arc...
- Patent number 9,032,802
- Issue date May 19, 2015
- OLYMPUS NDT
- Christophe Imbert
- G01 - MEASURING TESTING
Information Patent Grant
2D coil and a method of obtaining EC response of 3D coils using the...
- Patent number 8,896,300
- Issue date Nov 25, 2014
- Olympus NDT Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current array configuration with reduced length and thickness
- Patent number 8,816,680
- Issue date Aug 26, 2014
- Olympus NDT Inc.
- Benoit Lepage
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTEMPORANEOUS FIRING SCHEME FOR ACOUSTIC INSPECTION
- Publication number 20240142619
- Publication date May 2, 2024
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
LIFT-OFF COMPENSATED EDDY CURRENT SYSTEM
- Publication number 20240118240
- Publication date Apr 11, 2024
- Rémi Leclerc
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE ECA PROBE
- Publication number 20240085376
- Publication date Mar 14, 2024
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
SMALL-FOOTPRINT ACQUISITION SCHEME FOR ACOUSTIC INSPECTION
- Publication number 20240077455
- Publication date Mar 7, 2024
- André Lamarre
- G01 - MEASURING TESTING
Information Patent Application
VOLUMETRIC INSPECTION USING ROW-COLUMN ADDRESSED PROBE
- Publication number 20240061108
- Publication date Feb 22, 2024
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC IMAGING TECHNIQUES USING MACHINE LEARNING
- Publication number 20230304968
- Publication date Sep 28, 2023
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC MODEL ACOUSTIC REGION OF INFLUENCE GENERATION
- Publication number 20230003691
- Publication date Jan 5, 2023
- Chi-Hang Kwan
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC PROFILING TECHNIQUES FOR NON-DESTRUCTIVE TESTING
- Publication number 20220341879
- Publication date Oct 27, 2022
- Olympus NDT Canada Inc.
- Ivan C. Kraljic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FREE-ENCODER POSITIONING SYSTEM USING ACOUSTIC FEATURES AND IMU
- Publication number 20220341885
- Publication date Oct 27, 2022
- Olympus NDT Canada Inc.
- Nicolas Badeau
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE TOTAL FOCUSING METHOD (TFM) SUCH AS FOR ZERO-DEGREE ACOUST...
- Publication number 20220317090
- Publication date Oct 6, 2022
- Olympus Scientific Solutions Americas Corp.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL PROFILING FOR IMPROVED SIZING ACCURACY
- Publication number 20220252551
- Publication date Aug 11, 2022
- Olympus NDT Canada Inc.
- Nicolas Badeau
- G01 - MEASURING TESTING
Information Patent Application
ULTRASOUND INSPECTION TECHNIQUES FOR DETECTING A FLAW IN A TEST OBJECT
- Publication number 20220252547
- Publication date Aug 11, 2022
- Olympus NDT Canada Inc.
- Benoit Lepage
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TECHNIQUES TO RECONSTRUCT DATA FROM ACOUSTICALLY CONSTRUCTED IMAGES...
- Publication number 20220163665
- Publication date May 26, 2022
- Olympus NDT Canada Inc.
- Nicolas Badeau
- G01 - MEASURING TESTING
Information Patent Application
ULTRASOUND INSPECTION CALIBRATION USING A TARGET
- Publication number 20220113285
- Publication date Apr 14, 2022
- Olympus NDT Canada Inc.
- Guillaume Painchaud-April
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT SPEED ENCODER
- Publication number 20210382010
- Publication date Dec 9, 2021
- Olympus NDT Canada Inc.
- Rémi Leclerc
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE TUBE INSPECTION
- Publication number 20210356438
- Publication date Nov 18, 2021
- Olympus NDT Canada Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
ULTRASOUND PROBE WITH ROW-COLUMN ADDRESSED ARRAY
- Publication number 20210302388
- Publication date Sep 30, 2021
- Olympus NDT Canada Inc.
- Jinchi Zhang
- G01 - MEASURING TESTING
Information Patent Application
ULTRASOUND PROBE WITH ROW-COLUMN ADDRESSED ARRAY
- Publication number 20210302383
- Publication date Sep 30, 2021
- Olympus NDT Canada Inc.
- Jinchi Zhang
- G01 - MEASURING TESTING
Information Patent Application
NDT DATA REFERENCING SYSTEM
- Publication number 20210293757
- Publication date Sep 23, 2021
- Olympus NDT Canada Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
TOTAL FOCUSING METHOD (TFM) WITH ACOUSTIC PATH FILTERING
- Publication number 20210132004
- Publication date May 6, 2021
- Olympus NDT Canada Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ACQUIRING ULTRASONIC TESTING DATA LEVERAGING...
- Publication number 20210088480
- Publication date Mar 25, 2021
- Olympus Scientific Solutions Americas Corp.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURIN...
- Publication number 20210010975
- Publication date Jan 14, 2021
- OLYMPUS AMERICA INC.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC MODEL ACOUSTIC REGION OF INFLUENCE GENERATION
- Publication number 20200278323
- Publication date Sep 3, 2020
- Olympus NDT Canada Inc.
- Chi-Hang Kwan
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION CONFIGURATION WITH BEAM OVERLAP VERIFICATION
- Publication number 20200049670
- Publication date Feb 13, 2020
- Olympus Scientific Solutions Americas Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ULTRASOUND INSPECTION WITH TIME REVERSAL
- Publication number 20180348170
- Publication date Dec 6, 2018
- Olympus Scientific Solutions Americas Inc.
- Nicolas Badeau
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF DEDUCING SOUND VELOCITY USING TIME-OF-FLIGHT O...
- Publication number 20180284069
- Publication date Oct 4, 2018
- Olympus Scientific Solutions Americas Inc.
- Cécile BRÜTT
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION CONFIGURATION WITH BEAM OVERLAP VERIFICATION
- Publication number 20180231508
- Publication date Aug 16, 2018
- Olympus Scientific Solutions Americas Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL CHANNELS FOR EDDY CURRENT ARRAY PROBES
- Publication number 20180217099
- Publication date Aug 2, 2018
- Olympus Scientific Solutions Americas Inc.
- Benoit Lepage
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC TFM WITH CALCULATED ANGLE BEAMS
- Publication number 20180180578
- Publication date Jun 28, 2018
- Olympus Scientific Solutions Americas Inc.
- Jason Habermehl
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURIN...
- Publication number 20180143161
- Publication date May 24, 2018
- Olympus Scientific Solutions Americas Inc.
- Benoit Lepage
- G01 - MEASURING TESTING

Benoit LePAGE

Person

Patents Grantslast 30 patents

Material profiling for improved sizing accuracy

Ultrasound inspection techniques for detecting a flaw in a test object

Acoustic profiling techniques for non-destructive testing

Non-contact speed encoder

Total focusing method (TFM) with acoustic path filtering

Acoustic model acoustic region of influence generation

NDT data referencing system

Ultrasound probe with row-column addressed array

Ultrasound probe with row-column addressed array

In-line tube inspection

Ultrasonic inspection configuration with beam overlap verification

Method and system for acquiring ultrasonic testing data leveraging...

Ultrasonic TFM with calculated angle beams

Total focusing method adaptively corrected by using plane wave

Virtual channels for eddy current array probes

System and method for ultrasound inspection with time reversal

Gapless calibration method for phased array ultrasonic inspection

Method and system of deducing sound velocity using time-of-flight o...

System and method of non-destructive inspection with a visual scann...

Phased array system capable of computing gains for non-measured cal...

Method of calibrating a phased array ultrasonic system without know...

System and method of dynamic gating in non-destructive weld inspection

System and a method of automatically generating a phased array ultr...

Method of conducting probe coupling calibration in a guided-wave in...

Automatic calibration for phased array inspection of girth weld

Method for monitoring the integrity of an eddy current inspection c...

Assembly with a universal manipulator for inspecting dovetail of di...

Phased array system and method for inspecting helical submerged arc...

2D coil and a method of obtaining EC response of 3D coils using the...

Eddy current array configuration with reduced length and thickness

Patents Applicationslast 30 patents

CONTEMPORANEOUS FIRING SCHEME FOR ACOUSTIC INSPECTION

LIFT-OFF COMPENSATED EDDY CURRENT SYSTEM

HIGH TEMPERATURE ECA PROBE

SMALL-FOOTPRINT ACQUISITION SCHEME FOR ACOUSTIC INSPECTION

VOLUMETRIC INSPECTION USING ROW-COLUMN ADDRESSED PROBE

ACOUSTIC IMAGING TECHNIQUES USING MACHINE LEARNING

ACOUSTIC MODEL ACOUSTIC REGION OF INFLUENCE GENERATION

ACOUSTIC PROFILING TECHNIQUES FOR NON-DESTRUCTIVE TESTING

FREE-ENCODER POSITIONING SYSTEM USING ACOUSTIC FEATURES AND IMU

ADAPTIVE TOTAL FOCUSING METHOD (TFM) SUCH AS FOR ZERO-DEGREE ACOUST...

MATERIAL PROFILING FOR IMPROVED SIZING ACCURACY

ULTRASOUND INSPECTION TECHNIQUES FOR DETECTING A FLAW IN A TEST OBJECT

TECHNIQUES TO RECONSTRUCT DATA FROM ACOUSTICALLY CONSTRUCTED IMAGES...

ULTRASOUND INSPECTION CALIBRATION USING A TARGET

NON-CONTACT SPEED ENCODER

IN-LINE TUBE INSPECTION

ULTRASOUND PROBE WITH ROW-COLUMN ADDRESSED ARRAY

ULTRASOUND PROBE WITH ROW-COLUMN ADDRESSED ARRAY

NDT DATA REFERENCING SYSTEM

TOTAL FOCUSING METHOD (TFM) WITH ACOUSTIC PATH FILTERING

METHOD AND SYSTEM FOR ACQUIRING ULTRASONIC TESTING DATA LEVERAGING...

EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURIN...

ACOUSTIC MODEL ACOUSTIC REGION OF INFLUENCE GENERATION

ULTRASONIC INSPECTION CONFIGURATION WITH BEAM OVERLAP VERIFICATION

SYSTEM AND METHOD FOR ULTRASOUND INSPECTION WITH TIME REVERSAL

METHOD AND SYSTEM OF DEDUCING SOUND VELOCITY USING TIME-OF-FLIGHT O...

ULTRASONIC INSPECTION CONFIGURATION WITH BEAM OVERLAP VERIFICATION

VIRTUAL CHANNELS FOR EDDY CURRENT ARRAY PROBES

ULTRASONIC TFM WITH CALCULATED ANGLE BEAMS

EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURIN...