Bernd Koenemann

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Direct logic diagnostics with signature-based fault dictionaries
- Patent number 8,166,360
- Issue date Apr 24, 2012
- Mentor Graphics Corporation
- Bernd Koenemann
- G01 - MEASURING TESTING
Information Patent Grant
Direct logic diagnostics with signature-based fault dictionaries
- Patent number 7,509,551
- Issue date Mar 24, 2009
- Bernd Koenemann
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for testing semiconductor chips while incorporated on a...
- Patent number 7,435,990
- Issue date Oct 14, 2008
- International Business Machines Corporation
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for reducing test data volume in the testing of l...
- Patent number 7,103,816
- Issue date Sep 5, 2006
- Cadence Design Systems, Inc.
- Frank O. Distler
- G01 - MEASURING TESTING
Information Patent Grant
System for reducing test data volume in the testing of logic products
- Patent number 6,782,501
- Issue date Aug 24, 2004
- Cadence Design Systems, Inc.
- Frank O. Distler
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic random LBIST
- Patent number 6,708,305
- Issue date Mar 16, 2004
- International Business Machines Corporation
- L. Owen Farnsworth
- G01 - MEASURING TESTING
Information Patent Grant
Real-time decoder for scan test patterns
- Patent number 6,611,933
- Issue date Aug 26, 2003
- International Business Machines Corporation
- Bernd Koenemann
- G01 - MEASURING TESTING
Information Patent Grant
System for test data storage reduction
- Patent number 6,041,429
- Issue date Mar 21, 2000
- International Business Machines Corporation
- Bernd Karl Ferdinand Koenemann
- G01 - MEASURING TESTING
Information Patent Grant
Clocking mechanism for delay, short path and stuck-at testing
- Patent number 5,617,426
- Issue date Apr 1, 1997
- International Business Machines Corporation
- Bernd K. F. Koenemann
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid pattern self-testing of integrated circuits
- Patent number 5,612,963
- Issue date Mar 18, 1997
- International Business Machines Corporation
- Bernd K. F. Koenemann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for memory dynamic burn-in and test
- Patent number 5,375,091
- Issue date Dec 20, 1994
- International Business Machines Corporation
- Robert W. Berry
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DIRECT LOGIC DIAGNOSTICS WITH SIGNATURE-BASED FAULT DICTIONARIES
- Publication number 20090177936
- Publication date Jul 9, 2009
- Bernd Koenemann
- G01 - MEASURING TESTING
Information Patent Application
Direct logic diagnostics with signature-based fault dictionaries
- Publication number 20070038911
- Publication date Feb 15, 2007
- Bernd Koenemann
- G01 - MEASURING TESTING
Information Patent Application
Arrangement for testing semiconductor chips while incorporated on a...
- Publication number 20060284174
- Publication date Dec 21, 2006
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR COMPACT SCAN TESTING
- Publication number 20040139377
- Publication date Jul 15, 2004
- International Business Machines Corporation
- Carl F. Barnhart
- G01 - MEASURING TESTING
Information Patent Application
AN ARRANGEMENT FOR TESTING SEMICONDUCTOR CHIPS WHILE INCORPORATED O...
- Publication number 20040135231
- Publication date Jul 15, 2004
- International Business Machines Corporation
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Application
Method and system for reducing test data volume in the testing of l...
- Publication number 20020099991
- Publication date Jul 25, 2002
- International Business Machines Corporation
- Frank O. Distler
- G01 - MEASURING TESTING
Information Patent Application
System for reducing test data volume in the testing of logic products
- Publication number 20020099992
- Publication date Jul 25, 2002
- International Business Machines Corporation
- Frank O. Distler
- G01 - MEASURING TESTING

Bernd Koenemann

Person

Patents Grantslast 30 patents

Direct logic diagnostics with signature-based fault dictionaries

Direct logic diagnostics with signature-based fault dictionaries

Arrangement for testing semiconductor chips while incorporated on a...

Method and system for reducing test data volume in the testing of l...

System for reducing test data volume in the testing of logic products

Deterministic random LBIST

Real-time decoder for scan test patterns

System for test data storage reduction

Clocking mechanism for delay, short path and stuck-at testing

Hybrid pattern self-testing of integrated circuits

Method and apparatus for memory dynamic burn-in and test

Patents Applicationslast 30 patents

DIRECT LOGIC DIAGNOSTICS WITH SIGNATURE-BASED FAULT DICTIONARIES

Direct logic diagnostics with signature-based fault dictionaries

Arrangement for testing semiconductor chips while incorporated on a...

METHOD AND APPARATUS FOR COMPACT SCAN TESTING

AN ARRANGEMENT FOR TESTING SEMICONDUCTOR CHIPS WHILE INCORPORATED O...

Method and system for reducing test data volume in the testing of l...

System for reducing test data volume in the testing of logic products