Bernardus Martinus Johannes Kup

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus comprising a phase-locked loop
- Patent number 10,594,327
- Issue date Mar 17, 2020
- NXP B.V.
- Cicero Silveira Vaucher
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method of detecting movement of an object
- Patent number 8,754,360
- Issue date Jun 17, 2014
- NXP, B.V.
- Johannes Anthonie Josephus van Geloven
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for detecting movement of an object and integrate...
- Patent number 8,698,067
- Issue date Apr 15, 2014
- NXP B.V.
- Johannes Anthonie Josephus Van Geloven
- G05 - CONTROLLING REGULATING
Information Patent Grant
Delay control circuit and method
- Patent number 8,633,750
- Issue date Jan 21, 2014
- NXP B.V.
- Bernardus M. Kup
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with test interface
- Patent number 6,664,798
- Issue date Dec 16, 2003
- Koninklijke Philips Electronics N.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SWITCHED RESISTOR DC-DC CONVERTER
- Publication number 20200136505
- Publication date Apr 30, 2020
- NXP B.V.
- Harry Neuteboom
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS COMPRISING A PHASE-LOCKED LOOP
- Publication number 20190131981
- Publication date May 2, 2019
- NXP B.V.
- Cicero Silveira Vaucher
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELAY CONTROL CIRCUIT AND METHOD
- Publication number 20110068844
- Publication date Mar 24, 2011
- Koninklijke Philips Electronics N.V.
- Bernardus M. Kup
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Integrated circuit with test interface
- Publication number 20010015653
- Publication date Aug 23, 2001
- U.S. PHILIPS CORPORATION
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING